SG151217A1 - A device for inspecting tangential recesses in a rotor disk - Google Patents

A device for inspecting tangential recesses in a rotor disk

Info

Publication number
SG151217A1
SG151217A1 SG200806957-7A SG2008069577A SG151217A1 SG 151217 A1 SG151217 A1 SG 151217A1 SG 2008069577 A SG2008069577 A SG 2008069577A SG 151217 A1 SG151217 A1 SG 151217A1
Authority
SG
Singapore
Prior art keywords
inspecting
rotor disk
recesses
tangential recesses
tangential
Prior art date
Application number
SG200806957-7A
Other languages
English (en)
Inventor
Patrick Briffa
Patrick Cabanis
Rene Le Flocaeh
Armand Marceau Christian
Dominique Thibault
Vincent Pasquer
Original Assignee
Snecma
Snecma Services
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Snecma, Snecma Services filed Critical Snecma
Publication of SG151217A1 publication Critical patent/SG151217A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
SG200806957-7A 2007-09-19 2008-09-18 A device for inspecting tangential recesses in a rotor disk SG151217A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0757669A FR2921158B1 (fr) 2007-09-19 2007-09-19 Dispositif de controle des alveoles tangentielles d'un disque de rotor

Publications (1)

Publication Number Publication Date
SG151217A1 true SG151217A1 (en) 2009-04-30

Family

ID=39311073

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200806957-7A SG151217A1 (en) 2007-09-19 2008-09-18 A device for inspecting tangential recesses in a rotor disk

Country Status (9)

Country Link
US (1) US7800364B2 (ja)
EP (1) EP2040069B1 (ja)
JP (1) JP5294773B2 (ja)
CN (1) CN101393169B (ja)
CA (1) CA2639589C (ja)
FR (1) FR2921158B1 (ja)
IL (1) IL194171A (ja)
RU (1) RU2473066C2 (ja)
SG (1) SG151217A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2931242B1 (fr) * 2008-05-14 2010-06-11 Snecma Sonde destinee au controle par courants de foucault de la surface d'une alveole circonferentielle d'un disque de turboreacteur
FR2947633B1 (fr) * 2009-07-02 2012-04-13 Snecma Dispositif de controle non destructif d'une piece
FR2947911B1 (fr) * 2009-07-09 2011-06-17 Snecma Dispositif de controle d'un moteur de turbomachine
US9551689B2 (en) * 2010-02-26 2017-01-24 United Technologies Corporation Inspection device utilizing eddy currents
EP2447714A1 (de) * 2010-10-28 2012-05-02 Siemens Aktiengesellschaft Automatische prüfkopfpositionsabhängige Einschallwinkelverstellung für Ultraschallprüfköpfe
US8505364B2 (en) * 2011-11-04 2013-08-13 General Electric Company Systems and methods for use in monitoring operation of a rotating component
US8640531B2 (en) * 2012-04-17 2014-02-04 General Electric Company Turbine inspection system and related method of operation
US9110036B2 (en) * 2012-08-02 2015-08-18 Olympus Ndt, Inc. Assembly with a universal manipulator for inspecting dovetail of different sizes
JP6121711B2 (ja) * 2012-12-28 2017-04-26 三菱日立パワーシステムズ株式会社 渦電流探傷装置および渦電流探傷方法
US9518851B2 (en) 2014-12-03 2016-12-13 General Electric Company Probes for inspection system for substantially round hole

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4262425A (en) * 1980-06-13 1981-04-21 General Electric Company Self-adjusting inspection apparatus
JPS6344162A (ja) * 1986-08-11 1988-02-25 Kubota Ltd サクシヨンロ−ルシエル亀裂検出装置
US4970890A (en) * 1988-11-23 1990-11-20 Westinghouse Electric Corp. Electric generator inspection system
RU2029274C1 (ru) * 1991-01-08 1995-02-20 Институт проблем машиностроения АН Украины Способ настройки на резонансную частоту колебания испытываемых лопаток рабочего колеса
US5315234A (en) * 1992-04-03 1994-05-24 General Electric Company Eddy current device for inspecting a component having a flexible support with a plural sensor array
US5442286A (en) * 1993-09-22 1995-08-15 General Electric Company Eddy current array inspection device
RU2111469C1 (ru) * 1997-04-11 1998-05-20 Анатолий Алексеевич Хориков Способ диагностики колебаний рабочего колеса турбомашины
US6608478B1 (en) * 2001-12-07 2003-08-19 General Electric Company Rotor slot bottom inspection apparatus and method
US6745622B2 (en) * 2002-10-31 2004-06-08 General Electric Company Apparatus and method for inspecting dovetail slot width for gas turbine engine disk
US6972561B2 (en) * 2003-02-28 2005-12-06 General Electric Company Internal eddy current inspection
FR2853056B1 (fr) * 2003-03-28 2005-07-15 Snecma Moteurs Dispositif et procede de mesure de profil
FR2871567B1 (fr) * 2004-06-11 2006-11-24 Snecma Moteurs Sa Installation de controle non destructif d'une piece
US6952094B1 (en) * 2004-12-22 2005-10-04 General Electric Company Nondestructive inspection method and system therefor
JP2008089328A (ja) * 2006-09-29 2008-04-17 Hitachi Ltd 渦電流探傷装置及び渦電流探傷方法
FR2915581B1 (fr) * 2007-04-27 2010-09-03 Snecma Dispositif de controle par courants de foucault d'une cavite rectiligne
FR2915582B1 (fr) * 2007-04-27 2009-08-21 Snecma Sa Procede et installation de controle non destructif par courants de foucault, a etalonnage automatique
FR2916851B1 (fr) * 2007-05-29 2010-08-13 Snecma Dispositif de controle non destructif, par courants de foucault d'un trou pratique dans une piece conductrice

Also Published As

Publication number Publication date
IL194171A (en) 2012-03-29
CA2639589A1 (fr) 2009-03-19
US7800364B2 (en) 2010-09-21
FR2921158B1 (fr) 2011-05-06
US20090267598A1 (en) 2009-10-29
EP2040069B1 (fr) 2015-11-11
FR2921158A1 (fr) 2009-03-20
CN101393169B (zh) 2013-09-04
IL194171A0 (en) 2009-08-03
JP2009075106A (ja) 2009-04-09
JP5294773B2 (ja) 2013-09-18
RU2008137429A (ru) 2010-03-27
EP2040069A1 (fr) 2009-03-25
CN101393169A (zh) 2009-03-25
RU2473066C2 (ru) 2013-01-20
CA2639589C (fr) 2016-10-18

Similar Documents

Publication Publication Date Title
SG151217A1 (en) A device for inspecting tangential recesses in a rotor disk
GB2458836A (en) Method and apparatus for non destructive testing
TW200951442A (en) Probe card inclination adjusting method and inclination detecting method
WO2011085255A3 (en) Inspection guided overlay metrology
TW200642027A (en) Probe assembly, method of producing it and electrical connecting apparatus
EP2182363A3 (en) Sample processing apparatus and sample information display apparatus
ATE553457T1 (de) Binned-micro-vessel-dichteverfahren und vorrichtungen
WO2007120996A3 (en) Method and apparatus for compact spectrometer for detecting hazardous agents
TW200732671A (en) Probe card transfer assist apparatus and inspection equipment using the same
GB2460573A (en) A method and apparatus for estimating a property of a fluid downhole
TW201215879A (en) Method and system for optimizing optical inspection of patterned structures
WO2007101279A3 (en) Method and apparatus for compact spectrometer with fiber array spectral translator
GB2468097A (en) Process and apparatus for testing a component using an omni-directional eddy current probe
ATE519093T1 (de) Vorrichtung zum optischen vermessen und/oder prüfen von länglichen produkten
WO2012110898A9 (en) System and method for multi-scanner x-ray inspection
GB0913555D0 (en) A magnetic resonance force detection apparatus and associated methods
WO2013182317A8 (en) Probe card for an apparatus for testing electronic devices
JP2013160761A (ja) 可撓性渦電流アレイプローブを使用するガスタービンディスク検査
ATE393870T1 (de) Sondenreinigungsverfahren und -vorrichtung
EP2685402A3 (en) Cell analyzing apparatus and cell analyzing method
SA519410254B1 (ar) جهاز وطريقة لقياس انتشارية الهيدروجين بصورة غير تدميرية
CN203965400U (zh) 薄层色谱-拉曼光谱联用装置
ATE430943T1 (de) Testvorrichtung zum testen von elektronischen bauelementen
SA519410353B1 (ar) جهاز وطريقة لقياس انتشارية الهيدروجين بصورة غير تدميرية
EP2423681A3 (en) Drive coil for eddy current probe