MY117417A - Magnetic disk testing method and surface defect testing device - Google Patents

Magnetic disk testing method and surface defect testing device

Info

Publication number
MY117417A
MY117417A MYPI9802849A MY117417A MY 117417 A MY117417 A MY 117417A MY PI9802849 A MYPI9802849 A MY PI9802849A MY 117417 A MY117417 A MY 117417A
Authority
MY
Malaysia
Prior art keywords
magnetic disks
surface defect
test
magnetic disk
magnetic
Prior art date
Application number
Inventor
Izuo Horai
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of MY117417A publication Critical patent/MY117417A/en

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  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

A MAGNETIC DISK TESTING METHOD IS PROVIDED, WHICH COMPRISES A SURFACE DEFECT TEST STEP OF DETECTING, AS DEFECT DATA, THE SIZE OF SURFACE DEFECT OF A MAGNETIIC DISK, THE CONTINUITY THEREOF, THE NUMBER THEREOF AND THE POSITION THEREOF BY TESTING MAGNETIC DISKS OPTICALLY AND A CLASSIFICATION STEP OF CLASSIFYING THE MAGNETIC DISKS TO FIRST MAGNETIC DISKS, SECOND MAGNETIC DISK AND THIRD MAGNETIC DISKS ON THE BASIS OF THE DEFECT DATA OBTAINED IN THE SURFACE DEFECT TEST STEP. THE FIRST MAGNETIC DISKS HAVE SURFACE DEFECTS WHICH DO NOT PROVIDE ANY PROBLEM ON ELECTRIC CHARACTERISTICS AND ARE TO BE QUALIFIED THROUGH A SUBSEQUENT CERTIFICATION TEST, THE SECOND MAGNETIC DISKS REQUIRE A FURTHER CERTIFICATION TEST FOR DETERMINING WHETHER OR NOT THE SURFACE DEFECTS THEREOF PROVIDE A PROBLEM ON ELECTRIC CHARACTERISTICS AND THE THIRD MAGNETIC DISKS HAVE ELECTRIC CHARACTERISTICS WHICH ARE TO BE CLEARLY DISQUALIFIED WITHOUT NECESSITY OF A FURTHER CERTIFICATION TEST, WHEREIN THE FIRST MAGNETIC DISKS ARE DECIDED AS QUALIFIED AND THE SECOND MAGNETIC DISKS ARE OBJECTS FOR THE CERTIFYING TEST.
MYPI9802849 1997-06-25 1998-06-23 Magnetic disk testing method and surface defect testing device MY117417A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18443297 1997-06-25

Publications (1)

Publication Number Publication Date
MY117417A true MY117417A (en) 2004-06-30

Family

ID=16153058

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI9802849 MY117417A (en) 1997-06-25 1998-06-23 Magnetic disk testing method and surface defect testing device

Country Status (2)

Country Link
MY (1) MY117417A (en)
SG (1) SG86326A1 (en)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
JPH01310485A (en) * 1988-06-08 1989-12-14 Dainippon Printing Co Ltd Defect information detecting device
JPH03273141A (en) * 1990-03-23 1991-12-04 Hitachi Electron Eng Co Ltd Defect detecting method for magnetic disk magnetic film and detection optical system
US5423111A (en) * 1992-09-22 1995-06-13 Hitachi Electronics Engineering Co., Ltd. Magnetic disk tester
JP3338561B2 (en) * 1994-08-26 2002-10-28 株式会社ソニー・ディスクテクノロジー Disk defect inspection device
US5625193A (en) * 1995-07-10 1997-04-29 Qc Optics, Inc. Optical inspection system and method for detecting flaws on a diffractive surface
US5818592A (en) * 1997-02-07 1998-10-06 Phase Metrics, Inc. Non-contact optical glide tester

Also Published As

Publication number Publication date
SG86326A1 (en) 2002-02-19

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