SG10202105066VA - Film thickness measurement apparatus, polishing apparatus, and film thickness measurement method - Google Patents
Film thickness measurement apparatus, polishing apparatus, and film thickness measurement methodInfo
- Publication number
- SG10202105066VA SG10202105066VA SG10202105066VA SG10202105066VA SG10202105066VA SG 10202105066V A SG10202105066V A SG 10202105066VA SG 10202105066V A SG10202105066V A SG 10202105066VA SG 10202105066V A SG10202105066V A SG 10202105066VA SG 10202105066V A SG10202105066V A SG 10202105066VA
- Authority
- SG
- Singapore
- Prior art keywords
- film thickness
- thickness measurement
- measurement method
- polishing apparatus
- polishing
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 238000000691 measurement method Methods 0.000 title 1
- 238000005498 polishing Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/04—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
- B24B49/045—Specially adapted gauging instruments
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020085008A JP7503418B2 (en) | 2020-05-14 | 2020-05-14 | Film thickness measuring device, polishing device, and film thickness measuring method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202105066VA true SG10202105066VA (en) | 2021-12-30 |
Family
ID=75914435
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202105066VA SG10202105066VA (en) | 2020-05-14 | 2021-05-14 | Film thickness measurement apparatus, polishing apparatus, and film thickness measurement method |
Country Status (7)
Country | Link |
---|---|
US (1) | US20210354262A1 (en) |
EP (1) | EP3909717B1 (en) |
JP (1) | JP7503418B2 (en) |
KR (1) | KR20210141369A (en) |
CN (1) | CN113664713A (en) |
SG (1) | SG10202105066VA (en) |
TW (1) | TW202208111A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102580520B1 (en) * | 2023-05-10 | 2023-09-21 | 주식회사 라이쏠 | Inspection Device for Rubber Packing Width |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3104288A1 (en) | 1981-02-07 | 1982-08-19 | SCHÜCO Heinz Schürmann GmbH & Co, 4800 Bielefeld | "WINDOW OR DOOR WITH FITTINGS IN THE CORNER AREAS OF THE CHAMBER BETWEEN BLIND AND Sash Frames" |
JPH10229060A (en) | 1997-02-13 | 1998-08-25 | Nikon Corp | Polishing amount measuring equipment |
JP3001051B2 (en) * | 1997-08-22 | 2000-01-17 | 日本電気株式会社 | Semiconductor wafer polishing end point detector |
JP4427767B2 (en) | 1999-07-02 | 2010-03-10 | 株式会社ニコン | Measuring method |
JP3854056B2 (en) | 1999-12-13 | 2006-12-06 | 株式会社荏原製作所 | Substrate film thickness measuring method, substrate film thickness measuring apparatus, substrate processing method, and substrate processing apparatus |
JP2002124496A (en) | 2000-10-18 | 2002-04-26 | Hitachi Ltd | Method and equipment for detecting and measuring end point of polishing process, and method and equipment for manufacturing semiconductor device using the same for detecting and measuring end point of polishing process |
JP5167010B2 (en) | 2008-07-23 | 2013-03-21 | 株式会社荏原製作所 | Polishing end point detection method and polishing apparatus |
US20110222071A1 (en) | 2008-10-01 | 2011-09-15 | Peter Wolters Gmbh | Method for measuring the thickness of a discoidal workpiece |
JP2013032981A (en) * | 2011-08-02 | 2013-02-14 | Otsuka Denshi Co Ltd | Film thickness measuring device |
JP6005467B2 (en) | 2011-10-26 | 2016-10-12 | 株式会社荏原製作所 | Polishing method and polishing apparatus |
JP2014103344A (en) | 2012-11-22 | 2014-06-05 | Ebara Corp | Polishing method |
JP6105371B2 (en) | 2013-04-25 | 2017-03-29 | 株式会社荏原製作所 | Polishing method and polishing apparatus |
KR101758437B1 (en) * | 2014-11-19 | 2017-07-17 | 삼성에스디아이 주식회사 | Cmp slurry composition for organic film and polishing method using the same |
US11152442B2 (en) | 2018-03-28 | 2021-10-19 | Sakai Display Products Corporation | Organic electroluminescent (EL) display device with comb-shaped source and drain electrodes and manufacturing method therefor |
JP7151401B2 (en) | 2018-11-15 | 2022-10-12 | 浜名湖電装株式会社 | solenoid valve |
-
2020
- 2020-05-14 JP JP2020085008A patent/JP7503418B2/en active Active
-
2021
- 2021-05-10 KR KR1020210059888A patent/KR20210141369A/en active Search and Examination
- 2021-05-12 EP EP21173616.0A patent/EP3909717B1/en active Active
- 2021-05-13 US US17/319,559 patent/US20210354262A1/en not_active Abandoned
- 2021-05-13 TW TW110117220A patent/TW202208111A/en unknown
- 2021-05-13 CN CN202110520681.4A patent/CN113664713A/en active Pending
- 2021-05-14 SG SG10202105066VA patent/SG10202105066VA/en unknown
Also Published As
Publication number | Publication date |
---|---|
EP3909717B1 (en) | 2024-08-21 |
JP7503418B2 (en) | 2024-06-20 |
TW202208111A (en) | 2022-03-01 |
EP3909717A1 (en) | 2021-11-17 |
CN113664713A (en) | 2021-11-19 |
JP2021180263A (en) | 2021-11-18 |
US20210354262A1 (en) | 2021-11-18 |
KR20210141369A (en) | 2021-11-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3881624A4 (en) | Method and apparatus for channel measurement and reporting in coreset basis | |
EP3965310A4 (en) | Channel measurement method and apparatus | |
EP4117333A4 (en) | Measurement method and apparatus | |
EP3387482A4 (en) | System, apparatus and method for monitoring of surface profile and thickness measurement in thin films | |
EP3937541A4 (en) | Measurement method, device, and apparatus | |
EP4096280A4 (en) | Measurement method and apparatus | |
TWI799612B (en) | Polishing apparatus and calibration method | |
GB2589440B (en) | Measurement method and apparatus | |
HUE066645T2 (en) | Apparatus and method for measuring thickness of unit cell | |
EP3745775A4 (en) | Measurement method and apparatus | |
EP4050930A4 (en) | Measurement configuration method and apparatus | |
EP3910992A4 (en) | Cell measurement method and apparatus | |
IL292195A (en) | Measuring method and measuring apparatus | |
EP4067843A4 (en) | Film thickness measuring device and film thickness measuring method | |
EP4007365A4 (en) | Method and apparatus used for cell measurement | |
EP4258727A4 (en) | Measurement method and apparatus | |
KR102185623B9 (en) | Thin film deposition apparatus and thin film deposition method | |
SG10202105066VA (en) | Film thickness measurement apparatus, polishing apparatus, and film thickness measurement method | |
EP4319010A4 (en) | Measurement method and apparatus | |
SG10202012173WA (en) | Polishing unit, substrate processing apparatus, and polishing method | |
EP3972326A4 (en) | Measurement method and apparatus | |
EP4096271A4 (en) | Measurement method and apparatus | |
EP4012066A4 (en) | Film forming apparatus and film forming method | |
EP3916377A4 (en) | Antigen measuring method and measuring apparatus | |
EP3907501A4 (en) | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device |