SG11201403059WA - Low dielectric photoimageable compositions and electronic devices made therefrom - Google Patents

Low dielectric photoimageable compositions and electronic devices made therefrom

Info

Publication number
SG11201403059WA
SG11201403059WA SG11201403059WA SG11201403059WA SG11201403059WA SG 11201403059W A SG11201403059W A SG 11201403059WA SG 11201403059W A SG11201403059W A SG 11201403059WA SG 11201403059W A SG11201403059W A SG 11201403059WA SG 11201403059W A SG11201403059W A SG 11201403059WA
Authority
SG
Singapore
Prior art keywords
electronic devices
low dielectric
made therefrom
devices made
photoimageable compositions
Prior art date
Application number
SG11201403059WA
Inventor
Ruzhi Zhang
Jihoon Kim
Bharatkumar K Patel
Elizabeth Wolfer
Original Assignee
Az Electronic Materials Luxembourg Sarl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Az Electronic Materials Luxembourg Sarl filed Critical Az Electronic Materials Luxembourg Sarl
Publication of SG11201403059WA publication Critical patent/SG11201403059WA/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L83/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
    • C08L83/04Polysiloxanes
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0757Macromolecular compounds containing Si-O, Si-C or Si-N bonds
    • G03F7/0758Macromolecular compounds containing Si-O, Si-C or Si-N bonds with silicon- containing groups in the side chains
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02123Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
    • H01L21/02126Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02282Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329Insulating materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24802Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials For Photolithography (AREA)
  • Formation Of Insulating Films (AREA)
SG11201403059WA 2012-02-09 2013-02-08 Low dielectric photoimageable compositions and electronic devices made therefrom SG11201403059WA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/369,809 US8871425B2 (en) 2012-02-09 2012-02-09 Low dielectric photoimageable compositions and electronic devices made therefrom
PCT/IB2013/000170 WO2013117989A1 (en) 2012-02-09 2013-02-08 Low dielectric photoimageable compositions and electronic devices made therefrom

Publications (1)

Publication Number Publication Date
SG11201403059WA true SG11201403059WA (en) 2014-07-30

Family

ID=47913498

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201403059WA SG11201403059WA (en) 2012-02-09 2013-02-08 Low dielectric photoimageable compositions and electronic devices made therefrom

Country Status (9)

Country Link
US (1) US8871425B2 (en)
EP (1) EP2812399B1 (en)
JP (1) JP5941559B2 (en)
KR (1) KR101904582B1 (en)
CN (1) CN104093784B (en)
PH (1) PH12014501731B1 (en)
SG (1) SG11201403059WA (en)
TW (1) TWI544280B (en)
WO (1) WO2013117989A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
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JP6213270B2 (en) * 2014-01-31 2017-10-18 住友化学株式会社 Polysilsesquioxane encapsulant composition for UV-LED and use of solvent therefor
CN104282250B (en) * 2014-10-24 2016-08-31 深圳市华星光电技术有限公司 In TFT MIS structure design control method and system
US10544329B2 (en) 2015-04-13 2020-01-28 Honeywell International Inc. Polysiloxane formulations and coatings for optoelectronic applications
US10254650B2 (en) 2016-06-29 2019-04-09 Honeywell International Inc. Low temperature SC1 strippable oxysilane-containing coatings
JP2019535840A (en) 2016-08-22 2019-12-12 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツングMerck Patent Gesellschaft mit beschraenkter Haftung Compound for optical devices
WO2018050526A1 (en) 2016-09-13 2018-03-22 Merck Patent Gmbh Light luminescent particle
US10544330B2 (en) * 2017-01-20 2020-01-28 Honeywell International Inc. Gap filling dielectric materials

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Publication number Priority date Publication date Assignee Title
US4442197A (en) 1982-01-11 1984-04-10 General Electric Company Photocurable compositions
ATE37242T1 (en) 1984-02-10 1988-09-15 Ciba Geigy Ag PROCESS FOR PRODUCING A PROTECTIVE COATING OR A RELIEF IMAGE.
US4603101A (en) 1985-09-27 1986-07-29 General Electric Company Photoresist compositions containing t-substituted organomethyl vinylaryl ether materials
JPH06148895A (en) 1992-11-06 1994-05-27 Toray Ind Inc Photosensitive resin composition and pattern forming method using that
TW526390B (en) 1997-06-26 2003-04-01 Shinetsu Chemical Co Resist compositions
US5962067A (en) * 1997-09-09 1999-10-05 Lucent Technologies Inc. Method for coating an article with a ladder siloxane polymer and coated article
TW588072B (en) 2000-10-10 2004-05-21 Shipley Co Llc Antireflective porogens
TW594416B (en) * 2001-05-08 2004-06-21 Shipley Co Llc Photoimageable composition
JP2004165613A (en) 2002-06-03 2004-06-10 Shipley Co Llc Manufacture of electronic device
US7041748B2 (en) * 2003-01-08 2006-05-09 International Business Machines Corporation Patternable low dielectric constant materials and their use in ULSI interconnection
JP5102428B2 (en) * 2003-11-25 2012-12-19 ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. Waveguide composition and waveguide formed therefrom
DE602005001341T2 (en) * 2004-04-14 2008-02-21 Rohm and Haas Electronic Materials, L.L.C., Marlborough Waveguide compositions and waveguides made therefrom
JP4491283B2 (en) * 2004-06-10 2010-06-30 信越化学工業株式会社 Pattern formation method using antireflection film-forming composition
EP1940989B1 (en) * 2005-09-29 2010-12-15 Dow Corning Corporation Method of releasing high temperature films and/or devices from metallic substrates
US8013077B2 (en) * 2007-03-02 2011-09-06 Fujifilm Corporation Insulating film forming composition and production method of insulating film
US7754510B2 (en) 2007-04-02 2010-07-13 Xerox Corporation Phase-separated dielectric structure fabrication process
JP2009199061A (en) * 2007-11-12 2009-09-03 Rohm & Haas Electronic Materials Llc Coating compositions for use with overcoated photoresist
TWI384025B (en) * 2009-04-27 2013-02-01 Ind Tech Res Inst Polyvinyl alcohol film composition, and polarizer plate employing the same
US8431670B2 (en) 2009-08-31 2013-04-30 International Business Machines Corporation Photo-patternable dielectric materials and formulations and methods of use
US8196655B2 (en) * 2009-08-31 2012-06-12 Halliburton Energy Services, Inc. Selective placement of conformance treatments in multi-zone well completions
US8389663B2 (en) * 2009-10-08 2013-03-05 International Business Machines Corporation Photo-patternable dielectric materials curable to porous dielectric materials, formulations, precursors and methods of use thereof
JP2011154214A (en) * 2010-01-27 2011-08-11 Jsr Corp Negative radiation-sensitive composition, cured pattern forming method and cured pattern
JP5544239B2 (en) * 2010-07-29 2014-07-09 富士フイルム株式会社 Polymerizable composition
KR20140007405A (en) * 2011-03-30 2014-01-17 제온 코포레이션 Resin composition and semiconductor element substrate

Also Published As

Publication number Publication date
TW201341963A (en) 2013-10-16
CN104093784B (en) 2016-09-21
PH12014501731A1 (en) 2014-11-17
CN104093784A (en) 2014-10-08
US8871425B2 (en) 2014-10-28
US20130209754A1 (en) 2013-08-15
JP2015508184A (en) 2015-03-16
EP2812399A1 (en) 2014-12-17
EP2812399B1 (en) 2016-04-20
KR101904582B1 (en) 2018-10-04
WO2013117989A1 (en) 2013-08-15
KR20140117391A (en) 2014-10-07
PH12014501731B1 (en) 2014-11-17
JP5941559B2 (en) 2016-06-29
TWI544280B (en) 2016-08-01

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