SG86326A1 - Magnetic disk testing method and surface defect testing device - Google Patents

Magnetic disk testing method and surface defect testing device

Info

Publication number
SG86326A1
SG86326A1 SG9801511A SG1998001511A SG86326A1 SG 86326 A1 SG86326 A1 SG 86326A1 SG 9801511 A SG9801511 A SG 9801511A SG 1998001511 A SG1998001511 A SG 1998001511A SG 86326 A1 SG86326 A1 SG 86326A1
Authority
SG
Singapore
Prior art keywords
magnetic disk
surface defect
testing device
testing method
testing
Prior art date
Application number
SG9801511A
Inventor
Horai Izuo
Original Assignee
Hitachi Electr Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electr Eng filed Critical Hitachi Electr Eng
Publication of SG86326A1 publication Critical patent/SG86326A1/en

Links

SG9801511A 1997-06-25 1998-06-24 Magnetic disk testing method and surface defect testing device SG86326A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18443297 1997-06-25

Publications (1)

Publication Number Publication Date
SG86326A1 true SG86326A1 (en) 2002-02-19

Family

ID=16153058

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9801511A SG86326A1 (en) 1997-06-25 1998-06-24 Magnetic disk testing method and surface defect testing device

Country Status (2)

Country Link
MY (1) MY117417A (en)
SG (1) SG86326A1 (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
US5031112A (en) * 1988-06-08 1991-07-09 Dai Nippon Insatsu Kabushiki Kaisha System for detecting defective portions in data recording portions of optical recording medium
JPH03273141A (en) * 1990-03-23 1991-12-04 Hitachi Electron Eng Co Ltd Defect detecting method for magnetic disk magnetic film and detection optical system
US5423111A (en) * 1992-09-22 1995-06-13 Hitachi Electronics Engineering Co., Ltd. Magnetic disk tester
US5625193A (en) * 1995-07-10 1997-04-29 Qc Optics, Inc. Optical inspection system and method for detecting flaws on a diffractive surface
US5646415A (en) * 1994-08-26 1997-07-08 Sony Disc Technology Inc. Apparatus for detecting a defect of an optical disc based on sensor outputs for adjacent positions
US5818592A (en) * 1997-02-07 1998-10-06 Phase Metrics, Inc. Non-contact optical glide tester

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
US5031112A (en) * 1988-06-08 1991-07-09 Dai Nippon Insatsu Kabushiki Kaisha System for detecting defective portions in data recording portions of optical recording medium
JPH03273141A (en) * 1990-03-23 1991-12-04 Hitachi Electron Eng Co Ltd Defect detecting method for magnetic disk magnetic film and detection optical system
US5423111A (en) * 1992-09-22 1995-06-13 Hitachi Electronics Engineering Co., Ltd. Magnetic disk tester
US5646415A (en) * 1994-08-26 1997-07-08 Sony Disc Technology Inc. Apparatus for detecting a defect of an optical disc based on sensor outputs for adjacent positions
US5625193A (en) * 1995-07-10 1997-04-29 Qc Optics, Inc. Optical inspection system and method for detecting flaws on a diffractive surface
US5818592A (en) * 1997-02-07 1998-10-06 Phase Metrics, Inc. Non-contact optical glide tester

Also Published As

Publication number Publication date
MY117417A (en) 2004-06-30

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