SG11202100082XA - Systems and methods for a spray measurement apparatus - Google Patents

Systems and methods for a spray measurement apparatus

Info

Publication number
SG11202100082XA
SG11202100082XA SG11202100082XA SG11202100082XA SG11202100082XA SG 11202100082X A SG11202100082X A SG 11202100082XA SG 11202100082X A SG11202100082X A SG 11202100082XA SG 11202100082X A SG11202100082X A SG 11202100082XA SG 11202100082X A SG11202100082X A SG 11202100082XA
Authority
SG
Singapore
Prior art keywords
systems
methods
measurement apparatus
spray measurement
spray
Prior art date
Application number
SG11202100082XA
Inventor
Darren O'reilly
Christian Forgey
Joshua Levinson
Jeff Garbacik
Alexander Trufanov
Robert Kraiger
David Brady
Original Assignee
Oem Group Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oem Group Llc filed Critical Oem Group Llc
Publication of SG11202100082XA publication Critical patent/SG11202100082XA/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B9/00—Spraying apparatus for discharge of liquids or other fluent material, without essentially mixing with gas or vapour
    • B05B9/03—Spraying apparatus for discharge of liquids or other fluent material, without essentially mixing with gas or vapour characterised by means for supplying liquid or other fluent material
    • B05B9/035—Spraying apparatus for discharge of liquids or other fluent material, without essentially mixing with gas or vapour characterised by means for supplying liquid or other fluent material to several spraying apparatus
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
    • B05B12/00—Arrangements for controlling delivery; Arrangements for controlling the spray area
    • B05B12/004—Arrangements for controlling delivery; Arrangements for controlling the spray area comprising sensors for monitoring the delivery, e.g. by displaying the sensed value or generating an alarm
    • B05B12/006—Pressure or flow rate sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F3/00—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow
    • G01F3/36—Measuring the volume flow of fluids or fluent solid material wherein the fluid passes through the meter in successive and more or less isolated quantities, the meter being driven by the flow with stationary measuring chambers having constant volume during measurement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67063—Apparatus for fluid treatment for etching
    • H01L21/67075—Apparatus for fluid treatment for etching for wet etching
    • H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Fluid Mechanics (AREA)
  • Coating Apparatus (AREA)
  • Special Spraying Apparatus (AREA)
  • Details Or Accessories Of Spraying Plant Or Apparatus (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Measuring Volume Flow (AREA)
SG11202100082XA 2018-07-06 2019-07-08 Systems and methods for a spray measurement apparatus SG11202100082XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862694661P 2018-07-06 2018-07-06
PCT/US2019/040864 WO2020010357A1 (en) 2018-07-06 2019-07-08 Systems and methods for a spray measurement apparatus

Publications (1)

Publication Number Publication Date
SG11202100082XA true SG11202100082XA (en) 2021-02-25

Family

ID=69060353

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202100082XA SG11202100082XA (en) 2018-07-06 2019-07-08 Systems and methods for a spray measurement apparatus

Country Status (7)

Country Link
US (2) US10777434B2 (en)
EP (1) EP3817870B1 (en)
JP (1) JP7450844B2 (en)
KR (1) KR102538284B1 (en)
CN (1) CN112638557B (en)
SG (1) SG11202100082XA (en)
WO (1) WO2020010357A1 (en)

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US6418945B1 (en) * 2000-07-07 2002-07-16 Semitool, Inc. Dual cassette centrifugal processor
US6591162B1 (en) * 2000-08-15 2003-07-08 Asyst Technologies, Inc. Smart load port with integrated carrier monitoring and fab-wide carrier management system
US6725868B2 (en) * 2000-11-14 2004-04-27 Tokyo Electron Limited Liquid processing apparatus
JP2004535071A (en) * 2001-07-12 2004-11-18 セミトゥール・インコーポレイテッド Method for removing contaminants from flat media carrier, flat media carrier cleaning device, media carrier cleaning device, and box cleaning system
WO2003008114A1 (en) * 2001-07-16 2003-01-30 Semitool, Inc. Systems and methods for processing workpieces
JP3896265B2 (en) * 2001-09-11 2007-03-22 オリンパス株式会社 Positioning jig and spray polishing apparatus using positioning jig
CN1286645C (en) * 2003-02-28 2006-11-29 精工爱普生株式会社 Liquid droplet discharge device and liquid droplet discharge head discharge abnormality detection and judgment method
US7311004B2 (en) * 2003-03-10 2007-12-25 Capstan Ag Systems, Inc. Flow control and operation monitoring system for individual spray nozzles
US20050284375A1 (en) * 2004-06-24 2005-12-29 Kodjo Leeds Method and apparatus for processing a workpiece
US20060040111A1 (en) * 2004-08-20 2006-02-23 Dolechek Kert L Process chamber and system for thinning a semiconductor workpiece
JP2006076067A (en) * 2004-09-08 2006-03-23 Seiko Epson Corp Droplet ejection device, electro-optical device manufacturing method, electro-optical device, and electronic apparatus
US20060201541A1 (en) * 2005-03-11 2006-09-14 Semiconductor Energy Laboratory Co., Ltd. Cleaning-drying apparatus and cleaning-drying method
KR100696378B1 (en) * 2005-04-13 2007-03-19 삼성전자주식회사 Apparatus and method for cleaning a semiconductor substrate
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KR100766443B1 (en) * 2006-05-23 2007-10-11 주식회사 케이씨텍 Apparatus and method for measuring the uniformity in the discharge direction of the slit nozzle
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Also Published As

Publication number Publication date
EP3817870A1 (en) 2021-05-12
KR20210050515A (en) 2021-05-07
CN112638557A (en) 2021-04-09
US11664251B2 (en) 2023-05-30
EP3817870A4 (en) 2022-04-13
JP2021529092A (en) 2021-10-28
CN112638557B (en) 2023-02-03
KR102538284B1 (en) 2023-05-30
US20200013650A1 (en) 2020-01-09
US20200258763A1 (en) 2020-08-13
JP7450844B2 (en) 2024-03-18
WO2020010357A1 (en) 2020-01-09
EP3817870B1 (en) 2024-04-17
US10777434B2 (en) 2020-09-15

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