SG11202004959VA - Electrical connection socket - Google Patents

Electrical connection socket

Info

Publication number
SG11202004959VA
SG11202004959VA SG11202004959VA SG11202004959VA SG11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA SG 11202004959V A SG11202004959V A SG 11202004959VA
Authority
SG
Singapore
Prior art keywords
electrical connection
connection socket
socket
electrical
connection
Prior art date
Application number
SG11202004959VA
Inventor
Kazutaka Koshiishi
Keiichi Narumi
Original Assignee
Enplas Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enplas Corp filed Critical Enplas Corp
Publication of SG11202004959VA publication Critical patent/SG11202004959VA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/716—Coupling device provided on the PCB
    • H01R12/718—Contact members provided on the PCB without an insulating housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/50—Fixed connections
    • H01R12/51—Fixed connections for rigid printed circuits or like structures
    • H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
    • H01R12/57—Fixed connections for rigid printed circuits or like structures characterised by the terminals surface mounting terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/193—Means for increasing contact pressure at the end of engagement of coupling part, e.g. zero insertion force or no friction

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Connecting Device With Holders (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Measuring Leads Or Probes (AREA)
SG11202004959VA 2017-11-30 2018-06-29 Electrical connection socket SG11202004959VA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762592670P 2017-11-30 2017-11-30
US201762592668P 2017-11-30 2017-11-30
PCT/JP2018/024823 WO2019106871A1 (en) 2017-11-30 2018-06-29 Electrical connection socket

Publications (1)

Publication Number Publication Date
SG11202004959VA true SG11202004959VA (en) 2020-06-29

Family

ID=66664045

Family Applications (2)

Application Number Title Priority Date Filing Date
SG11202004959VA SG11202004959VA (en) 2017-11-30 2018-06-29 Electrical connection socket
SG11202004961XA SG11202004961XA (en) 2017-11-30 2018-06-29 Electrical connection socket

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG11202004961XA SG11202004961XA (en) 2017-11-30 2018-06-29 Electrical connection socket

Country Status (5)

Country Link
US (2) US11329411B2 (en)
JP (2) JP7169989B2 (en)
CN (2) CN111316111B (en)
SG (2) SG11202004959VA (en)
WO (2) WO2019106872A1 (en)

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Publication number Priority date Publication date Assignee Title
US9341671B2 (en) * 2013-03-14 2016-05-17 Taiwan Semiconductor Manufacturing Company, Ltd. Testing holders for chip unit and die package
SG11202002099QA (en) * 2017-09-08 2020-04-29 Enplas Corp Electric connection socket
JP7169989B2 (en) * 2017-11-30 2022-11-11 株式会社エンプラス Socket for electrical connection
US11518005B2 (en) * 2017-12-12 2022-12-06 Bae Systems Information And Electronic Systems Integration Inc. Apparatus for engaging a guide pin
KR102455150B1 (en) * 2020-02-10 2022-10-18 주식회사 아이에스시 Test socket for use in testing device under test
US11539167B2 (en) 2020-09-17 2022-12-27 Carlisle Interconnect Technologies, Inc. Adjustable push on connector/adaptor
US11293976B1 (en) * 2020-09-25 2022-04-05 Essai, Inc. Integrated circuit device test tooling with dual angle cavities
US11502440B2 (en) * 2020-10-23 2022-11-15 Carlisle Interconnect Technologies, Inc. Multiport connector interface system

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0687874U (en) * 1993-05-28 1994-12-22 安藤電気株式会社 Inspection jig for connection ring for IC tester
JP3634074B2 (en) * 1996-06-28 2005-03-30 日本発条株式会社 Conductive contact
JP2004325306A (en) * 2003-04-25 2004-11-18 Yokowo Co Ltd Coaxial probe for inspection, and inspection unit using the same
JP4242199B2 (en) * 2003-04-25 2009-03-18 株式会社ヨコオ IC socket
JP4535828B2 (en) * 2004-09-30 2010-09-01 株式会社ヨコオ Inspection unit manufacturing method
TWM268766U (en) * 2004-10-15 2005-06-21 Hon Hai Prec Ind Co Ltd Electrical connector
JP4438601B2 (en) * 2004-10-28 2010-03-24 株式会社ヨコオ Inspection unit manufacturing method
JP2006210293A (en) * 2005-01-31 2006-08-10 Toshiba Corp Socket for circuit component and its mounting method
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
US7220134B2 (en) * 2005-02-24 2007-05-22 Advanced Interconnections Corporation Low profile LGA socket assembly
JP2007198835A (en) 2006-01-25 2007-08-09 Murata Mfg Co Ltd High-frequency characteristic measuring tool
US7845955B2 (en) * 2006-04-28 2010-12-07 Nhk Spring Co., Ltd. Conductive contact holder
JP2008059810A (en) * 2006-08-29 2008-03-13 Japan Aviation Electronics Industry Ltd Connector
US7950927B2 (en) * 2006-12-15 2011-05-31 Nhk Spring Co., Ltd. Conductive contact holder and conductive contact unit
TWM344664U (en) * 2008-04-07 2008-11-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP2011075313A (en) * 2009-09-29 2011-04-14 Three M Innovative Properties Co Ic device testing socket
US8808010B2 (en) * 2011-06-06 2014-08-19 Interconnect Devices, Inc. Insulated metal socket
US8758066B2 (en) * 2012-02-03 2014-06-24 Interconnect Devices, Inc. Electrical connector with insulation member
JP6475479B2 (en) 2014-11-27 2019-02-27 株式会社ヨコオ Inspection unit
JP6404104B2 (en) * 2014-12-11 2018-10-10 株式会社エンプラス Socket for electrical parts
US20160216294A1 (en) 2015-01-27 2016-07-28 Kurt F. Kaashoek Electrical Spring Probe with Stabilization
US9478881B2 (en) * 2015-03-09 2016-10-25 Intel Corporation Snap connector for socket assembly and associated techniques and configurations
US20170059611A1 (en) * 2015-09-02 2017-03-02 Oracle International Corporation Coaxial integrated circuit test socket
JP6601138B2 (en) * 2015-10-16 2019-11-06 山一電機株式会社 IC socket
JP7169989B2 (en) * 2017-11-30 2022-11-11 株式会社エンプラス Socket for electrical connection

Also Published As

Publication number Publication date
JP7153670B2 (en) 2022-10-14
WO2019106871A1 (en) 2019-06-06
JPWO2019106872A1 (en) 2020-11-19
SG11202004961XA (en) 2020-06-29
WO2019106872A1 (en) 2019-06-06
CN111316111A (en) 2020-06-19
JPWO2019106871A1 (en) 2020-12-03
JP7169989B2 (en) 2022-11-11
CN111316112B (en) 2022-08-09
US11189945B2 (en) 2021-11-30
US20210190820A1 (en) 2021-06-24
US20200366018A1 (en) 2020-11-19
CN111316112A (en) 2020-06-19
CN111316111B (en) 2022-08-05
US11329411B2 (en) 2022-05-10

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