SG80677A1 - Branch transmission line, driver circuit, and semiconductor test system using the same - Google Patents
Branch transmission line, driver circuit, and semiconductor test system using the sameInfo
- Publication number
- SG80677A1 SG80677A1 SG200001930A SG200001930A SG80677A1 SG 80677 A1 SG80677 A1 SG 80677A1 SG 200001930 A SG200001930 A SG 200001930A SG 200001930 A SG200001930 A SG 200001930A SG 80677 A1 SG80677 A1 SG 80677A1
- Authority
- SG
- Singapore
- Prior art keywords
- same
- transmission line
- driver circuit
- test system
- semiconductor test
- Prior art date
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11143749A JP2000292491A (en) | 1999-04-08 | 1999-05-24 | Two branch transmission line and two branch driver circuit and semiconductor tester employing it |
Publications (1)
Publication Number | Publication Date |
---|---|
SG80677A1 true SG80677A1 (en) | 2001-05-22 |
Family
ID=15346132
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200001930A SG80677A1 (en) | 1999-04-08 | 2000-04-06 | Branch transmission line, driver circuit, and semiconductor test system using the same |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2000292491A (en) |
SG (1) | SG80677A1 (en) |
TW (1) | TW476870B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4707957B2 (en) * | 2004-02-12 | 2011-06-22 | 阪和電子工業株式会社 | Waveform observation device |
KR100761894B1 (en) * | 2004-03-12 | 2007-09-28 | 가부시키가이샤 아드반테스트 | Semiconductor device testing apparatus and device interface board |
TWI260415B (en) * | 2004-03-31 | 2006-08-21 | Nanya Technology Corp | Apparatus and method for testing semiconductor device |
JP4611885B2 (en) * | 2005-12-26 | 2011-01-12 | ルネサスエレクトロニクス株式会社 | Inspection system, inspection method, and wiring length adjustment method |
JPWO2010001440A1 (en) * | 2008-07-03 | 2011-12-15 | 株式会社アドバンテスト | Test equipment and socket board |
KR102577446B1 (en) | 2019-02-12 | 2023-09-11 | 삼성전자주식회사 | A test board, a method for fabricating the test board, a device test apparatus using the test board, and a method for fabricating a semiconductor device using the test board |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0622636A1 (en) * | 1993-04-29 | 1994-11-02 | International Business Machines Corporation | Method for improving accuracy tester auto-calibration |
EP0632385A1 (en) * | 1993-06-22 | 1995-01-04 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit including test circuit |
JPH07104030A (en) * | 1993-09-30 | 1995-04-21 | Ando Electric Co Ltd | Time measuring circuit |
-
1999
- 1999-05-24 JP JP11143749A patent/JP2000292491A/en not_active Withdrawn
-
2000
- 2000-03-31 TW TW89106070A patent/TW476870B/en not_active IP Right Cessation
- 2000-04-06 SG SG200001930A patent/SG80677A1/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0622636A1 (en) * | 1993-04-29 | 1994-11-02 | International Business Machines Corporation | Method for improving accuracy tester auto-calibration |
EP0632385A1 (en) * | 1993-06-22 | 1995-01-04 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit including test circuit |
JPH07104030A (en) * | 1993-09-30 | 1995-04-21 | Ando Electric Co Ltd | Time measuring circuit |
Also Published As
Publication number | Publication date |
---|---|
TW476870B (en) | 2002-02-21 |
JP2000292491A (en) | 2000-10-20 |
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