SG10202007832SA - Composite ic chips including a chiplet embedded within metallization layers of a host ic chip - Google Patents

Composite ic chips including a chiplet embedded within metallization layers of a host ic chip

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Publication number
SG10202007832SA
SG10202007832SA SG10202007832SA SG10202007832SA SG10202007832SA SG 10202007832S A SG10202007832S A SG 10202007832SA SG 10202007832S A SG10202007832S A SG 10202007832SA SG 10202007832S A SG10202007832S A SG 10202007832SA SG 10202007832S A SG10202007832S A SG 10202007832SA
Authority
SG
Singapore
Prior art keywords
host
composite
chip
metallization layers
chips including
Prior art date
Application number
SG10202007832SA
Inventor
Adel Elsherbini
Johanna Swan
Shawna Liff
Patrick Morrow
Gerald Pasdast
Van Le
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of SG10202007832SA publication Critical patent/SG10202007832SA/en

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    • H01L2224/80896Direct bonding, i.e. joining surfaces by means of intermolecular attracting interactions at their interfaces, e.g. covalent bonds, van der Waals forces between electrically insulating surfaces, e.g. oxide or nitride layers
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    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/80001Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by connecting a bonding area directly to another bonding area, i.e. connectorless bonding, e.g. bumpless bonding
    • H01L2224/80909Post-treatment of the bonding area
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    • H01L2224/93Batch processes
    • H01L2224/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L2224/96Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being encapsulated in a common layer, e.g. neo-wafer or pseudo-wafer, said common layer being separable into individual assemblies after connecting
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    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
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    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
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