SG10201908591TA - Polishing pad - Google Patents

Polishing pad

Info

Publication number
SG10201908591TA
SG10201908591TA SG10201908591TA SG10201908591TA SG 10201908591T A SG10201908591T A SG 10201908591TA SG 10201908591T A SG10201908591T A SG 10201908591TA SG 10201908591T A SG10201908591T A SG 10201908591TA
Authority
SG
Singapore
Prior art keywords
polishing pad
foamed polyurethane
none
exceeding
phase
Prior art date
Application number
Inventor
Yohei Murakami
Nobuyuki Oshima
Hiroyuki Nakano
Original Assignee
Nitta Haas Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitta Haas Inc filed Critical Nitta Haas Inc
Publication of SG10201908591TA publication Critical patent/SG10201908591TA/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
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    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/70Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
    • C08G18/72Polyisocyanates or polyisothiocyanates
    • C08G18/77Polyisocyanates or polyisothiocyanates having heteroatoms in addition to the isocyanate or isothiocyanate nitrogen and oxygen or sulfur
    • C08G18/78Nitrogen
    • CCHEMISTRY; METALLURGY
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    • C08G18/00Polymeric products of isocyanates or isothiocyanates
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    • C08G18/70Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
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    • C08G18/77Polyisocyanates or polyisothiocyanates having heteroatoms in addition to the isocyanate or isothiocyanate nitrogen and oxygen or sulfur
    • C08G18/78Nitrogen
    • C08G18/7806Nitrogen containing -N-C=0 groups
    • C08G18/7818Nitrogen containing -N-C=0 groups containing ureum or ureum derivative groups
    • C08G18/7825Nitrogen containing -N-C=0 groups containing ureum or ureum derivative groups containing ureum groups
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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    • C08G18/00Polymeric products of isocyanates or isothiocyanates
    • C08G18/06Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen
    • C08G18/70Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
    • C08G18/72Polyisocyanates or polyisothiocyanates
    • C08G18/77Polyisocyanates or polyisothiocyanates having heteroatoms in addition to the isocyanate or isothiocyanate nitrogen and oxygen or sulfur
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    • C08G18/70Polymeric products of isocyanates or isothiocyanates with compounds having active hydrogen characterised by the isocyanates or isothiocyanates used
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polyurethanes Or Polyureas (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

POLISHING PAD The present invention is a polishing pad formed by foamed polyurethane, with a content of S phase in the foamed polyurethane, as determined by pulsed NMR measurement at 25°C, exceeding 70%. Fig: None
SG10201908591T 2015-03-30 2016-03-14 Polishing pad SG10201908591TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015068387 2015-03-30

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SG11201707842PA SG11201707842PA (en) 2015-03-30 2016-03-14 Polishing pad

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US (1) US10625392B2 (en)
JP (1) JP6623215B2 (en)
KR (1) KR102543949B1 (en)
CN (1) CN107107307B (en)
DE (1) DE112016001517T5 (en)
MY (1) MY189264A (en)
SG (2) SG10201908591TA (en)
TW (1) TWI714563B (en)
WO (1) WO2016158348A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD854902S1 (en) * 2016-09-23 2019-07-30 Husqvarna Construction Products North America, Inc. Polishing or grinding pad
USD927952S1 (en) * 2017-08-30 2021-08-17 Husqvarna Ab Polishing or grinding pad assembly with abrasive disk, spacer, reinforcement and pad
USD958626S1 (en) * 2017-08-30 2022-07-26 Husqvarna Ab Polishing or grinding pad assembly with abrasive disks, reinforcement and pad
JP7302168B2 (en) * 2018-12-20 2023-07-04 Dic株式会社 Urethane resin composition and polishing pad
US20200384601A1 (en) * 2019-06-10 2020-12-10 Rohm And Haas Electronic Materials Cmp Holdings, Inc Thin film fluoropolymer composite cmp polishing pad
US20210122007A1 (en) * 2019-10-23 2021-04-29 Skc Co., Ltd. Composition for polishing pad and polishing pad
CN114346894B (en) * 2020-09-29 2024-05-14 Sk恩普士有限公司 Polishing pad and method for manufacturing semiconductor device using the same
JP2022153966A (en) * 2021-03-30 2022-10-13 富士紡ホールディングス株式会社 Abrasive pad and method for producing abrasive pad
US20230390970A1 (en) * 2022-06-02 2023-12-07 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of making low specific gravity polishing pads

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005015643A (en) * 2003-06-26 2005-01-20 Dic Bayer Polymer Ltd Thermoplastic polyurethane resin composition and molded product
US20070117393A1 (en) * 2005-11-21 2007-05-24 Alexander Tregub Hardened porous polymer chemical mechanical polishing (CMP) pad
JP2007246805A (en) * 2006-03-17 2007-09-27 Kuraray Co Ltd Polishing pad and method for producing the same
US7445847B2 (en) * 2006-05-25 2008-11-04 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
JP5242322B2 (en) 2008-09-30 2013-07-24 富士紡ホールディングス株式会社 Polishing pad and manufacturing method thereof
JP5846714B2 (en) * 2009-04-06 2016-01-20 ニッタ・ハース株式会社 Polishing pad
JP5945874B2 (en) 2011-10-18 2016-07-05 富士紡ホールディングス株式会社 Polishing pad and manufacturing method thereof
JP5873910B2 (en) 2014-09-01 2016-03-01 富士紡ホールディングス株式会社 Polishing pad

Also Published As

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JPWO2016158348A1 (en) 2018-01-25
SG11201707842PA (en) 2017-10-30
US10625392B2 (en) 2020-04-21
JP6623215B2 (en) 2019-12-18
CN107107307A (en) 2017-08-29
CN107107307B (en) 2020-06-26
WO2016158348A1 (en) 2016-10-06
MY189264A (en) 2022-01-31
DE112016001517T5 (en) 2018-01-04
US20180079050A1 (en) 2018-03-22
TW201641545A (en) 2016-12-01
TWI714563B (en) 2021-01-01
KR20170132710A (en) 2017-12-04
KR102543949B1 (en) 2023-06-14

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