SG10201810052WA - Packaging process and packaging structure - Google Patents
Packaging process and packaging structureInfo
- Publication number
- SG10201810052WA SG10201810052WA SG10201810052WA SG10201810052WA SG10201810052WA SG 10201810052W A SG10201810052W A SG 10201810052WA SG 10201810052W A SG10201810052W A SG 10201810052WA SG 10201810052W A SG10201810052W A SG 10201810052WA SG 10201810052W A SG10201810052W A SG 10201810052WA
- Authority
- SG
- Singapore
- Prior art keywords
- packaging
- packaging structure
- packaging process
- Prior art date
Links
- 238000004806 packaging method and process Methods 0.000 title 1
- 238000012858 packaging process Methods 0.000 title 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5389—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4857—Multilayer substrates
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/561—Batch processing
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/568—Temporary substrate used as encapsulation process aid
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
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- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
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- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
- H01L23/3675—Cooling facilitated by shape of device characterised by the shape of the housing
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- H01L23/3677—Wire-like or pin-like cooling fins or heat sinks
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
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- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49838—Geometry or layout
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/03—Manufacturing methods
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- H01L24/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
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- H01L24/20—Structure, shape, material or disposition of high density interconnect preforms
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68345—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used as a support during the manufacture of self supporting substrates
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0231—Manufacturing methods of the redistribution layers
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- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0233—Structure of the redistribution layers
- H01L2224/02331—Multilayer structure
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04105—Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
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- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
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- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L2224/20—Structure, shape, material or disposition of high density interconnect preforms
- H01L2224/21—Structure, shape, material or disposition of high density interconnect preforms of an individual HDI interconnect
- H01L2224/2101—Structure
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L2224/20—Structure, shape, material or disposition of high density interconnect preforms
- H01L2224/22—Structure, shape, material or disposition of high density interconnect preforms of a plurality of HDI interconnects
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L2224/23—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
- H01L2224/25—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of a plurality of high density interconnect connectors
- H01L2224/251—Disposition
- H01L2224/2518—Disposition being disposed on at least two different sides of the body, e.g. dual array
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/95001—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips involving a temporary auxiliary member not forming part of the bonding apparatus, e.g. removable or sacrificial coating, film or substrate
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201810052WA SG10201810052WA (en) | 2018-11-12 | 2018-11-12 | Packaging process and packaging structure |
TW108102091A TWI686878B (en) | 2018-11-12 | 2019-01-18 | Packaging process and packaging structure |
US16/262,363 US11121110B2 (en) | 2018-11-12 | 2019-01-30 | Packaging process and packaging structure |
CN201910097526.9A CN111180348B (en) | 2018-11-12 | 2019-01-31 | Packaging method and packaging structure |
US16/824,021 US11081461B2 (en) | 2018-11-12 | 2020-03-19 | Packaging process and packaging structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201810052WA SG10201810052WA (en) | 2018-11-12 | 2018-11-12 | Packaging process and packaging structure |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201810052WA true SG10201810052WA (en) | 2020-06-29 |
Family
ID=70550704
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201810052WA SG10201810052WA (en) | 2018-11-12 | 2018-11-12 | Packaging process and packaging structure |
Country Status (4)
Country | Link |
---|---|
US (2) | US11121110B2 (en) |
CN (1) | CN111180348B (en) |
SG (1) | SG10201810052WA (en) |
TW (1) | TWI686878B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI723932B (en) * | 2020-08-06 | 2021-04-01 | 強茂股份有限公司 | Side wettable package component and its manufacturing method |
US11387203B2 (en) | 2020-09-08 | 2022-07-12 | Panjit International Inc. | Side wettable package |
CN112509991A (en) * | 2020-09-10 | 2021-03-16 | 成都芯源系统有限公司 | Integrated circuit package structure, integrated circuit package unit and related manufacturing method |
TWI777389B (en) * | 2021-01-27 | 2022-09-11 | 鴻鎵科技股份有限公司 | Package structure of dual transistors |
TWI751008B (en) * | 2021-01-27 | 2021-12-21 | 鴻鎵科技股份有限公司 | Package structure of double transistor |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW258829B (en) * | 1994-01-28 | 1995-10-01 | Ibm | |
KR100447867B1 (en) * | 2001-10-05 | 2004-09-08 | 삼성전자주식회사 | Semiconductor package |
US7138711B2 (en) * | 2002-06-17 | 2006-11-21 | Micron Technology, Inc. | Intrinsic thermal enhancement for FBGA package |
US8314483B2 (en) * | 2009-01-26 | 2012-11-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | On-chip heat spreader |
US10204879B2 (en) * | 2011-01-21 | 2019-02-12 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming wafer-level interconnect structures with advanced dielectric characteristics |
US8841758B2 (en) | 2012-06-29 | 2014-09-23 | Freescale Semiconductor, Inc. | Semiconductor device package and method of manufacture |
US20140151865A1 (en) * | 2012-11-30 | 2014-06-05 | Thomas H. Koschmieder | Semiconductor device packages providing enhanced exposed toe fillets |
CN104347570B (en) | 2013-07-26 | 2018-07-20 | 恩智浦美国有限公司 | Non-terminal type semiconductor packages and its assemble method |
SG10201400390YA (en) * | 2014-03-05 | 2015-10-29 | Delta Electronics Int L Singapore Pte Ltd | Package structure |
CN105895611B (en) | 2014-12-17 | 2019-07-12 | 恩智浦美国有限公司 | With wettable side without lead quad flat semiconductor packages |
SG10201501021PA (en) * | 2015-02-10 | 2016-09-29 | Delta Electronics Int L Singapore Pte Ltd | Package structure |
CN106356351B (en) * | 2015-07-15 | 2019-02-01 | 凤凰先驱股份有限公司 | Board structure and preparation method thereof |
SG10201608773PA (en) * | 2016-10-19 | 2018-05-30 | Delta Electronics Intl Singapore Pte Ltd | Method Of Packaging Semiconductor Device |
US9972558B1 (en) * | 2017-04-04 | 2018-05-15 | Stmicroelectronics, Inc. | Leadframe package with side solder ball contact and method of manufacturing |
US10903148B2 (en) * | 2018-04-10 | 2021-01-26 | Microchip Technology Incorporated | High performance multi-component electronics power module |
-
2018
- 2018-11-12 SG SG10201810052WA patent/SG10201810052WA/en unknown
-
2019
- 2019-01-18 TW TW108102091A patent/TWI686878B/en active
- 2019-01-30 US US16/262,363 patent/US11121110B2/en active Active
- 2019-01-31 CN CN201910097526.9A patent/CN111180348B/en active Active
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2020
- 2020-03-19 US US16/824,021 patent/US11081461B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
TWI686878B (en) | 2020-03-01 |
US11121110B2 (en) | 2021-09-14 |
US20200152593A1 (en) | 2020-05-14 |
CN111180348A (en) | 2020-05-19 |
US11081461B2 (en) | 2021-08-03 |
CN111180348B (en) | 2024-04-09 |
US20200219837A1 (en) | 2020-07-09 |
TW202018829A (en) | 2020-05-16 |
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