SG11201912467XA - Lower electrode mechanism and reaction chamber - Google Patents

Lower electrode mechanism and reaction chamber

Info

Publication number
SG11201912467XA
SG11201912467XA SG11201912467XA SG11201912467XA SG11201912467XA SG 11201912467X A SG11201912467X A SG 11201912467XA SG 11201912467X A SG11201912467X A SG 11201912467XA SG 11201912467X A SG11201912467X A SG 11201912467XA SG 11201912467X A SG11201912467X A SG 11201912467XA
Authority
SG
Singapore
Prior art keywords
lower electrode
reaction chamber
electrode mechanism
chamber
reaction
Prior art date
Application number
SG11201912467XA
Inventor
Yahui Huang
Gang Wei
Yicheng Li
Xingfei Mao
Original Assignee
Beijing Naura Microelectronics Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Naura Microelectronics Equipment Co Ltd filed Critical Beijing Naura Microelectronics Equipment Co Ltd
Publication of SG11201912467XA publication Critical patent/SG11201912467XA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32568Relative arrangement or disposition of electrodes; moving means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • H01J37/32651Shields, e.g. dark space shields, Faraday shields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/026Shields
    • H01J2237/0266Shields electromagnetic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/334Etching

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Power Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Chemical Vapour Deposition (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
SG11201912467XA 2017-06-19 2017-11-15 Lower electrode mechanism and reaction chamber SG11201912467XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201710464985.7A CN107093545B (en) 2017-06-19 2017-06-19 The bottom electrode mechanism and reaction chamber of reaction chamber
PCT/CN2017/111125 WO2018233192A1 (en) 2017-06-19 2017-11-15 Lower electrode mechanism and reaction chamber

Publications (1)

Publication Number Publication Date
SG11201912467XA true SG11201912467XA (en) 2020-01-30

Family

ID=59639755

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201912467XA SG11201912467XA (en) 2017-06-19 2017-11-15 Lower electrode mechanism and reaction chamber

Country Status (6)

Country Link
US (1) US11410833B2 (en)
JP (1) JP6914374B2 (en)
KR (1) KR102166661B1 (en)
CN (1) CN107093545B (en)
SG (1) SG11201912467XA (en)
WO (1) WO2018233192A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107093545B (en) 2017-06-19 2019-05-31 北京北方华创微电子装备有限公司 The bottom electrode mechanism and reaction chamber of reaction chamber
CN109994356B (en) * 2017-12-29 2022-03-22 北京北方华创微电子装备有限公司 Reaction chamber and semiconductor processing equipment
CN108346554A (en) * 2018-04-24 2018-07-31 西南林业大学 A kind of plasma etching and depositing device and method
CN112259429B (en) * 2020-09-30 2024-06-21 北京北方华创微电子装备有限公司 Semiconductor process equipment
CN113421812B (en) * 2021-06-23 2024-03-26 北京北方华创微电子装备有限公司 Semiconductor process equipment and bearing device thereof
CN114121584B (en) * 2021-11-22 2024-04-16 北京北方华创微电子装备有限公司 Bottom electrode assembly, semiconductor processing equipment and bottom electrode condensation prevention method
CN114141600B (en) * 2021-11-29 2024-06-21 北京北方华创微电子装备有限公司 Semiconductor process equipment and temperature control method of lower electrode chamber
CN115692263B (en) * 2022-10-31 2023-06-16 北京北方华创微电子装备有限公司 Semiconductor process chamber and semiconductor process equipment
CN115881617B (en) * 2022-12-25 2023-10-24 北京屹唐半导体科技股份有限公司 Slide holder and reaction chamber

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TW283250B (en) * 1995-07-10 1996-08-11 Watkins Johnson Co Plasma enhanced chemical processing reactor and method
US6616767B2 (en) * 1997-02-12 2003-09-09 Applied Materials, Inc. High temperature ceramic heater assembly with RF capability
KR100262274B1 (en) * 1997-11-11 2000-07-15 전주범 Grid assembly for use in a micro-generator of a microwave oven
US6395095B1 (en) * 1999-06-15 2002-05-28 Tokyo Electron Limited Process apparatus and method for improved plasma processing of a substrate
KR100629065B1 (en) * 1999-09-14 2006-09-27 주식회사 엘지생활건강 Cosmetic compositions
JP4660926B2 (en) 2001-01-09 2011-03-30 東京エレクトロン株式会社 Single wafer processing equipment
US20050022736A1 (en) * 2003-07-29 2005-02-03 Lam Research Inc., A Delaware Corporation Method for balancing return currents in plasma processing apparatus
US20050066902A1 (en) * 2003-09-26 2005-03-31 Tokyo Electron Limited Method and apparatus for plasma processing
CN100499958C (en) * 2005-12-09 2009-06-10 北京北方微电子基地设备工艺研究中心有限责任公司 Signal transmitting device for electrostatic cartridge
JP2007258585A (en) * 2006-03-24 2007-10-04 Tokyo Electron Ltd Substrate placing mechanism and substrate processing apparatus
JP2011222931A (en) * 2009-12-28 2011-11-04 Tokyo Electron Ltd Mounting table structure and treatment apparatus
KR101892911B1 (en) * 2010-08-06 2018-08-29 어플라이드 머티어리얼스, 인코포레이티드 Electrostatic chuck and methods of use thereof
US10586686B2 (en) * 2011-11-22 2020-03-10 Law Research Corporation Peripheral RF feed and symmetric RF return for symmetric RF delivery
CN104167343B (en) * 2013-05-17 2016-07-13 中微半导体设备(上海)有限公司 Plasma processing apparatus and radio-frequency shielding fence thereof
CN103337444A (en) 2013-06-08 2013-10-02 天通吉成机器技术有限公司 Reaction chamber of dry plasma etcher
JP6043968B2 (en) 2013-10-30 2016-12-14 パナソニックIpマネジメント株式会社 Plasma processing method and electronic device manufacturing method
CN105632967B (en) 2014-10-28 2018-08-24 北京北方华创微电子装备有限公司 Semiconductor processing equipment
CN106158717B (en) * 2015-03-31 2019-08-23 北京北方华创微电子装备有限公司 Mechanical chuck and semiconductor processing equipment
CN106816397A (en) * 2015-12-01 2017-06-09 北京北方微电子基地设备工艺研究中心有限责任公司 Bottom electrode assembly and semiconductor processing equipment
CN207074639U (en) * 2017-06-19 2018-03-06 北京北方华创微电子装备有限公司 The bottom electrode mechanism and reaction chamber of reaction chamber
CN107093545B (en) 2017-06-19 2019-05-31 北京北方华创微电子装备有限公司 The bottom electrode mechanism and reaction chamber of reaction chamber

Also Published As

Publication number Publication date
US20200321198A1 (en) 2020-10-08
CN107093545A (en) 2017-08-25
JP2020524408A (en) 2020-08-13
CN107093545B (en) 2019-05-31
KR102166661B1 (en) 2020-10-16
KR20190126382A (en) 2019-11-11
JP6914374B2 (en) 2021-08-04
US11410833B2 (en) 2022-08-09
WO2018233192A1 (en) 2018-12-27

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