SG28206A1 - Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same - Google Patents

Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same

Info

Publication number
SG28206A1
SG28206A1 SG1995000060A SG1995000060A SG28206A1 SG 28206 A1 SG28206 A1 SG 28206A1 SG 1995000060 A SG1995000060 A SG 1995000060A SG 1995000060 A SG1995000060 A SG 1995000060A SG 28206 A1 SG28206 A1 SG 28206A1
Authority
SG
Singapore
Prior art keywords
same
jig
usage
measuring
semiconductor manufacturing
Prior art date
Application number
SG1995000060A
Inventor
Yasuhiko Yokoya
Noboru Yamazaki
Mitsuo Nakamura
Syuuichi Hasuda
Eisaku Namai
Syuuzou Yamada
Original Assignee
Hitachi Chemical Co Ltd
Yamada Den On Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6035708A external-priority patent/JPH07244116A/en
Application filed by Hitachi Chemical Co Ltd, Yamada Den On Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to SG1995000060A priority Critical patent/SG28206A1/en
Publication of SG28206A1 publication Critical patent/SG28206A1/en

Links

SG1995000060A 1994-03-07 1995-03-06 Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same SG28206A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG1995000060A SG28206A1 (en) 1994-03-07 1995-03-06 Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6035708A JPH07244116A (en) 1994-03-07 1994-03-07 Semiconductor characteristics-measuring jig, manufacture thereof, and using method therefor
SG1995000060A SG28206A1 (en) 1994-03-07 1995-03-06 Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same

Publications (1)

Publication Number Publication Date
SG28206A1 true SG28206A1 (en) 1996-04-01

Family

ID=26374699

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1995000060A SG28206A1 (en) 1994-03-07 1995-03-06 Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same

Country Status (1)

Country Link
SG (1) SG28206A1 (en)

Similar Documents

Publication Publication Date Title
GB2288276B (en) Semiconductor device and method for manufacturing the same
EP0701278A3 (en) Semiconductor device and method for manufacturing same
GB9515147D0 (en) Semiconductor device and method of manufacturing the same
EP0700087A3 (en) Semiconductor device and method of manufacturing the same
SG44315A1 (en) Semiconductor device and method manufacturing thereof
SG42823A1 (en) Method of manufacturing semiconductor devices
GB9915047D0 (en) Method for manufacturing a pad part of an lcd and the lcd structure having the same part
TW427530U (en) Construction of a chip type resistor and method for manufacturing the same
EP0547709A3 (en) Test elements and method for manufacturing thereof
EP0717477A3 (en) Semiconductor device and method for manufacturing the same
EP0714032A3 (en) Manufacturing defect analyzer
DE69536130D1 (en) Semiconductor component and its manufacturing method
GB2291536B (en) Method for manufacturing semiconductor device
EP0699920A3 (en) Semiconductor integrated circuit with a testable block
GB2306778B (en) Semiconductor device and a method of manufacturing the same
EP0702204A3 (en) A method of evaluating silicon wafers
GB9519925D0 (en) Electrostatic chuck and method of manufacturing the same
GB2289984B (en) Method for the fabrication of a semiconductor device
EP0709879A4 (en) Method for manufacturing semiconductor
EP0692819A3 (en) Method of manufacturing a semiconductor device including pre-oxidation process
GB2331845B (en) Semiconductor device and manufacturing method for same
SG28206A1 (en) Jig for measuring the characteristics of a semiconductor manufacturing method for the same and usage of the same
GB2280546B (en) A semiconductor device and a method for manufacturing the same
GB2310759B (en) Method of manufacturing a semiconductor device
GB2313477B (en) Method of manufacturing a semiconductor device