SG189840A1 - Computer-aided assignment of ratings to digital samples of a manufactured web product - Google Patents

Computer-aided assignment of ratings to digital samples of a manufactured web product Download PDF

Info

Publication number
SG189840A1
SG189840A1 SG2013025739A SG2013025739A SG189840A1 SG 189840 A1 SG189840 A1 SG 189840A1 SG 2013025739 A SG2013025739 A SG 2013025739A SG 2013025739 A SG2013025739 A SG 2013025739A SG 189840 A1 SG189840 A1 SG 189840A1
Authority
SG
Singapore
Prior art keywords
image
rating
training images
training
images
Prior art date
Application number
SG2013025739A
Other languages
English (en)
Inventor
Evan J Ribnick
Kenneth G Brittain
Gregory D Kostuch
Catherine P Tarnowski
Derek H Justice
Guillermo Sapiro
Sammuel D Herbert
David L Hofeldt
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of SG189840A1 publication Critical patent/SG189840A1/en

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/23Clustering techniques
    • G06F18/232Non-hierarchical techniques
    • G06F18/2321Non-hierarchical techniques using statistics or function optimisation, e.g. modelling of probability density functions
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/40Software arrangements specially adapted for pattern recognition, e.g. user interfaces or toolboxes therefor
    • G06F18/41Interactive pattern learning with a human teacher
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/762Arrangements for image or video recognition or understanding using pattern recognition or machine learning using clustering, e.g. of similar faces in social networks
    • G06V10/763Non-hierarchical techniques, e.g. based on statistics of modelling distributions
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/778Active pattern-learning, e.g. online learning of image or video features
    • G06V10/7784Active pattern-learning, e.g. online learning of image or video features based on feedback from supervisors
    • G06V10/7788Active pattern-learning, e.g. online learning of image or video features based on feedback from supervisors the supervisor being a human, e.g. interactive learning with a human teacher
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/12Classification; Matching
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30124Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Databases & Information Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Health & Medical Sciences (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Probability & Statistics with Applications (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Multimedia (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Human Computer Interaction (AREA)
  • Signal Processing (AREA)
  • Textile Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Processing Or Creating Images (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG2013025739A 2010-10-19 2011-10-14 Computer-aided assignment of ratings to digital samples of a manufactured web product SG189840A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US39442810P 2010-10-19 2010-10-19
PCT/US2011/056377 WO2012054339A1 (en) 2010-10-19 2011-10-14 Computer-aided assignment of ratings to digital samples of a manufactured web product

Publications (1)

Publication Number Publication Date
SG189840A1 true SG189840A1 (en) 2013-06-28

Family

ID=45975571

Family Applications (1)

Application Number Title Priority Date Filing Date
SG2013025739A SG189840A1 (en) 2010-10-19 2011-10-14 Computer-aided assignment of ratings to digital samples of a manufactured web product

Country Status (8)

Country Link
US (1) US8965116B2 (enExample)
EP (1) EP2630474A4 (enExample)
JP (1) JP5898221B2 (enExample)
KR (1) KR101800057B1 (enExample)
CN (1) CN103168227B (enExample)
BR (1) BR112013008305A2 (enExample)
SG (1) SG189840A1 (enExample)
WO (1) WO2012054339A1 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130179252A1 (en) * 2012-01-11 2013-07-11 Yahoo! Inc. Method or system for content recommendations
WO2014076360A1 (en) * 2012-11-16 2014-05-22 Metso Automation Oy Measurement of structural properties
US20140201208A1 (en) * 2013-01-15 2014-07-17 Corporation Symantec Classifying Samples Using Clustering
CN103411974B (zh) * 2013-07-10 2017-02-08 杭州赤霄科技有限公司 基于云端大数据的平面材料检测远程系统及检测方法
KR101491461B1 (ko) * 2013-08-02 2015-02-23 포항공과대학교 산학협력단 공분산 기술자를 이용하는 물체 인식 방법 및 장치
US9767385B2 (en) * 2014-08-12 2017-09-19 Siemens Healthcare Gmbh Multi-layer aggregation for object detection
CA2964503C (en) 2014-10-14 2023-03-14 Eigen Innovations Inc. System, apparatus and method for configuration of industrial vision control modules
WO2016115280A1 (en) 2015-01-14 2016-07-21 Virta Laboratories, Inc. Anomaly and malware detection using side channel analysis
US20160321523A1 (en) * 2015-04-30 2016-11-03 The Regents Of The University Of California Using machine learning to filter monte carlo noise from images
JP6338781B2 (ja) * 2015-08-20 2018-06-06 三菱電機株式会社 学習装置および学習識別システム
CN105480772B (zh) * 2015-11-26 2017-08-25 凌云光技术集团有限责任公司 卷装标签检剔分离系统及离线剔除设备的停机方法
US9928427B2 (en) * 2015-12-03 2018-03-27 GM Global Technology Operations LLC Vision-based wet road surface condition detection using tire rearward splash
CN105599440B (zh) * 2015-12-16 2017-11-14 凌云光技术集团有限责任公司 凹印机检剔分离工艺中的剔废方法及装置
US10181185B2 (en) * 2016-01-11 2019-01-15 Kla-Tencor Corp. Image based specimen process control
US10235623B2 (en) * 2016-02-12 2019-03-19 Adobe Inc. Accurate tag relevance prediction for image search
US10664719B2 (en) 2016-02-12 2020-05-26 Adobe Inc. Accurate tag relevance prediction for image search
US10190991B2 (en) * 2016-11-03 2019-01-29 Applied Materials Israel Ltd. Method for adaptive sampling in examining an object and system thereof
KR102450374B1 (ko) * 2016-11-17 2022-10-04 삼성전자주식회사 데이터 인식 및 트레이닝 장치 및 방법
CN108038516B (zh) * 2017-12-27 2022-02-01 中山大学 基于低维图像编码与集成学习的白胚布平整度分级方法
AU2019289958B2 (en) 2018-06-19 2021-12-23 Borealis Ag Method for evaluation of quality of laser printed samples
WO2020110129A1 (en) * 2018-11-29 2020-06-04 Inspekto A.M.V Ltd Centralized analytics of multiple visual inspection appliances
US11682113B2 (en) 2018-11-29 2023-06-20 Inspekto A.M.V. Ltd. Multi-camera visual inspection appliance and method of use
IL263399B (en) 2018-11-29 2022-09-01 Inspekto A M V Ltd Centralized analyzes of multiple devices for visual inspection of a production line
US11023710B2 (en) * 2019-02-20 2021-06-01 Huawei Technologies Co., Ltd. Semi-supervised hybrid clustering/classification system
KR102738463B1 (ko) * 2019-10-08 2024-12-04 한국전자통신연구원 딥 러닝 기반으로 애니메이션 캐릭터를 학습하는 데 필요한 학습 데이터 생성 방법 및 장치
WO2021120181A1 (zh) * 2019-12-20 2021-06-24 京东方科技集团股份有限公司 推理计算装置、模型训练装置、推理计算系统
US11256967B2 (en) * 2020-01-27 2022-02-22 Kla Corporation Characterization system and method with guided defect discovery
CN111459779B (zh) * 2020-03-13 2023-01-06 苏州浪潮智能科技有限公司 一种服务器质量等级分类方法和系统
CN115485740A (zh) 2020-04-22 2022-12-16 Pdf决策公司 异常晶片图像分类
KR102287954B1 (ko) * 2020-05-15 2021-08-06 강병진 인공지능 기반의 김 분류를 통한 상품화 및 품질 관리 시스템 및 방법
EP3955206A1 (en) * 2020-08-10 2022-02-16 GKN Aerospace Norway AS Autonomous penetrant testing
CN113269255B (zh) * 2021-05-26 2025-09-05 全芯智造技术有限公司 用于检测缺陷的方法、设备和计算机可读存储介质
CN113808094A (zh) * 2021-09-10 2021-12-17 武汉联开检测科技有限公司 一种射线检测焊接缺陷图像评级系统及方法
US12124575B2 (en) * 2021-12-02 2024-10-22 At&T Intellectual Property I, L.P. System for detection of visual malware via learned contextual models
KR102617719B1 (ko) * 2023-02-07 2023-12-27 한국과학기술원 파일 정렬 시스템
CN116698849A (zh) * 2023-05-19 2023-09-05 中国电信股份有限公司广东研究院 缺陷检测方法、装置、计算机设备和存储介质
KR20250111605A (ko) * 2024-01-15 2025-07-22 삼성전자주식회사 이미지 분할을 지원하기 위한 전자 장치
EP4621392A1 (en) * 2024-03-21 2025-09-24 Veridos GmbH Anomaly detection system and method for detecting anomalies

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5911139A (en) 1996-03-29 1999-06-08 Virage, Inc. Visual image database search engine which allows for different schema
JP4132229B2 (ja) * 1998-06-03 2008-08-13 株式会社ルネサステクノロジ 欠陥分類方法
US6445834B1 (en) 1998-10-19 2002-09-03 Sony Corporation Modular image query system
JP4173246B2 (ja) 1999-04-28 2008-10-29 株式会社リコー 類似画像表示方法及び類似画像表示処理プログラムを格納した記録媒体
US6999614B1 (en) * 1999-11-29 2006-02-14 Kla-Tencor Corporation Power assisted automatic supervised classifier creation tool for semiconductor defects
US7099860B1 (en) 2000-10-30 2006-08-29 Microsoft Corporation Image retrieval systems and methods with semantic and feature based relevance feedback
US6681060B2 (en) 2001-03-23 2004-01-20 Intel Corporation Image retrieval using distance measure
US6847733B2 (en) 2001-05-23 2005-01-25 Eastman Kodak Company Retrieval and browsing of database images based on image emphasis and appeal
US7283659B1 (en) 2002-01-09 2007-10-16 Kla-Tencor Technologies Corporation Apparatus and methods for searching through and analyzing defect images and wafer maps
JP4155496B2 (ja) * 2002-04-25 2008-09-24 大日本スクリーン製造株式会社 分類支援装置、分類装置およびプログラム
JP2004045356A (ja) * 2002-05-20 2004-02-12 Jfe Steel Kk 表面欠陥検出方法
JP2004109105A (ja) * 2002-07-23 2004-04-08 Jfe Steel Kk 表面欠陥検出における疵種分類境界設定方法、及び欠陥検出方法
US7233692B2 (en) * 2002-11-14 2007-06-19 Lockheed Martin Corporation Method and computer program product for identifying output classes with multi-modal dispersion in feature space and incorporating multi-modal structure into a pattern recognition system
US7162071B2 (en) * 2002-12-20 2007-01-09 Taiwan Semiconductor Manufacturing Co., Ltd. Progressive self-learning defect review and classification method
US7359544B2 (en) 2003-02-12 2008-04-15 Kla-Tencor Technologies Corporation Automatic supervised classifier setup tool for semiconductor defects
US20050135667A1 (en) * 2003-12-22 2005-06-23 Abb Oy. Method and apparatus for labeling images and creating training material
US7720289B2 (en) * 2005-12-14 2010-05-18 Mitsubishi Electric Research Laboratories, Inc. Method for constructing covariance matrices from data features
US7792353B2 (en) * 2006-10-31 2010-09-07 Hewlett-Packard Development Company, L.P. Retraining a machine-learning classifier using re-labeled training samples
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置
WO2010059679A2 (en) 2008-11-19 2010-05-27 3M Innovative Properties Company Constructing enhanced hybrid classifiers from parametric classifier families using receiver operating characteristics
JP5063632B2 (ja) * 2009-03-10 2012-10-31 株式会社豊田中央研究所 学習モデル生成装置、対象物検出システム、及びプログラム

Also Published As

Publication number Publication date
JP2013541715A (ja) 2013-11-14
KR20130126916A (ko) 2013-11-21
EP2630474A1 (en) 2013-08-28
CN103168227B (zh) 2016-01-20
KR101800057B1 (ko) 2017-11-21
US20130202200A1 (en) 2013-08-08
EP2630474A4 (en) 2017-04-19
JP5898221B2 (ja) 2016-04-06
BR112013008305A2 (pt) 2023-12-26
WO2012054339A1 (en) 2012-04-26
CN103168227A (zh) 2013-06-19
US8965116B2 (en) 2015-02-24

Similar Documents

Publication Publication Date Title
US8965116B2 (en) Computer-aided assignment of ratings to digital samples of a manufactured web product
US9002072B2 (en) System for detection of non-uniformities in web-based materials
Bisheh et al. A layer-by-layer quality monitoring framework for 3D printing
US9031312B2 (en) Rapid processing and detection of non-uniformities in web-based materials
US20130208978A1 (en) Continuous charting of non-uniformity severity for detecting variability in web-based materials
US12482244B2 (en) Active learning management system for automated inspection systems
US7552062B2 (en) Method and system for clinical process analysis
Su et al. Potato quality grading based on depth imaging and convolutional neural network
CN114820481B (zh) 基于转换器的肺癌组织病理全切片egfr状态预测方法
US20240037724A1 (en) Plant detection and display system
CN117015812A (zh) 用于对数据点进行聚类的系统
Ren et al. Building construction crack detection with BCCD YOLO enhanced feature fusion and attention mechanisms
Alam et al. Deep learning based radish and leaf segmentation for phenotype trait measurement
Abishek et al. Soil texture prediction using machine learning approach for sustainable soil health management
Badashah et al. Taylor-Gorilla troops optimized deep learning network for surface roughness estimation
Ratusny et al. Characterizing customer ordering Behaviors in semiconductor supply chains with convolutional neural networks
Kartal et al. AI-Driven Background Segmentation for High-Throughput 3D Plant Scans