SG11201402553UA - Dual zone temperature control of upper electrodes - Google Patents
Dual zone temperature control of upper electrodesInfo
- Publication number
- SG11201402553UA SG11201402553UA SG11201402553UA SG11201402553UA SG11201402553UA SG 11201402553U A SG11201402553U A SG 11201402553UA SG 11201402553U A SG11201402553U A SG 11201402553UA SG 11201402553U A SG11201402553U A SG 11201402553UA SG 11201402553U A SG11201402553U A SG 11201402553UA
- Authority
- SG
- Singapore
- Prior art keywords
- temperature control
- upper electrodes
- zone temperature
- dual zone
- dual
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32642—Focus rings
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161563509P | 2011-11-23 | 2011-11-23 | |
US13/420,949 US9263240B2 (en) | 2011-11-22 | 2012-03-15 | Dual zone temperature control of upper electrodes |
PCT/US2012/065677 WO2013078097A1 (en) | 2011-11-23 | 2012-11-16 | Dual zone temperature control of upper electrodes |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201402553UA true SG11201402553UA (en) | 2014-09-26 |
Family
ID=48470217
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201402553UA SG11201402553UA (en) | 2011-11-23 | 2012-11-16 | Dual zone temperature control of upper electrodes |
Country Status (4)
Country | Link |
---|---|
KR (2) | KR102074632B1 (en) |
SG (1) | SG11201402553UA (en) |
TW (1) | TWI541383B (en) |
WO (1) | WO2013078097A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9945033B2 (en) * | 2014-01-06 | 2018-04-17 | Applied Materials, Inc. | High efficiency inductively coupled plasma source with customized RF shield for plasma profile control |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6074512A (en) * | 1991-06-27 | 2000-06-13 | Applied Materials, Inc. | Inductively coupled RF plasma reactor having an overhead solenoidal antenna and modular confinement magnet liners |
US6206972B1 (en) * | 1999-07-08 | 2001-03-27 | Genus, Inc. | Method and apparatus for providing uniform gas delivery to substrates in CVD and PECVD processes |
KR100425445B1 (en) * | 2001-04-24 | 2004-03-30 | 삼성전자주식회사 | Plasma etching chamber and method for manufacturing photomask using the same |
US8231799B2 (en) * | 2006-04-28 | 2012-07-31 | Applied Materials, Inc. | Plasma reactor apparatus with multiple gas injection zones having time-changing separate configurable gas compositions for each zone |
US8375890B2 (en) * | 2007-03-19 | 2013-02-19 | Micron Technology, Inc. | Apparatus and methods for capacitively coupled plasma vapor processing of semiconductor wafers |
US8236133B2 (en) * | 2008-05-05 | 2012-08-07 | Applied Materials, Inc. | Plasma reactor with center-fed multiple zone gas distribution for improved uniformity of critical dimension bias |
US8679288B2 (en) * | 2008-06-09 | 2014-03-25 | Lam Research Corporation | Showerhead electrode assemblies for plasma processing apparatuses |
US20100116788A1 (en) * | 2008-11-12 | 2010-05-13 | Lam Research Corporation | Substrate temperature control by using liquid controlled multizone substrate support |
-
2012
- 2012-11-16 SG SG11201402553UA patent/SG11201402553UA/en unknown
- 2012-11-16 WO PCT/US2012/065677 patent/WO2013078097A1/en active Application Filing
- 2012-11-16 KR KR1020197007568A patent/KR102074632B1/en active IP Right Grant
- 2012-11-16 KR KR1020147017213A patent/KR102031393B1/en active IP Right Grant
- 2012-11-23 TW TW101144009A patent/TWI541383B/en active
Also Published As
Publication number | Publication date |
---|---|
TW201337038A (en) | 2013-09-16 |
KR20190031338A (en) | 2019-03-25 |
TWI541383B (en) | 2016-07-11 |
KR102031393B1 (en) | 2019-10-11 |
KR20140092929A (en) | 2014-07-24 |
WO2013078097A1 (en) | 2013-05-30 |
KR102074632B1 (en) | 2020-02-06 |
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