SG10202006129WA - Portable x-ray backscattering system - Google Patents

Portable x-ray backscattering system

Info

Publication number
SG10202006129WA
SG10202006129WA SG10202006129WA SG10202006129WA SG10202006129WA SG 10202006129W A SG10202006129W A SG 10202006129WA SG 10202006129W A SG10202006129W A SG 10202006129WA SG 10202006129W A SG10202006129W A SG 10202006129WA SG 10202006129W A SG10202006129W A SG 10202006129WA
Authority
SG
Singapore
Prior art keywords
portable
ray backscattering
backscattering system
ray
backscattering
Prior art date
Application number
SG10202006129WA
Inventor
Morteza Safai
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of SG10202006129WA publication Critical patent/SG10202006129WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G01N33/0003—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01V5/222—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/054—Investigating materials by wave or particle radiation by diffraction, scatter or reflection small angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/301—Accessories, mechanical or electrical features portable apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/505—Detectors scintillation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Measurement Of Radiation (AREA)
SG10202006129WA 2019-07-26 2020-06-25 Portable x-ray backscattering system SG10202006129WA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16/522,791 US10830714B1 (en) 2019-07-26 2019-07-26 Portable X-ray backscattering system

Publications (1)

Publication Number Publication Date
SG10202006129WA true SG10202006129WA (en) 2021-02-25

Family

ID=71728594

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202006129WA SG10202006129WA (en) 2019-07-26 2020-06-25 Portable x-ray backscattering system

Country Status (6)

Country Link
US (1) US10830714B1 (en)
EP (1) EP3770590A3 (en)
JP (1) JP2021043185A (en)
CN (1) CN112363200A (en)
CA (1) CA3083319A1 (en)
SG (1) SG10202006129WA (en)

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0019451D0 (en) * 2000-08-09 2000-09-27 Secr Defence Imaging apparatus
AU2003282005A1 (en) 2002-10-11 2004-05-04 Telefonaktiebolaget Lm Ericsson (Publ) A method and device for estimating a signal to interference ratio (sir) in wcdma systems
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7508910B2 (en) 2006-05-04 2009-03-24 The Boeing Company System and methods for x-ray backscatter reverse engineering of structures
US7535990B2 (en) 2006-12-22 2009-05-19 The Boeing Company Low profile vision system for remote x-ray inspection
US7567649B1 (en) 2008-06-25 2009-07-28 The Boeing Company Flexible detector for x-ray applications
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
RU2606698C2 (en) * 2012-02-14 2017-01-10 Американ Сайенс Энд Инжиниринг, Инк. X-ray examination using fibre scintillation detectors with wavelengths shift
US10670740B2 (en) * 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
MX341445B (en) * 2012-07-16 2016-08-18 Rapiscan Systems Inc Ultra-portable people screening system.
WO2014121097A1 (en) * 2013-01-31 2014-08-07 Rapiscan Systems, Inc. Portable security inspection system
US9398676B2 (en) * 2014-05-05 2016-07-19 The Boeing Company System and method for quantifying X-ray backscatter system performance
CN107209282B (en) * 2014-11-20 2019-12-20 爱康公司 X-ray scanning system and method
PL3271709T3 (en) * 2015-03-20 2023-02-20 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US9649078B2 (en) * 2015-07-28 2017-05-16 Dental Imaging Technologies Corporation Hybrid X-ray system with detachable radiation shield

Also Published As

Publication number Publication date
JP2021043185A (en) 2021-03-18
EP3770590A3 (en) 2021-03-31
CN112363200A (en) 2021-02-12
CA3083319A1 (en) 2021-01-26
US10830714B1 (en) 2020-11-10
EP3770590A2 (en) 2021-01-27

Similar Documents

Publication Publication Date Title
EP3410940A4 (en) Portable medical imaging system
IL290104A (en) Diagnostic system
GB2597191B (en) Product-display system
NO20190522A1 (en) Ventilation unit
IL286570A (en) System
PL3911968T3 (en) Locating system
GB201806126D0 (en) Roped access system
GB202109370D0 (en) Vehivle system
GB201905249D0 (en) Firefighting system
IL278066B (en) Photovoltaic-electrochemical (pv-ec) system
EP4059528A4 (en) Decontamination system
GB2580512B (en) System
GB2590442B (en) Imaging system
PL3763905T3 (en) Fitting system
SG10202006129WA (en) Portable x-ray backscattering system
GB201905505D0 (en) Ventilation device
GB201818482D0 (en) Anti-drone system
DK3767166T3 (en) Optisk system
IL286827A (en) Radiation system
EP3924957C0 (en) Cloth-tensioning system
SG11202011630VA (en) Shoulder-massaging system
GB201917537D0 (en) E-marking system
GB201916999D0 (en) System
GB201910371D0 (en) Threadlocking system
IL290913A (en) Ventilation system