SG10202004275RA - Pulsed current source with internal impedance matching - Google Patents

Pulsed current source with internal impedance matching

Info

Publication number
SG10202004275RA
SG10202004275RA SG10202004275RA SG10202004275RA SG10202004275RA SG 10202004275R A SG10202004275R A SG 10202004275RA SG 10202004275R A SG10202004275R A SG 10202004275RA SG 10202004275R A SG10202004275R A SG 10202004275RA SG 10202004275R A SG10202004275R A SG 10202004275RA
Authority
SG
Singapore
Prior art keywords
current source
impedance matching
internal impedance
pulsed current
pulsed
Prior art date
Application number
SG10202004275RA
Inventor
Jens Ullmann
Gedaliahoo Krieger
James Borthwick
Original Assignee
Qualitau Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualitau Inc filed Critical Qualitau Inc
Publication of SG10202004275RA publication Critical patent/SG10202004275RA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
    • G01R31/2858—Measuring of material aspects, e.g. electro-migration [EM], hot carrier injection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
SG10202004275RA 2015-11-10 2016-11-08 Pulsed current source with internal impedance matching SG10202004275RA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US14/937,297 US20170131326A1 (en) 2015-11-10 2015-11-10 Pulsed current source with internal impedance matching

Publications (1)

Publication Number Publication Date
SG10202004275RA true SG10202004275RA (en) 2020-06-29

Family

ID=57389538

Family Applications (2)

Application Number Title Priority Date Filing Date
SG11201803629SA SG11201803629SA (en) 2015-11-10 2016-11-08 Pulsed current source with internal impedance matching
SG10202004275RA SG10202004275RA (en) 2015-11-10 2016-11-08 Pulsed current source with internal impedance matching

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG11201803629SA SG11201803629SA (en) 2015-11-10 2016-11-08 Pulsed current source with internal impedance matching

Country Status (8)

Country Link
US (1) US20170131326A1 (en)
JP (1) JP6821677B2 (en)
KR (1) KR102664683B1 (en)
CN (1) CN108291936B (en)
MY (1) MY188202A (en)
SG (2) SG11201803629SA (en)
TW (1) TWI722043B (en)
WO (1) WO2017083307A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111257728B (en) * 2020-01-20 2024-08-23 广州华凌制冷设备有限公司 Fault detection method, device, circuit and storage medium for boost voltage doubler circuit

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5922636Y2 (en) * 1978-12-29 1984-07-05 株式会社島津製作所 Voltage-current conversion circuit
JPH06249137A (en) * 1993-02-26 1994-09-06 Mitsubishi Motors Corp Pressure liquid supply source
JPH07218596A (en) * 1994-02-03 1995-08-18 Mitsubishi Electric Corp Semiconductor testing apparatus
EP0862060A3 (en) * 1997-02-18 1999-04-07 Fluke Corporation RMS converter using digital filtering
KR100317040B1 (en) * 1998-12-21 2002-02-28 김덕중 A system for testing integrated circuit semiconductor devices
US6249137B1 (en) * 1999-10-14 2001-06-19 Qualitau, Inc. Circuit and method for pulsed reliability testing
US6272062B1 (en) * 2000-05-31 2001-08-07 Infineon Technologies Ag Semiconductor memory with programmable bitline multiplexers
US6940271B2 (en) 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit
US7049713B2 (en) 2003-12-10 2006-05-23 Qualitau, Inc. Pulsed current generator circuit with charge booster
US7761066B2 (en) * 2006-01-27 2010-07-20 Marvell World Trade Ltd. Variable power adaptive transmitter
JP4129050B2 (en) * 2006-04-27 2008-07-30 松下電器産業株式会社 Multiple differential transmission system
US7724017B2 (en) 2006-08-31 2010-05-25 Keithley Instruments, Inc. Multi-channel pulse tester
US8183910B2 (en) * 2008-11-17 2012-05-22 Taiwan Semiconductor Manufacturing Co., Ltd. Circuit and method for a digital process monitor
JP2012021935A (en) 2010-07-16 2012-02-02 Yokogawa Electric Corp Signal output device and semiconductor testing device using the same
US9823280B2 (en) * 2011-12-21 2017-11-21 Microchip Technology Incorporated Current sensing with internal ADC capacitor
KR20140108363A (en) * 2013-02-25 2014-09-11 삼성전자주식회사 Operational amplifier and apparatus for sensing touch including operational amplifier

Also Published As

Publication number Publication date
TWI722043B (en) 2021-03-21
CN108291936A (en) 2018-07-17
CN108291936B (en) 2021-06-01
KR20180083364A (en) 2018-07-20
WO2017083307A1 (en) 2017-05-18
MY188202A (en) 2021-11-24
SG11201803629SA (en) 2018-05-30
JP2018534570A (en) 2018-11-22
TW201740124A (en) 2017-11-16
JP6821677B2 (en) 2021-01-27
KR102664683B1 (en) 2024-05-10
US20170131326A1 (en) 2017-05-11

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