SG11202107101PA - Substrate holder for use in a lithographic apparatus and a device manufacturing method - Google Patents

Substrate holder for use in a lithographic apparatus and a device manufacturing method

Info

Publication number
SG11202107101PA
SG11202107101PA SG11202107101PA SG11202107101PA SG11202107101PA SG 11202107101P A SG11202107101P A SG 11202107101PA SG 11202107101P A SG11202107101P A SG 11202107101PA SG 11202107101P A SG11202107101P A SG 11202107101PA SG 11202107101P A SG11202107101P A SG 11202107101PA
Authority
SG
Singapore
Prior art keywords
substrate holder
device manufacturing
lithographic apparatus
lithographic
manufacturing
Prior art date
Application number
SG11202107101PA
Inventor
Johannes Maassen
Herman Marquart
André Schreuder
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of SG11202107101PA publication Critical patent/SG11202107101PA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/6875Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/707Chucks, e.g. chucking or un-chucking operations or structural details
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70783Handling stress or warp of chucks, masks or workpieces, e.g. to compensate for imaging errors or considerations related to warpage of masks or workpieces due to their own weight
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70825Mounting of individual elements, e.g. mounts, holders or supports

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
SG11202107101PA 2019-01-23 2019-12-13 Substrate holder for use in a lithographic apparatus and a device manufacturing method SG11202107101PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP19153181 2019-01-23
PCT/EP2019/085167 WO2020151878A1 (en) 2019-01-23 2019-12-13 Substrate holder for use in a lithographic apparatus and a device manufacturing method

Publications (1)

Publication Number Publication Date
SG11202107101PA true SG11202107101PA (en) 2021-07-29

Family

ID=65200697

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202107101PA SG11202107101PA (en) 2019-01-23 2019-12-13 Substrate holder for use in a lithographic apparatus and a device manufacturing method

Country Status (9)

Country Link
US (1) US20220115260A1 (en)
EP (1) EP3915142A1 (en)
JP (2) JP7269351B2 (en)
KR (1) KR20210105415A (en)
CN (1) CN113348543A (en)
NL (1) NL2024454A (en)
SG (1) SG11202107101PA (en)
TW (2) TWI752394B (en)
WO (1) WO2020151878A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023241893A1 (en) * 2022-06-15 2023-12-21 Asml Netherlands B.V. Substrate support and lithographic apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60125935T2 (en) * 2000-01-28 2007-08-02 Hitachi Tokyo Electronics Co. Ltd., Ome WAFER CHUCK, EXPOSURE SYSTEM AND METHOD FOR PRODUCING A SEMICONDUCTOR CONSTRUCTION ELEMENT
TWI232357B (en) 2002-11-12 2005-05-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US7133120B2 (en) * 2004-05-04 2006-11-07 Asml Netherlands B.V. Lithographic apparatus, article support member, and method
EP1958025B1 (en) * 2005-12-08 2011-05-18 Molecular Imprints, Inc. Method for expelling gas positioned between a substrate and a mold
WO2015043890A1 (en) * 2013-09-27 2015-04-02 Asml Netherlands B.V. Support table for a lithographic apparatus, lithographic apparatus and device manufacturing method
KR102051532B1 (en) * 2015-06-11 2019-12-03 에이에스엠엘 네델란즈 비.브이. Lithographic Apparatus and Method of Loading Substrate
CN111913368A (en) * 2015-09-28 2020-11-10 Asml荷兰有限公司 Substrate holder, lithographic apparatus and device manufacturing method
NL2017433A (en) * 2015-10-09 2017-04-11 Asml Netherlands Bv Substrate table and lithographic apparatus

Also Published As

Publication number Publication date
JP7269351B2 (en) 2023-05-08
NL2024454A (en) 2020-08-18
WO2020151878A1 (en) 2020-07-30
CN113348543A (en) 2021-09-03
JP2023095890A (en) 2023-07-06
KR20210105415A (en) 2021-08-26
TW202030831A (en) 2020-08-16
US20220115260A1 (en) 2022-04-14
EP3915142A1 (en) 2021-12-01
JP2022517546A (en) 2022-03-09
TW202213622A (en) 2022-04-01
TWI752394B (en) 2022-01-11

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