SG11202001351WA - Contact lens inspection system and method - Google Patents

Contact lens inspection system and method

Info

Publication number
SG11202001351WA
SG11202001351WA SG11202001351WA SG11202001351WA SG11202001351WA SG 11202001351W A SG11202001351W A SG 11202001351WA SG 11202001351W A SG11202001351W A SG 11202001351WA SG 11202001351W A SG11202001351W A SG 11202001351WA SG 11202001351W A SG11202001351W A SG 11202001351WA
Authority
SG
Singapore
Prior art keywords
contact lens
inspection system
lens inspection
contact
lens
Prior art date
Application number
SG11202001351WA
Inventor
Sarah Unterkofler
Matthias Schwab
Original Assignee
Alcon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcon Inc filed Critical Alcon Inc
Publication of SG11202001351WA publication Critical patent/SG11202001351WA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278Detecting defects of the object to be tested, e.g. scratches or dust
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0075Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for altering, e.g. increasing, the depth of field or depth of focus
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • G06T7/55Depth or shape recovery from multiple images
    • G06T7/557Depth or shape recovery from multiple images from light fields, e.g. from plenoptic cameras
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/95Computational photography systems, e.g. light-field imaging systems
    • H04N23/957Light-field or plenoptic cameras or camera modules
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/222Studio circuitry; Studio devices; Studio equipment
    • H04N5/262Studio circuits, e.g. for mixing, switching-over, change of character of image, other special effects ; Cameras specially adapted for the electronic generation of special effects
    • H04N5/265Mixing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583Lenses
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10004Still image; Photographic image
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10052Images from lightfield camera
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20212Image combination
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30004Biomedical image processing
    • G06T2207/30041Eye; Retina; Ophthalmic

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computing Systems (AREA)
  • Studio Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
SG11202001351WA 2017-09-07 2018-09-06 Contact lens inspection system and method SG11202001351WA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762555357P 2017-09-07 2017-09-07
PCT/IB2018/056812 WO2019049065A1 (en) 2017-09-07 2018-09-06 Contact lens inspection system and method

Publications (1)

Publication Number Publication Date
SG11202001351WA true SG11202001351WA (en) 2020-03-30

Family

ID=63722710

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202001351WA SG11202001351WA (en) 2017-09-07 2018-09-06 Contact lens inspection system and method

Country Status (5)

Country Link
US (1) US10620137B2 (en)
EP (1) EP3679415B1 (en)
MY (1) MY202125A (en)
SG (1) SG11202001351WA (en)
WO (1) WO2019049065A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10591747B2 (en) * 2017-09-07 2020-03-17 Alcon Inc. Contact lens inspection method and system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5500732A (en) 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
US7256881B2 (en) * 2002-02-15 2007-08-14 Coopervision, Inc. Systems and methods for inspection of ophthalmic lenses
US7838814B2 (en) * 2007-05-23 2010-11-23 Xerox Corporation Plenoptic system for recording images from sheets
US7990531B2 (en) * 2008-06-05 2011-08-02 Coopervision International Holding Company, Lp Multi-imaging automated inspection methods and systems for wet ophthalmic lenses
ATE551841T1 (en) * 2009-04-22 2012-04-15 Raytrix Gmbh DIGITAL IMAGING METHOD FOR SYNTHESIZING AN IMAGE USING DATA RECORDED BY A PLENOPTIC CAMERA
SG10201702436TA (en) * 2012-09-28 2017-04-27 Novartis Ag Method for automated inline determination of the refractive power of an ophthalmic lens
US20140181630A1 (en) * 2012-12-21 2014-06-26 Vidinoti Sa Method and apparatus for adding annotations to an image
KR102166189B1 (en) * 2013-10-08 2020-10-15 이미지 비전 피티이. 리미티드 System and method for inspection of wet ophthalmic lens
CN106537110A (en) * 2014-05-15 2017-03-22 伊麦视觉私人有限公司 System and method for inspecting opthalmic lenses
DE102015201823B4 (en) * 2015-02-03 2020-11-05 Dioptic Gmbh Device and method for the automated classification of the quality of workpieces
US9811729B2 (en) * 2015-05-12 2017-11-07 Ut-Battelle, Llc Iris recognition via plenoptic imaging

Also Published As

Publication number Publication date
MY202125A (en) 2024-04-04
US20190072499A1 (en) 2019-03-07
EP3679415B1 (en) 2023-12-27
WO2019049065A1 (en) 2019-03-14
US10620137B2 (en) 2020-04-14
EP3679415A1 (en) 2020-07-15

Similar Documents

Publication Publication Date Title
HK1250414A1 (en) Inspection system and inspection device
GB2571045B (en) Facility inspection system and facility inspection method
IL266393A (en) Method and system for multiple f-number lens
PL3364176T3 (en) Multi-view backscatter inspection system and multi-view backscatter inspection method
HUE050311T2 (en) Contact lens inspection method and system
PL3553705T3 (en) Service processing method and device
EP3620777A4 (en) Inspection system and inspection method
ZA201903257B (en) Belt inspection system and method
SG10201801793YA (en) Contact lens inspection system and method
EP3715817A4 (en) Optical inspection device and optical inspection method
GB201707239D0 (en) Optical system and method
EP3327402A4 (en) Inspection system and inspection method
EP3722745C0 (en) Shape inspection device and shape inspection method
HK1248321A1 (en) Flat wedge-shaped lens and image processing method
EP3565267A4 (en) Automatic inspection system and automatic inspection method
EP3764320C0 (en) Substrate inspection method and system
PL3505975T3 (en) Radiation inspection system and radiation inspection method
GB201620819D0 (en) Image processing system and method
EP3690427A4 (en) Inspection device and inspection method
EP3611666A4 (en) Inspection method and inspection device
IL273294A (en) Metrology method and system
GB2557594B (en) Image processing system and method
GB2570377B (en) Defect inspection method and defect inspection system
IL261652B (en) Image comparison system and method
EP3598111A4 (en) Inspection device and inspection method