SG11202111974QA - Mixed active depth - Google Patents

Mixed active depth

Info

Publication number
SG11202111974QA
SG11202111974QA SG11202111974QA SG11202111974QA SG11202111974QA SG 11202111974Q A SG11202111974Q A SG 11202111974QA SG 11202111974Q A SG11202111974Q A SG 11202111974QA SG 11202111974Q A SG11202111974Q A SG 11202111974QA SG 11202111974Q A SG11202111974Q A SG 11202111974QA
Authority
SG
Singapore
Prior art keywords
mixed active
active depth
depth
mixed
active
Prior art date
Application number
SG11202111974QA
Inventor
Biay-Cheng Hseih
Jian Ma
Sergiu Radu Goma
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of SG11202111974QA publication Critical patent/SG11202111974QA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
    • G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/484—Transmitters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4915—Time delay measurement, e.g. operational details for pixel components; Phase measurement
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
    • G02B27/425—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in illumination systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • H01L27/14605—Structural or functional details relating to the position of the pixel elements, e.g. smaller pixel elements in the center of the imager compared to pixel elements at the periphery
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14641—Electronic components shared by two or more pixel-elements, e.g. one amplifier shared by two pixel elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0938—Using specific optical elements
    • G02B27/0944—Diffractive optical elements, e.g. gratings, holograms
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
SG11202111974QA 2019-06-05 2020-03-27 Mixed active depth SG11202111974QA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962857804P 2019-06-05 2019-06-05
US16/682,530 US11561085B2 (en) 2019-06-05 2019-11-13 Resolving multipath interference using a mixed active depth system
PCT/US2020/025268 WO2020247046A1 (en) 2019-06-05 2020-03-27 Mixed active depth

Publications (1)

Publication Number Publication Date
SG11202111974QA true SG11202111974QA (en) 2021-12-30

Family

ID=73650260

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202111974QA SG11202111974QA (en) 2019-06-05 2020-03-27 Mixed active depth

Country Status (7)

Country Link
US (1) US11561085B2 (en)
EP (1) EP3980807A1 (en)
CN (1) CN113924507A (en)
BR (1) BR112021023513A2 (en)
SG (1) SG11202111974QA (en)
TW (1) TW202111349A (en)
WO (1) WO2020247046A1 (en)

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JP6673266B2 (en) * 2017-03-08 2020-03-25 オムロン株式会社 Mutual reflection detecting device, mutual reflection detecting method, and program
CN113810530A (en) * 2019-05-31 2021-12-17 Oppo广东移动通信有限公司 Control method of electronic device and electronic device
US11563873B2 (en) 2020-04-14 2023-01-24 Qualcomm Incorporated Wide-angle 3D sensing
US20220252893A1 (en) * 2021-02-09 2022-08-11 Himax Technologies Limited Light projection apparatus
EP4303533A1 (en) * 2021-03-05 2024-01-10 Toppan Inc. Distance image capturing device and distance image capturing method
TWI792381B (en) * 2021-03-25 2023-02-11 鈺立微電子股份有限公司 Image capture device and depth information calculation method thereof
WO2022203717A1 (en) * 2021-03-26 2022-09-29 Qualcomm Incorporated Mixed-mode depth imaging
CN113093213B (en) * 2021-04-08 2023-05-09 上海炬佑智能科技有限公司 ToF sensing device and distance detection method thereof
WO2023025726A1 (en) * 2021-08-23 2023-03-02 Trinamix Gmbh Shape-from-shading
TW202315250A (en) * 2021-09-13 2023-04-01 美商元平台技術有限公司 Vcsel chip for generation of linear structured light patterns and flood illumination
US11922606B2 (en) * 2021-10-04 2024-03-05 Samsung Electronics Co., Ltd. Multipass interference correction and material recognition based on patterned illumination without frame rate loss
US11791925B2 (en) * 2021-11-08 2023-10-17 Huawei Technologies Co., Ltd. Method, apparatus and system for determining multipath interference (MPI) on an optical link
JP2024016593A (en) * 2022-07-26 2024-02-07 ソニーセミコンダクタソリューションズ株式会社 Illumination device, distance measuring device, and on-vehicle device
WO2024081491A1 (en) * 2022-10-14 2024-04-18 Qualcomm Incorporated Active depth sensing

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US8197070B2 (en) 2006-01-24 2012-06-12 Seiko Epson Corporation Color-based feature identification
JP2011244297A (en) * 2010-05-20 2011-12-01 Panasonic Corp Drive unit for ccd charge transfer
US10044985B1 (en) 2012-10-19 2018-08-07 Amazon Technologies, Inc. Video monitoring using plenoptic cameras and mirrors
US20140118257A1 (en) * 2012-10-29 2014-05-01 Amazon Technologies, Inc. Gesture detection systems
WO2016076796A1 (en) 2014-11-12 2016-05-19 Heptagon Micro Optics Pte. Ltd. Optoelectronic modules for distance measurements and/or multi-dimensional imaging
JP2016202453A (en) 2015-04-20 2016-12-08 株式会社トプコン Microscope for ophthalmic surgery
US10437129B2 (en) * 2015-11-10 2019-10-08 Verily Life Sciences Llc Dynamic diffractive liquid crystal lens
US10582178B2 (en) * 2016-11-02 2020-03-03 Omnivision Technologies, Inc. Systems and methods for active depth imager with background subtract
US10598768B2 (en) * 2017-05-24 2020-03-24 Microsoft Technology Licensing, Llc Multipath mitigation for time of flight system
US10705214B2 (en) * 2017-07-14 2020-07-07 Microsoft Technology Licensing, Llc Optical projector having switchable light emission patterns
JP7030607B2 (en) 2018-04-27 2022-03-07 ソニーセミコンダクタソリューションズ株式会社 Distance measurement processing device, distance measurement module, distance measurement processing method, and program
US11187804B2 (en) 2018-05-30 2021-11-30 Qualcomm Incorporated Time of flight range finder for a structured light system
US11563873B2 (en) 2020-04-14 2023-01-24 Qualcomm Incorporated Wide-angle 3D sensing

Also Published As

Publication number Publication date
WO2020247046A1 (en) 2020-12-10
BR112021023513A2 (en) 2022-01-18
CN113924507A (en) 2022-01-11
US11561085B2 (en) 2023-01-24
EP3980807A1 (en) 2022-04-13
TW202111349A (en) 2021-03-16
US20200386540A1 (en) 2020-12-10

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