SG11201701822RA - Data-driven testing framework - Google Patents

Data-driven testing framework

Info

Publication number
SG11201701822RA
SG11201701822RA SG11201701822RA SG11201701822RA SG11201701822RA SG 11201701822R A SG11201701822R A SG 11201701822RA SG 11201701822R A SG11201701822R A SG 11201701822RA SG 11201701822R A SG11201701822R A SG 11201701822RA SG 11201701822R A SG11201701822R A SG 11201701822RA
Authority
SG
Singapore
Prior art keywords
data
testing framework
driven testing
driven
framework
Prior art date
Application number
SG11201701822RA
Inventor
Philippe Printz
Marshall Alan Isman
Original Assignee
Ab Initio Technology Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ab Initio Technology Llc filed Critical Ab Initio Technology Llc
Publication of SG11201701822RA publication Critical patent/SG11201701822RA/en

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3692Test management for test results analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3684Test management for test design, e.g. generating new test cases
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/50Monitoring users, programs or devices to maintain the integrity of platforms, e.g. of processors, firmware or operating systems
    • G06F21/57Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/30Monitoring
    • G06F11/34Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3466Performance evaluation by tracing or monitoring
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3636Software debugging by tracing the execution of the program
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3676Test management for coverage analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2221/00Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F2221/03Indexing scheme relating to G06F21/50, monitoring users, programs or devices to maintain the integrity of platforms
    • G06F2221/033Test or assess software

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Security & Cryptography (AREA)
  • Software Systems (AREA)
  • Debugging And Monitoring (AREA)
SG11201701822RA 2014-09-08 2015-09-04 Data-driven testing framework SG11201701822RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462047256P 2014-09-08 2014-09-08
PCT/US2015/048528 WO2016040154A1 (en) 2014-09-08 2015-09-04 Data-driven testing framework

Publications (1)

Publication Number Publication Date
SG11201701822RA true SG11201701822RA (en) 2017-04-27

Family

ID=54207705

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201701822RA SG11201701822RA (en) 2014-09-08 2015-09-04 Data-driven testing framework

Country Status (9)

Country Link
US (1) US10007598B2 (en)
EP (1) EP3191963B1 (en)
JP (1) JP6723989B2 (en)
KR (1) KR102356771B1 (en)
CN (1) CN107077413B (en)
AU (1) AU2015315522B2 (en)
CA (1) CA2960417C (en)
SG (1) SG11201701822RA (en)
WO (1) WO2016040154A1 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9710367B1 (en) * 2015-10-30 2017-07-18 EMC IP Holding Company LLC Method and system for dynamic test case creation and documentation to the test repository through automation
CN105389257B (en) * 2015-11-11 2017-12-12 中国建设银行股份有限公司 A kind of systematic parameter processing method, apparatus and system
US10642720B2 (en) * 2016-09-15 2020-05-05 Talend, Inc. Test case generator built into data-integration workflow editor
US20180293272A1 (en) * 2017-04-05 2018-10-11 Futurewei Technologies, Inc. Statistics-Based Multidimensional Data Cloning
CN107315681A (en) * 2017-06-09 2017-11-03 上海爱优威软件开发有限公司 Application program self-starting test system, medium and method
US10514898B2 (en) * 2017-08-10 2019-12-24 Raju Pandey Method and system to develop, deploy, test, and manage platform-independent software
US10417115B1 (en) * 2018-04-27 2019-09-17 Amdocs Development Limited System, method, and computer program for performing production driven testing
US11797427B2 (en) * 2019-05-22 2023-10-24 Oracle International Corporation Automatic generation of unit tests while running an application
US11055213B2 (en) 2019-11-06 2021-07-06 International Business Machines Corporation Facilitating localization of code defect
CN110928788B (en) * 2019-11-22 2023-09-19 泰康保险集团股份有限公司 Service verification method and device
CN111352846B (en) * 2020-03-06 2024-03-19 深圳前海微众银行股份有限公司 Method, device, equipment and storage medium for manufacturing number of test system
US11321306B2 (en) 2020-05-28 2022-05-03 Bank Of America Corporation Cloning of sanitized data records for use in data testing environments
CN112115010B (en) * 2020-08-27 2024-05-10 深圳市紫金支点技术股份有限公司 Simulation test method of self-service equipment, intelligent terminal and storage medium
CN113342649B (en) * 2021-05-31 2023-11-14 上海创景信息科技有限公司 Method, medium and equipment for realizing unit test based on real target machine
CN114860575B (en) * 2022-03-31 2023-10-03 中国电信股份有限公司 Test data generation method and device, storage medium and electronic equipment
KR20240135976A (en) 2023-03-06 2024-09-13 한국수력원자력 주식회사 Non-safety control diagnostic device

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7117219B1 (en) * 2000-05-05 2006-10-03 Group 1 Software, Inc. Method and apparatus for creating a lineage of a data field in a data flow system
US7065677B1 (en) * 2003-04-10 2006-06-20 Microsoft Corporation Method for testing operating system components
US7366740B2 (en) * 2004-05-03 2008-04-29 Microsoft Corporation Systems and methods for automatic maintenance and repair of enitites in a data model
US7363616B2 (en) * 2004-09-15 2008-04-22 Microsoft Corporation Systems and methods for prioritized data-driven software testing
JP4575811B2 (en) * 2005-03-10 2010-11-04 株式会社野村総合研究所 Test data generation apparatus, method, and program for message processing system
WO2007072238A1 (en) * 2005-12-23 2007-06-28 International Business Machines Corporation Method and system for biometric authentication
JP2007304778A (en) * 2006-05-10 2007-11-22 Nec System Technologies Ltd Test method for program, program, test device and application development system
CN100547562C (en) 2006-10-18 2009-10-07 国际商业机器公司 The method and system of the unit testing use-case of problem when generation can be reproduced operation automatically
JP2008226056A (en) * 2007-03-14 2008-09-25 Hitachi Information Systems Ltd Test data generating system
US8069129B2 (en) 2007-04-10 2011-11-29 Ab Initio Technology Llc Editing and compiling business rules
US8126831B2 (en) * 2008-01-24 2012-02-28 Nec Laboratories America, Inc. System and method for dynamically inferring data preconditions over predicates by tree learning
JP2009205239A (en) * 2008-02-26 2009-09-10 Hitachi Ltd Software verification system
US9189233B2 (en) * 2008-11-24 2015-11-17 Intel Corporation Systems, apparatuses, and methods for a hardware and software system to automatically decompose a program to multiple parallel threads
US20100205153A1 (en) * 2009-02-12 2010-08-12 Accenture Global Services Gmbh Data System Architecture to Analyze Distributed Data Sets
CN102227716B (en) * 2009-03-30 2014-01-01 株式会社野村综合研究所 Operation verification device, operation verification method, and operation verification system
JP2010250669A (en) * 2009-04-17 2010-11-04 Denso Corp Test case generation device, object inspection device, and program
US10102398B2 (en) 2009-06-01 2018-10-16 Ab Initio Technology Llc Generating obfuscated data
EP2440882B1 (en) 2009-06-10 2020-02-12 Ab Initio Technology LLC Generating test data
US8423965B2 (en) * 2009-06-23 2013-04-16 Microsoft Corporation Tracing of data flow
US8745592B1 (en) 2010-01-08 2014-06-03 Google Inc. Input selection for automatic test suite generation
US8510715B1 (en) 2010-01-26 2013-08-13 Google Inc. Coverage analysis using sub-instruction profiling
KR101781416B1 (en) 2010-06-22 2017-09-25 아브 이니티오 테크놀로지 엘엘시 Processing related datasets
US8682910B2 (en) * 2010-08-03 2014-03-25 Accenture Global Services Limited Database anonymization for use in testing database-centric applications
CN103348598B (en) * 2011-01-28 2017-07-14 起元科技有限公司 Generate data pattern information
EP2676202A4 (en) * 2011-02-18 2018-01-17 EntIT Software LLC Generating test data
JP5651050B2 (en) * 2011-03-08 2015-01-07 株式会社富士通マーケティング Data generation apparatus and data generation program
US9026548B2 (en) 2011-06-27 2015-05-05 Tata Consultancy Services Limited Database sampling
US9886369B2 (en) * 2011-11-13 2018-02-06 International Business Machines Corporation Dynamic data fabrication for database applications
JP5703195B2 (en) * 2011-11-15 2015-04-15 株式会社日本総合研究所 Differential comparison test system and test method for new and old versions of program
EP2597573B1 (en) * 2011-11-28 2018-08-29 Tata Consultancy Services Limited Test data generation
US8527813B2 (en) 2011-12-19 2013-09-03 Siemens Aktiengesellschaft Dynamic reprioritization of test cases during test execution
CN103176973B (en) * 2011-12-20 2016-04-20 国际商业机器公司 For generating the system and method for the test job load of database
US9659042B2 (en) * 2012-06-12 2017-05-23 Accenture Global Services Limited Data lineage tracking
US8996915B2 (en) * 2012-06-29 2015-03-31 International Business Machines Corporation Test data generation and scale up for database testing
CN104380663A (en) * 2012-06-29 2015-02-25 惠普发展公司,有限责任合伙企业 Rule-based automated test data generation
US9218269B2 (en) * 2012-09-07 2015-12-22 Red Hat Israel, Ltd. Testing multiple target platforms
US9892026B2 (en) * 2013-02-01 2018-02-13 Ab Initio Technology Llc Data records selection
EP2779044A1 (en) * 2013-03-14 2014-09-17 Tata Consultancy Services Limited System and method to provide management of test data at various lifecycle stages
US9576036B2 (en) * 2013-03-15 2017-02-21 International Business Machines Corporation Self-analyzing data processing job to determine data quality issues
IN2013MU01495A (en) * 2013-04-22 2015-04-17 Tata Consultancy Services Ltd
JP6882892B2 (en) 2013-12-18 2021-06-02 アビニシオ テクノロジー エルエルシー Data generation
US9336100B2 (en) * 2013-12-27 2016-05-10 International Business Machines Corporation Efficient debugging of memory miscompare failures in post-silicon validation
CN104077227B (en) * 2014-07-08 2017-01-04 大连海事大学 The evaluation system of a kind of program source code based on B/S framework and method
GB2529842A (en) * 2014-09-03 2016-03-09 Ibm Generating coverage metrics for black-box testing

Also Published As

Publication number Publication date
JP6723989B2 (en) 2020-07-15
AU2015315522A1 (en) 2017-04-20
EP3191963B1 (en) 2023-11-22
AU2015315522B2 (en) 2019-08-29
KR102356771B1 (en) 2022-01-27
CN107077413B (en) 2021-01-15
EP3191963A1 (en) 2017-07-19
CA2960417A1 (en) 2016-03-17
CA2960417C (en) 2023-12-19
US10007598B2 (en) 2018-06-26
WO2016040154A1 (en) 2016-03-17
KR20170052668A (en) 2017-05-12
JP2017531855A (en) 2017-10-26
US20160070641A1 (en) 2016-03-10
CN107077413A (en) 2017-08-18

Similar Documents

Publication Publication Date Title
SG11201701822RA (en) Data-driven testing framework
PT3237873T (en) Fatigue testing
GB2524479B (en) Testing rig
GB201414257D0 (en) Test selection
GB2525387B (en) Over-the-air test
SG11201604709SA (en) Load testing apparatus
GB201615417D0 (en) Fluoometric analyzer
SG11201703191TA (en) Application testing
DK3098580T3 (en) Combination weighing apparatus
GB201408463D0 (en) Test blade
DK3211403T3 (en) Exterior inspection apparatus
TWI560454B (en) Testing base
GB2524130B (en) Analysing Apparatus
GB201417271D0 (en) Testing devices
GB2539674B (en) Test apparatus
GB201508054D0 (en) Test apparatus
GB2522037B (en) Test arrangement
GB201417367D0 (en) Inspection device
GB2552143B (en) Test Arrangement
DK3171140T3 (en) Combination weighing apparatus
GB2526850B (en) Logic analyzer
GB201410328D0 (en) Phenotype test
GB201408522D0 (en) Device testing
GB2527789B (en) Testing apparatus
GB2523403B (en) Mannequin