SG10201907085QA - Semiconductor substrate processing method - Google Patents

Semiconductor substrate processing method

Info

Publication number
SG10201907085QA
SG10201907085QA SG10201907085QA SG10201907085QA SG10201907085QA SG 10201907085Q A SG10201907085Q A SG 10201907085QA SG 10201907085Q A SG10201907085Q A SG 10201907085QA SG 10201907085Q A SG10201907085Q A SG 10201907085QA SG 10201907085Q A SG10201907085Q A SG 10201907085QA
Authority
SG
Singapore
Prior art keywords
semiconductor substrate
processing method
substrate processing
semiconductor
substrate
Prior art date
Application number
SG10201907085QA
Inventor
Hirata Kazuya
Original Assignee
Disco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disco Corp filed Critical Disco Corp
Publication of SG10201907085QA publication Critical patent/SG10201907085QA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/7806—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices involving the separation of the active layers from a substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H01L21/02005—Preparing bulk and homogeneous wafers
    • H01L21/02008—Multistep processes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H01L21/02005—Preparing bulk and homogeneous wafers
    • H01L21/02008—Multistep processes
    • H01L21/0201—Specific process step
    • H01L21/02013—Grinding, lapping
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36—Removing material
    • B23K26/38—Removing material by boring or cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002—Preparing wafers
    • H01L21/02005—Preparing bulk and homogeneous wafers
    • H01L21/02008—Multistep processes
    • H01L21/0201—Specific process step
    • H01L21/02016—Backside treatment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02367—Substrates
    • H01L21/0237—Materials
    • H01L21/02373—Group 14 semiconducting materials
    • H01L21/02378—Silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02587—Structure
    • H01L21/0259—Microstructure
    • H01L21/02595—Microstructure polycrystalline
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/0445—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising crystalline silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
SG10201907085QA 2018-08-14 2019-08-01 Semiconductor substrate processing method SG10201907085QA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018152567A JP7235456B2 (en) 2018-08-14 2018-08-14 Semiconductor substrate processing method

Publications (1)

Publication Number Publication Date
SG10201907085QA true SG10201907085QA (en) 2020-03-30

Family

ID=69320683

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201907085QA SG10201907085QA (en) 2018-08-14 2019-08-01 Semiconductor substrate processing method

Country Status (8)

Country Link
US (1) US10872757B2 (en)
JP (1) JP7235456B2 (en)
KR (1) KR20200019566A (en)
CN (1) CN110828297A (en)
DE (1) DE102019212101A1 (en)
MY (1) MY194179A (en)
SG (1) SG10201907085QA (en)
TW (1) TWI807083B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10576585B1 (en) 2018-12-29 2020-03-03 Cree, Inc. Laser-assisted method for parting crystalline material
US11024501B2 (en) 2018-12-29 2021-06-01 Cree, Inc. Carrier-assisted method for parting crystalline material along laser damage region
US10562130B1 (en) 2018-12-29 2020-02-18 Cree, Inc. Laser-assisted method for parting crystalline material
US10611052B1 (en) 2019-05-17 2020-04-07 Cree, Inc. Silicon carbide wafers with relaxed positive bow and related methods
US11848197B2 (en) 2020-11-30 2023-12-19 Thinsic Inc. Integrated method for low-cost wide band gap semiconductor device manufacturing

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003007616A (en) * 2001-03-23 2003-01-10 Matsushita Electric Ind Co Ltd Method of manufacturing semiconductor film
FR2855650B1 (en) 2003-05-30 2006-03-03 Soitec Silicon On Insulator SUBSTRATES FOR CONSTRAINTS SYSTEMS AND METHOD FOR CRYSTALLINE GROWTH ON SUCH A SUBSTRATE
KR100616656B1 (en) * 2005-01-03 2006-08-28 삼성전기주식회사 Method and apparatus of producing a gallium nitride based singlecrystal substrate
TWI270025B (en) * 2005-03-21 2007-01-01 Au Optronics Corp Dual emission display with integrated touch screen and fabricating method thereof
TWI408264B (en) * 2005-12-15 2013-09-11 Saint Gobain Cristaux & Detecteurs New process for growth of low dislocation density gan
JP2011114018A (en) * 2009-11-24 2011-06-09 Disco Abrasive Syst Ltd Method of manufacturing optical device
JP5375695B2 (en) * 2010-03-19 2013-12-25 株式会社リコー Method for producing group III nitride crystal
US9424775B2 (en) * 2012-10-15 2016-08-23 The Hong Kong University Of Science And Technology LEDoS projection system
JP6456228B2 (en) * 2015-04-15 2019-01-23 株式会社ディスコ Thin plate separation method
JP6572694B2 (en) * 2015-09-11 2019-09-11 信越化学工業株式会社 Method for manufacturing SiC composite substrate and method for manufacturing semiconductor substrate
JP6562819B2 (en) * 2015-11-12 2019-08-21 株式会社ディスコ Method for separating SiC substrate
WO2017175799A1 (en) * 2016-04-05 2017-10-12 株式会社サイコックス POLYCRYSTALLINE SiC SUBSTRATE AND METHOD FOR MANUFACTURING SAME
JP6773506B2 (en) * 2016-09-29 2020-10-21 株式会社ディスコ Wafer generation method
US10697090B2 (en) * 2017-06-23 2020-06-30 Panasonic Intellectual Property Management Co., Ltd. Thin-film structural body and method for fabricating thereof

Also Published As

Publication number Publication date
TW202009989A (en) 2020-03-01
US20200058483A1 (en) 2020-02-20
JP7235456B2 (en) 2023-03-08
DE102019212101A1 (en) 2020-02-20
KR20200019566A (en) 2020-02-24
JP2020027895A (en) 2020-02-20
MY194179A (en) 2022-11-17
CN110828297A (en) 2020-02-21
US10872757B2 (en) 2020-12-22
TWI807083B (en) 2023-07-01

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