SG114531A1 - Binary weighted thermometer code for pvt controlled output drivers - Google Patents

Binary weighted thermometer code for pvt controlled output drivers

Info

Publication number
SG114531A1
SG114531A1 SG200201266A SG200201266A SG114531A1 SG 114531 A1 SG114531 A1 SG 114531A1 SG 200201266 A SG200201266 A SG 200201266A SG 200201266 A SG200201266 A SG 200201266A SG 114531 A1 SG114531 A1 SG 114531A1
Authority
SG
Singapore
Prior art keywords
pvt
output drivers
controlled output
thermometer code
binary weighted
Prior art date
Application number
SG200201266A
Other languages
English (en)
Inventor
Harlan Humphrey Guy
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of SG114531A1 publication Critical patent/SG114531A1/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/14—Conversion to or from non-weighted codes
    • H03M7/16—Conversion to or from unit-distance codes, e.g. Gray code, reflected binary code
    • H03M7/165—Conversion to or from thermometric code
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/02—Conversion to or from weighted codes, i.e. the weight given to a digit depending on the position of the digit within the block or code word

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
SG200201266A 2001-08-02 2002-03-06 Binary weighted thermometer code for pvt controlled output drivers SG114531A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/921,025 US6509757B1 (en) 2001-08-02 2001-08-02 Binary weighted thermometer code for PVT controlled output drivers

Publications (1)

Publication Number Publication Date
SG114531A1 true SG114531A1 (en) 2005-09-28

Family

ID=25444798

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200201266A SG114531A1 (en) 2001-08-02 2002-03-06 Binary weighted thermometer code for pvt controlled output drivers

Country Status (3)

Country Link
US (1) US6509757B1 (enExample)
JP (1) JP4008776B2 (enExample)
SG (1) SG114531A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6864706B1 (en) * 2000-07-20 2005-03-08 Silicon Graphics, Inc. GTL+Driver
US6636821B2 (en) * 2001-07-03 2003-10-21 International Business Machines Corporation Output driver impedance calibration circuit
US7057415B2 (en) * 2003-12-10 2006-06-06 Hewlett-Packard Development Company, L.P. Output buffer compensation control
US7005886B2 (en) * 2004-04-30 2006-02-28 Agilent Technologies, Inc. Tristateable CMOS driver with controlled slew rate for integrated circuit I/O pads
US7088129B2 (en) * 2004-04-30 2006-08-08 Avago Technologies General Ip (Singapore) Pte. Ltd. Hybrid binary/thermometer code for controlled-voltage integrated circuit output drivers
US7157932B2 (en) * 2004-11-30 2007-01-02 Agere Systems Inc. Adjusting settings of an I/O circuit for process, voltage, and/or temperature variations
US7327167B2 (en) * 2005-04-28 2008-02-05 Silicon Graphics, Inc. Anticipatory programmable interface pre-driver
US7389194B2 (en) 2005-07-06 2008-06-17 Rambus Inc. Driver calibration methods and circuits
US20070024317A1 (en) * 2005-07-29 2007-02-01 Hansen James E Apparatus for obtaining precision integrated resistors
KR100681881B1 (ko) * 2006-04-06 2007-02-15 주식회사 하이닉스반도체 반도체 메모리의 온 다이 터미네이션 장치 및 방법
US7417452B1 (en) * 2006-08-05 2008-08-26 Altera Corporation Techniques for providing adjustable on-chip termination impedance
JP5151145B2 (ja) * 2006-12-26 2013-02-27 ソニー株式会社 スイッチ回路、可変コンデンサ回路およびそのｉｃ
US7551020B2 (en) * 2007-05-31 2009-06-23 Agere Systems Inc. Enhanced output impedance compensation
TW200910373A (en) 2007-06-08 2009-03-01 Mosaid Technologies Inc Dynamic impedance control for input/output buffers
US7586325B1 (en) * 2007-12-03 2009-09-08 Lattice Semiconductor Corporation Integrated circuit having independent voltage and process/temperature control
US8390320B2 (en) * 2011-03-10 2013-03-05 Infineon Technologies Ag Dynamic pad hardware control
FR2988239A1 (fr) * 2012-03-16 2013-09-20 Converteam Technology Ltd Procede de compensation des tolerances de fabrication d'au moins un parametre electrique d'un transistor de puissance et systeme associe
US8957715B2 (en) * 2012-10-17 2015-02-17 Allegro Microsystems, Llc Output driver having improved electromagnetic compatibility (EMC) and associated methods
US9276780B2 (en) * 2013-03-05 2016-03-01 Lattice Semiconductor Corporation Calibration of single-ended high-speed interfaces
US9928194B2 (en) 2015-11-30 2018-03-27 Allegro Microsystems, Llc Non-linear transmit biasing for a serial bus transmitter
US9621140B1 (en) 2016-01-15 2017-04-11 Allegro Microsystems, Llc Electronic circuit for driving an output current signal and method of driving the output current signal from the electronic circuit to achieve an altered transition of the output current signal
CN113325639B (zh) * 2021-05-27 2022-07-12 Tcl华星光电技术有限公司 Goa电路及显示装置
US12289807B2 (en) * 2022-05-17 2025-04-29 Diodes Incorporated LED color and brightness control apparatus and method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5955894A (en) * 1997-06-25 1999-09-21 Sun Microsystems, Inc. Method for controlling the impedance of a driver circuit
US6118310A (en) 1998-11-04 2000-09-12 Agilent Technologies Digitally controlled output driver and method for impedance matching
US6326802B1 (en) * 1999-09-30 2001-12-04 Intel Corporation On-die adaptive arrangements for continuous process, voltage and temperature compensation

Also Published As

Publication number Publication date
US6509757B1 (en) 2003-01-21
JP2003069416A (ja) 2003-03-07
JP4008776B2 (ja) 2007-11-14

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