SG157241A1 - Method and apparatus for integrated circuit inspection - Google Patents

Method and apparatus for integrated circuit inspection

Info

Publication number
SG157241A1
SG157241A1 SG200803699-8A SG2008036998A SG157241A1 SG 157241 A1 SG157241 A1 SG 157241A1 SG 2008036998 A SG2008036998 A SG 2008036998A SG 157241 A1 SG157241 A1 SG 157241A1
Authority
SG
Singapore
Prior art keywords
substrates
integrated circuit
circuit inspection
receiving rack
inspection
Prior art date
Application number
SG200803699-8A
Inventor
Nee Seng Ling
Ang Soo Loo
Original Assignee
Rokko Ventures Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rokko Ventures Pte Ltd filed Critical Rokko Ventures Pte Ltd
Priority to SG200803699-8A priority Critical patent/SG157241A1/en
Priority to PCT/SG2009/000172 priority patent/WO2009139728A1/en
Publication of SG157241A1 publication Critical patent/SG157241A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00089—Magazines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

A system for inspection and collating substrates comprising a receiving rack in communication with a reflow oven; said receiving rack arranged to receive a plurality of substrates from said reflow oven; an inspection device for inspecting said substrates and recording a status of each inspected substrate; a collector for receiving said substrates from said receiving rack, the collector including a racking device for collating the substrates according to the recorded status. Figure 2B
SG200803699-8A 2008-05-13 2008-05-13 Method and apparatus for integrated circuit inspection SG157241A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SG200803699-8A SG157241A1 (en) 2008-05-13 2008-05-13 Method and apparatus for integrated circuit inspection
PCT/SG2009/000172 WO2009139728A1 (en) 2008-05-13 2009-05-13 Method and apparatus for integrated circuit inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200803699-8A SG157241A1 (en) 2008-05-13 2008-05-13 Method and apparatus for integrated circuit inspection

Publications (1)

Publication Number Publication Date
SG157241A1 true SG157241A1 (en) 2009-12-29

Family

ID=41318934

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200803699-8A SG157241A1 (en) 2008-05-13 2008-05-13 Method and apparatus for integrated circuit inspection

Country Status (2)

Country Link
SG (1) SG157241A1 (en)
WO (1) WO2009139728A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN211965066U (en) * 2020-04-23 2020-11-20 苏州必为智能控制科技有限公司 Visual defect detection equipment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0318769A (en) * 1989-06-15 1991-01-28 Tanaka Kikinzoku Kogyo Kk Automatic wiring inspecting machine
JPH03229499A (en) * 1990-02-05 1991-10-11 Taiyo Yuden Co Ltd Apparatus for visual inspection of electronic circuit board
JP2002368500A (en) * 2001-06-04 2002-12-20 Fuji Photo Film Co Ltd Printed-wiring board inspection apparatus

Also Published As

Publication number Publication date
WO2009139728A1 (en) 2009-11-19

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