SG11202002819RA - Method of manufacturing high-defined pattern and method of manufacturing display device using the same - Google Patents

Method of manufacturing high-defined pattern and method of manufacturing display device using the same

Info

Publication number
SG11202002819RA
SG11202002819RA SG11202002819RA SG11202002819RA SG11202002819RA SG 11202002819R A SG11202002819R A SG 11202002819RA SG 11202002819R A SG11202002819R A SG 11202002819RA SG 11202002819R A SG11202002819R A SG 11202002819RA SG 11202002819R A SG11202002819R A SG 11202002819RA
Authority
SG
Singapore
Prior art keywords
manufacturing
display device
same
defined pattern
manufacturing high
Prior art date
Application number
SG11202002819RA
Inventor
Hirokazu Ikeda
Toshiaki Nonaka
Yoshisuke Toyama
Takahide Suzuki
Original Assignee
Merck Patent Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merck Patent Gmbh filed Critical Merck Patent Gmbh
Publication of SG11202002819RA publication Critical patent/SG11202002819RA/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • G03F7/0236Condensation products of carbonyl compounds and phenolic compounds, e.g. novolak resins
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D161/00Coating compositions based on condensation polymers of aldehydes or ketones; Coating compositions based on derivatives of such polymers
    • C09D161/04Condensation polymers of aldehydes or ketones with phenols only
    • C09D161/06Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking
    • G03F7/405Treatment with inorganic or organometallic reagents after imagewise removal
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
SG11202002819RA 2017-10-20 2018-10-17 Method of manufacturing high-defined pattern and method of manufacturing display device using the same SG11202002819RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017203846A JP2019078812A (en) 2017-10-20 2017-10-20 Method for manufacturing high definition pattern and method for manufacturing display element using the same
PCT/EP2018/078356 WO2019076957A1 (en) 2017-10-20 2018-10-17 Method of manufacturing high-defined pattern and method of manufacturing display device using the same

Publications (1)

Publication Number Publication Date
SG11202002819RA true SG11202002819RA (en) 2020-05-28

Family

ID=63965653

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202002819RA SG11202002819RA (en) 2017-10-20 2018-10-17 Method of manufacturing high-defined pattern and method of manufacturing display device using the same

Country Status (7)

Country Link
US (1) US20210191263A1 (en)
JP (3) JP2019078812A (en)
KR (2) KR102607855B1 (en)
CN (1) CN111295736A (en)
SG (1) SG11202002819RA (en)
TW (1) TWI820047B (en)
WO (1) WO2019076957A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022126150A (en) 2021-02-18 2022-08-30 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング Resist film thickening composition and method for manufacturing thickened pattern
CN113204181B (en) * 2021-04-25 2023-09-12 华虹半导体(无锡)有限公司 Lithographic method

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US204399A (en) 1878-05-28 Improvement in adjustable axle-nuts
JP3340493B2 (en) * 1993-02-26 2002-11-05 沖電気工業株式会社 Pattern forming method, method for forming photomask for phase shift method
JP3071401B2 (en) 1996-07-05 2000-07-31 三菱電機株式会社 Fine pattern forming material, method of manufacturing semiconductor device using the same, and semiconductor device
JP3189773B2 (en) * 1998-01-09 2001-07-16 三菱電機株式会社 Method of forming resist pattern, method of manufacturing semiconductor device using the same, and semiconductor device
JP2001093816A (en) * 1999-09-24 2001-04-06 Clariant (Japan) Kk Method of forming resist pattern with improved dry- etching strength
JP2001109165A (en) * 1999-10-05 2001-04-20 Clariant (Japan) Kk Performance forming method
JP3348715B2 (en) * 2000-02-25 2002-11-20 ティーディーケイ株式会社 Resist pattern forming method, frame plating method, and method of manufacturing thin-film magnetic head
JP2001312060A (en) * 2000-05-01 2001-11-09 Tokyo Ohka Kogyo Co Ltd Positive type photoresist composition, board with photosensitive film and resist pattern forming method
TW536734B (en) * 2000-07-31 2003-06-11 Clariant Int Ltd Process for manufacturing a microelectronic device
JP2003195496A (en) 2001-12-26 2003-07-09 Tokyo Ohka Kogyo Co Ltd Positive photoresist composition for manufacture of liquid crystal display device and method for forming resist pattern
JP3850767B2 (en) * 2002-07-25 2006-11-29 富士通株式会社 Resist pattern thickening material, resist pattern and manufacturing method thereof, and semiconductor device and manufacturing method thereof
JP4053402B2 (en) * 2002-10-23 2008-02-27 東京応化工業株式会社 Positive photoresist composition for LCD production and method for forming resist pattern
JP2005221515A (en) * 2004-01-08 2005-08-18 Tokyo Ohka Kogyo Co Ltd Positive photoresist composition for production of system lcd and resist pattern forming method
JP2007108483A (en) * 2005-10-14 2007-04-26 Sharp Corp Resist material and resist pattern forming method
KR20100006952A (en) * 2008-07-11 2010-01-22 삼성전자주식회사 Photoresist composition, method of forming a metal pattern using the same, and method of manufacturing a display substrate
TWI476816B (en) * 2009-06-26 2015-03-11 羅門哈斯電子材料有限公司 Self-aligned spacer multiple patterning methods
CN101963754B (en) * 2009-06-26 2012-12-19 罗门哈斯电子材料有限公司 Methods of forming electronic device
JP6482120B2 (en) * 2015-03-31 2019-03-13 デクセリアルズ株式会社 Master production method, optical body production method, optical member production method, and display device production method

Also Published As

Publication number Publication date
TW201922825A (en) 2019-06-16
WO2019076957A1 (en) 2019-04-25
JP7280869B2 (en) 2023-05-24
US20210191263A1 (en) 2021-06-24
CN111295736A (en) 2020-06-16
TWI820047B (en) 2023-11-01
JP2019078812A (en) 2019-05-23
KR102607855B1 (en) 2023-11-30
JP2020537759A (en) 2020-12-24
KR20200066370A (en) 2020-06-09
KR20230167142A (en) 2023-12-07
JP2023106469A (en) 2023-08-01

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