SG80677A1 - Branch transmission line, driver circuit, and semiconductor test system using the same - Google Patents

Branch transmission line, driver circuit, and semiconductor test system using the same

Info

Publication number
SG80677A1
SG80677A1 SG200001930A SG200001930A SG80677A1 SG 80677 A1 SG80677 A1 SG 80677A1 SG 200001930 A SG200001930 A SG 200001930A SG 200001930 A SG200001930 A SG 200001930A SG 80677 A1 SG80677 A1 SG 80677A1
Authority
SG
Singapore
Prior art keywords
same
transmission line
driver circuit
test system
semiconductor test
Prior art date
Application number
SG200001930A
Inventor
Yuhachi Morikawa
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG80677A1 publication Critical patent/SG80677A1/en

Links

SG200001930A 1999-04-08 2000-04-06 Branch transmission line, driver circuit, and semiconductor test system using the same SG80677A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11143749A JP2000292491A (en) 1999-04-08 1999-05-24 Two branch transmission line and two branch driver circuit and semiconductor tester employing it

Publications (1)

Publication Number Publication Date
SG80677A1 true SG80677A1 (en) 2001-05-22

Family

ID=15346132

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200001930A SG80677A1 (en) 1999-04-08 2000-04-06 Branch transmission line, driver circuit, and semiconductor test system using the same

Country Status (3)

Country Link
JP (1) JP2000292491A (en)
SG (1) SG80677A1 (en)
TW (1) TW476870B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4707957B2 (en) * 2004-02-12 2011-06-22 阪和電子工業株式会社 Waveform observation device
KR100761894B1 (en) * 2004-03-12 2007-09-28 가부시키가이샤 아드반테스트 Semiconductor device testing apparatus and device interface board
TWI260415B (en) * 2004-03-31 2006-08-21 Nanya Technology Corp Apparatus and method for testing semiconductor device
JP4611885B2 (en) * 2005-12-26 2011-01-12 ルネサスエレクトロニクス株式会社 Inspection system, inspection method, and wiring length adjustment method
JPWO2010001440A1 (en) * 2008-07-03 2011-12-15 株式会社アドバンテスト Test equipment and socket board
KR102577446B1 (en) 2019-02-12 2023-09-11 삼성전자주식회사 A test board, a method for fabricating the test board, a device test apparatus using the test board, and a method for fabricating a semiconductor device using the test board

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622636A1 (en) * 1993-04-29 1994-11-02 International Business Machines Corporation Method for improving accuracy tester auto-calibration
EP0632385A1 (en) * 1993-06-22 1995-01-04 Kabushiki Kaisha Toshiba Semiconductor integrated circuit including test circuit
JPH07104030A (en) * 1993-09-30 1995-04-21 Ando Electric Co Ltd Time measuring circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622636A1 (en) * 1993-04-29 1994-11-02 International Business Machines Corporation Method for improving accuracy tester auto-calibration
EP0632385A1 (en) * 1993-06-22 1995-01-04 Kabushiki Kaisha Toshiba Semiconductor integrated circuit including test circuit
JPH07104030A (en) * 1993-09-30 1995-04-21 Ando Electric Co Ltd Time measuring circuit

Also Published As

Publication number Publication date
TW476870B (en) 2002-02-21
JP2000292491A (en) 2000-10-20

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