SG10201807071TA - An optical interference device - Google Patents

An optical interference device

Info

Publication number
SG10201807071TA
SG10201807071TA SG10201807071TA SG10201807071TA SG10201807071TA SG 10201807071T A SG10201807071T A SG 10201807071TA SG 10201807071T A SG10201807071T A SG 10201807071TA SG 10201807071T A SG10201807071T A SG 10201807071TA SG 10201807071T A SG10201807071T A SG 10201807071TA
Authority
SG
Singapore
Prior art keywords
optical
light
interference device
optical interference
phase shifter
Prior art date
Application number
SG10201807071TA
Inventor
Sascha Pierre Heussler
Herbert Oskar Moser
Alok Pathak
Original Assignee
Nat Univ Singapore
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nat Univ Singapore filed Critical Nat Univ Singapore
Publication of SG10201807071TA publication Critical patent/SG10201807071TA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4531Devices without moving parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0272Handheld

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Focusing (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

32 AN OPTICAL INTERFERENCE DEVICE An optical interference device 100 is disclosed herein. In a described embodiment, the optical interference device 100 comprises a phase shifter array 108 for receiving a collimated beam of light. The phase shifter array 108 includes an array of cells 128 for producing optical light channels from 10 respective rays of the collimated beam of light, with at least some of the optical light channels having varying phase shifts. The optical interference device 100 further includes a focusing lens 110 having a focal distance and arranged to simultaneously produce, from the optical light channels, a focused beam of light in its focal plane and an image downstream the phase shifter array 108 for 15 detection by an optical detector 116. The optical interference device 100 also includes an optical spatial filter 112 arranged at the focal distance of the focusing lens 110 and arranged to filter the focused beam of light to produce a spatially distributed interference light pattern in zeroth order for detection by the optical detector 116. A method for producing a spatially distributed interference 20 light pattern is also disclosed. Figure 1 25
SG10201807071TA 2014-03-13 2015-03-12 An optical interference device SG10201807071TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201461952583P 2014-03-13 2014-03-13

Publications (1)

Publication Number Publication Date
SG10201807071TA true SG10201807071TA (en) 2018-09-27

Family

ID=54072172

Family Applications (2)

Application Number Title Priority Date Filing Date
SG10201807071TA SG10201807071TA (en) 2014-03-13 2015-03-12 An optical interference device
SG11201607441TA SG11201607441TA (en) 2014-03-13 2015-03-12 An optical interference device

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG11201607441TA SG11201607441TA (en) 2014-03-13 2015-03-12 An optical interference device

Country Status (7)

Country Link
US (2) US10760971B2 (en)
EP (1) EP3117191A4 (en)
JP (1) JP6513697B2 (en)
KR (1) KR102381930B1 (en)
SG (2) SG10201807071TA (en)
TW (1) TWI670483B (en)
WO (1) WO2015137880A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016125164A2 (en) * 2015-02-05 2016-08-11 Verifood, Ltd. Spectrometry system applications
CN105319575A (en) * 2015-12-04 2016-02-10 中国原子能科学研究院 Neutron performance testing device of neutron collimator
US10422508B2 (en) * 2016-03-28 2019-09-24 Kla-Tencor Corporation System and method for spectral tuning of broadband light sources
FR3053464B1 (en) * 2016-06-30 2020-08-14 Office National D'etudes Et De Rech Aerospatiales FOURIER TRANSFORMED MULTI-TRACK SPECTROIMAGER
FR3057662B1 (en) * 2016-10-13 2018-11-16 Airbus Defence And Space Sas SPECTROPHOTOMETRIC DEVICE WITH MULTIPLE SPECTRAL MEASURING BANDS
TWI828611B (en) * 2016-11-07 2024-01-11 美商應用材料股份有限公司 Methods and apparatus for detection and analysis of nanoparticles from semiconductor chamber parts
DE102017206066A1 (en) * 2017-04-10 2018-10-11 Anvajo GmbH spectrometer
US11788967B2 (en) 2018-01-23 2023-10-17 Danmarks Tekniske Universitet Apparatus for carrying out Raman spectroscopy
CN111665231A (en) * 2019-03-08 2020-09-15 南京简智仪器设备有限公司 Shimming Raman detection device
US11415519B2 (en) * 2020-01-16 2022-08-16 Nova Ltd Accurate Raman spectroscopy

Family Cites Families (122)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4057326A (en) * 1976-05-27 1977-11-08 Rca Corporation Simplified and improved diffractive subtractive color filtering technique
US4348105A (en) 1981-04-30 1982-09-07 Rca Corporation Radiation shadow projection exposure system
DE3750174T2 (en) * 1986-10-30 1994-11-17 Canon Kk Exposure device.
US4999234A (en) * 1987-08-10 1991-03-12 Polaroid Corporation Holographic optical data storage medium
US5111325A (en) * 1989-10-16 1992-05-05 Eastman Kodak Company F-θ lens
CH682698A5 (en) * 1990-11-01 1993-10-29 Fisba Optik Ag Bystronic Laser Method in which several, arranged in one or more rows of radiation sources are imaged and apparatus therefor.
JP2691319B2 (en) 1990-11-28 1997-12-17 株式会社ニコン Projection exposure apparatus and scanning exposure method
US5745153A (en) * 1992-12-07 1998-04-28 Eastman Kodak Company Optical means for using diode laser arrays in laser multibeam printers and recorders
US5757544A (en) * 1993-03-09 1998-05-26 Olympus Optical Co., Ltd. Image display apparatus
US5854671A (en) * 1993-05-28 1998-12-29 Nikon Corporation Scanning exposure method and apparatus therefor and a projection exposure apparatus and method which selectively chooses between static exposure and scanning exposure
JP3500620B2 (en) 1994-10-24 2004-02-23 株式会社ニコン Projection exposure method and apparatus
DE4421392A1 (en) 1994-06-18 1995-12-21 Karlsruhe Forschzent Grid structure and its use
US5619245A (en) * 1994-07-29 1997-04-08 Eastman Kodak Company Multi-beam optical system using lenslet arrays in laser multi-beam printers and recorders
DE4431412C1 (en) * 1994-08-24 1996-03-14 William Newton Device for performing spectroscopic measurements
US5654798A (en) * 1995-01-19 1997-08-05 Tropel Corporation Interferometric measurement of surfaces with diffractive optics at grazing incidence
KR0161389B1 (en) 1995-02-16 1999-01-15 윤종용 A mask and the method of pattern forming using the same
JP3711586B2 (en) 1995-06-02 2005-11-02 株式会社ニコン Scanning exposure equipment
US5808657A (en) * 1996-06-17 1998-09-15 Eastman Kodak Company Laser printer with low fill modulator array and high pixel fill at a media plane
US6449237B1 (en) * 1996-08-29 2002-09-10 Samsung Electronics Co., Ltd. Optical recording and pickup head for digital versatile disc compatible with read-writable compact disc by adopting flat plate lens having staircase type diffraction grating structure
US5760901A (en) * 1997-01-28 1998-06-02 Zetetic Institute Method and apparatus for confocal interference microscopy with background amplitude reduction and compensation
JP3478058B2 (en) 1997-05-30 2003-12-10 株式会社日立製作所 Charged particle beam drawing equipment
JPH11174218A (en) * 1997-12-16 1999-07-02 Fuji Photo Optical Co Ltd Diffraction filter
WO1999050692A1 (en) * 1998-03-27 1999-10-07 Hitachi, Ltd. Polarizing diffraction grating and magneto-optical head made by using the same
US6383719B1 (en) 1998-05-19 2002-05-07 International Business Machines Corporation Process for enhanced lithographic imaging
JP3380878B2 (en) 1998-07-16 2003-02-24 学校法人立命館 Material processing method and processing device using X-ray irradiation
FR2783323B1 (en) * 1998-09-10 2000-10-13 Suisse Electronique Microtech INTERFEROMETRIC DEVICE TO DETECT THE CHARACTERISTICS OF OPTICAL REFLECTION AND / OR TRANSMISSION IN DEPTH OF AN OBJECT
JP4182580B2 (en) 1999-01-18 2008-11-19 ソニー株式会社 Illumination device and image display device
US6169565B1 (en) 1999-03-31 2001-01-02 Eastman Kodak Company Laser printer utilizing a spatial light modulator
JP2001166237A (en) * 1999-12-10 2001-06-22 Canon Inc Optical scanning optical device
JP4633297B2 (en) 2000-12-05 2011-02-16 大日本印刷株式会社 Method for manufacturing concavo-convex pattern layer, and liquid crystal display and color filter manufactured using this method
US6804269B2 (en) * 2001-06-19 2004-10-12 Hitachi Via Mechanics, Ltd. Laser beam delivery system with trepanning module
JP4281041B2 (en) 2001-10-01 2009-06-17 セイコーエプソン株式会社 Phase grating mask
US7292749B2 (en) * 2001-10-17 2007-11-06 Danmarks Tekniske Universitet System for electromagnetic field conversion
US7050155B2 (en) 2001-10-30 2006-05-23 Pixelligent Technologies Llc Advanced exposure techniques for programmable lithography
US6747799B2 (en) * 2001-11-12 2004-06-08 Pts Corporation High-efficiency low-polarization-dependent-loss lamellar diffraction-grating profile and production process
US6773142B2 (en) * 2002-01-07 2004-08-10 Coherent, Inc. Apparatus for projecting a line of light from a diode-laser array
US7355716B2 (en) * 2002-01-24 2008-04-08 The General Hospital Corporation Apparatus and method for ranging and noise reduction of low coherence interferometry LCI and optical coherence tomography OCT signals by parallel detection of spectral bands
EP1480258A4 (en) * 2002-01-29 2005-11-09 Nikon Corp Exposure device and exposure method
US7009771B2 (en) * 2002-05-16 2006-03-07 Eastman Kodak Company Optical element containing an optical spacer
US20040027582A1 (en) * 2002-08-09 2004-02-12 Lev Dulman Method and apparatus for determining sample composition with an interferometer
US7050171B1 (en) * 2002-11-04 2006-05-23 The United States Of America As Represneted By The Secretary Of The Army Single-exposure interferometer with no moving parts
TW594429B (en) 2003-01-15 2004-06-21 Nanya Technology Corp Photolithography method for reducing effects of lens aberrations
US20050007601A1 (en) * 2003-01-27 2005-01-13 Rosakis Ares J. Optical characterization of surfaces and plates
US7418016B2 (en) * 2003-02-13 2008-08-26 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Method and apparatus for modifying the spread of a laser beam
FR2855608B1 (en) * 2003-05-28 2005-07-08 Onera (Off Nat Aerospatiale) STATIC SPECTROMETER BY FOURIER TRANSFORM
DE10325601B3 (en) * 2003-06-05 2005-01-13 Universität Stuttgart Switchable point light source array and its use in interferometry
JP3521205B1 (en) 2003-06-10 2004-04-19 関西ティー・エル・オー株式会社 Method for producing fine structure and fine structure produced thereby
US7057738B2 (en) * 2003-08-28 2006-06-06 A D Technology Corporation Simultaneous phase-shifting Fizeau interferometer
JP2007508596A (en) * 2003-10-17 2007-04-05 エクスプレイ リミテッド Optical system and method for use in a projection system
TWI233541B (en) 2003-10-29 2005-06-01 Hannstar Display Corp An exposure method and an apparatus thereof
US7248770B2 (en) * 2003-11-04 2007-07-24 Mesophotonics Limited Photonic band structure devices
US7205526B2 (en) * 2003-12-22 2007-04-17 Micron Technology, Inc. Methods of fabricating layered lens structures
JP4407421B2 (en) * 2004-03-26 2010-02-03 コニカミノルタオプト株式会社 Optical element and optical pickup device
WO2006086034A2 (en) * 2004-11-18 2006-08-17 Morgan Research Corporation Miniature fourier transform spectrophotometer
EP2657761A3 (en) * 2005-04-06 2013-12-25 Dimensional Photonics International, Inc. Multiple channel interferometric surface contour measurement system
US7420663B2 (en) 2005-05-24 2008-09-02 Bwt Property Inc. Spectroscopic sensor on mobile phone
US20070018286A1 (en) 2005-07-14 2007-01-25 Asml Netherlands B.V. Substrate, lithographic multiple exposure method, machine readable medium
DE102005041203A1 (en) * 2005-08-31 2007-03-01 Carl Zeiss Sms Gmbh Device for interferometric measurement of phase masks used for e.g. lithography, produces phase shifting interferogram to be applied over phase mask by translating coherence mask and/or diffraction grating in X-Y direction
EP1941528B9 (en) * 2005-09-06 2011-09-28 Carl Zeiss SMT GmbH Particle-optical arrangement with particle-optical component
JP2007079458A (en) 2005-09-16 2007-03-29 New Industry Research Organization Method for manufacturing fine three-dimensional structure and x-ray mask used therefor
WO2007061436A1 (en) * 2005-11-28 2007-05-31 University Of South Carolina Self calibration methods for optical analysis system
US7982881B2 (en) * 2005-12-06 2011-07-19 Carl Zeiss Meditec Ag Apparatus and method for interferometric measurement of a sample
US7944465B2 (en) * 2006-01-13 2011-05-17 Zecotek Display Systems Pte. Ltd. Apparatus and system for reproducing 3-dimensional images
GB2435322A (en) * 2006-02-15 2007-08-22 Oti Ophthalmic Technologies Measuring curvature or axial position using OCT
DE102006019964C5 (en) 2006-04-28 2021-08-26 Envisiontec Gmbh Device and method for producing a three-dimensional object by means of mask exposure
US8004692B2 (en) * 2006-06-30 2011-08-23 Chian Chiu Li Optical interferometer and method
US20080038467A1 (en) 2006-08-11 2008-02-14 Eastman Kodak Company Nanostructured pattern method of manufacture
US20090021598A1 (en) * 2006-12-06 2009-01-22 Mclean John Miniature integrated multispectral/multipolarization digital camera
DE102007010389B4 (en) * 2007-03-03 2011-03-10 Polytec Gmbh Device for the optical measurement of an object
TW200842345A (en) 2007-04-24 2008-11-01 Univ Minghsin Sci & Tech Measurement system and method by using white light interferometer
JP5078004B2 (en) * 2007-06-15 2012-11-21 国立大学法人 香川大学 Spectroscopic measurement apparatus and spectral measurement method
JP5120873B2 (en) * 2007-06-15 2013-01-16 国立大学法人 香川大学 Spectroscopic measurement apparatus and spectral measurement method
US7988290B2 (en) * 2007-06-27 2011-08-02 AMO Wavefront Sciences LLC. Systems and methods for measuring the shape and location of an object
US7990543B1 (en) * 2007-08-31 2011-08-02 California Institute Of Technology Surface characterization based on optical phase shifting interferometry
JP2009069592A (en) 2007-09-14 2009-04-02 Toppan Printing Co Ltd Resist substrate and contact exposure method using the same
US7639722B1 (en) * 2007-10-29 2009-12-29 The United States Of America As Represented By The Secretary Of The Air Force Multifaceted prism to cause the overlap of beams from a stack of diode laser bars
WO2009070459A1 (en) 2007-11-30 2009-06-04 Jingyun Zhang Miniature spectrometers working with cellular phones and other portable electronic devices
JP5440110B2 (en) * 2009-03-30 2014-03-12 株式会社リコー Spectral characteristic acquisition apparatus, spectral characteristic acquisition method, image evaluation apparatus, and image forming apparatus
US8149400B2 (en) * 2009-04-07 2012-04-03 Duke University Coded aperture snapshot spectral imager and method therefor
GB0921461D0 (en) * 2009-12-08 2010-01-20 Qinetiq Ltd Range based sensing
US8320621B2 (en) * 2009-12-21 2012-11-27 Microsoft Corporation Depth projector system with integrated VCSEL array
US9791684B2 (en) * 2010-01-06 2017-10-17 Ecole polytechnique fédérale de Lausanne (EPFL) Optical coherence microscopy system having a filter for suppressing a specular light contribution
US20110187878A1 (en) * 2010-02-02 2011-08-04 Primesense Ltd. Synchronization of projected illumination with rolling shutter of image sensor
US20110188054A1 (en) * 2010-02-02 2011-08-04 Primesense Ltd Integrated photonics module for optical projection
PT2542154T (en) * 2010-03-05 2020-11-25 Massachusetts Gen Hospital Systems, methods and computer-accessible medium which provide microscopic images of at least one anatomical structure at a particular resolution
US9557154B2 (en) * 2010-05-25 2017-01-31 The General Hospital Corporation Systems, devices, methods, apparatus and computer-accessible media for providing optical imaging of structures and compositions
US8446593B1 (en) * 2010-06-16 2013-05-21 The Board Of Trustees Of The Leland Stanford Junior University Optical coherence tomography system and method therefor
US8596823B2 (en) * 2010-09-07 2013-12-03 Coherent, Inc. Line-projection apparatus for arrays of diode-laser bar stacks
EP2615412B1 (en) * 2010-09-07 2016-06-01 Dai Nippon Printing Co., Ltd. Scanner device and device for measuring three-dimensional shape of object
JP5317298B2 (en) * 2010-09-08 2013-10-16 国立大学法人 香川大学 Spectroscopic measurement apparatus and spectral measurement method
CN102652281B (en) * 2010-10-19 2015-01-28 松下电器产业株式会社 Optical multiplexer and projector
JP6022464B2 (en) * 2010-10-28 2016-11-09 ナショナル ユニヴァーシティー オブ シンガポール Lithographic method and apparatus
US8305577B2 (en) 2010-11-04 2012-11-06 Nokia Corporation Method and apparatus for spectrometry
US9066087B2 (en) * 2010-11-19 2015-06-23 Apple Inc. Depth mapping using time-coded illumination
US8665440B1 (en) * 2011-02-10 2014-03-04 Physical Optics Corporation Pseudo-apposition eye spectral imaging system
US10018467B2 (en) * 2011-06-09 2018-07-10 Clark Alexander Bendall System and method for measuring a distance to an object
JP5845679B2 (en) * 2011-07-21 2016-01-20 セイコーエプソン株式会社 Electro-optical device, method of manufacturing electro-optical device, and projection display device
WO2013018024A1 (en) * 2011-07-29 2013-02-07 Ecole Polytechnique Federale De Lausanne (Epfl) Apparatus and method for quantitative phase tomography through linear scanning with coherent and non-coherent detection
US8767217B2 (en) * 2011-07-29 2014-07-01 Tornado Spectral Systems, Inc. Time domain-frequency domain optical coherence tomography apparatus and methods for use
US8908277B2 (en) * 2011-08-09 2014-12-09 Apple Inc Lens array projector
US8749796B2 (en) * 2011-08-09 2014-06-10 Primesense Ltd. Projectors of structured light
US8602308B2 (en) * 2011-12-22 2013-12-10 Symbol Technologies, Inc. Imaging device having light field sensor
WO2013116516A1 (en) 2012-02-03 2013-08-08 Wayne State University Fourier-transform interferometer with staircase reflective element
CA2866019C (en) * 2012-02-29 2017-06-27 National University Corporation Kagawa University Spectral characteristics measurement device and spectral characteristics measurement method
US9366861B1 (en) * 2012-02-29 2016-06-14 Randy E. Johnson Laser particle projection system
US8993974B2 (en) * 2012-06-12 2015-03-31 Nikon Corporation Color time domain integration camera having a single charge coupled device and fringe projection auto-focus system
US10321127B2 (en) * 2012-08-20 2019-06-11 Intermec Ip Corp. Volume dimensioning system calibration systems and methods
US20140055784A1 (en) * 2012-08-23 2014-02-27 Logos Technologies, Llc Camera system for capturing two-dimensional spatial information and hyper-spectral information
US10502870B2 (en) * 2012-10-04 2019-12-10 North Inc. Optical assembly
CN104769481B (en) * 2012-10-12 2018-12-18 统雷有限公司 Compact, low dispersion and low aberrations adaptive optics scanning system
US10386178B2 (en) * 2012-11-29 2019-08-20 Philips Photonics Gmbh Laser device for projecting a structured light pattern onto a scene
WO2014102341A1 (en) * 2012-12-31 2014-07-03 Iee International Electronics & Engineering S.A. Optical system generating a structured light field from an array of light sources by meand of a refracting or reflecting light structuring element
US8978984B2 (en) * 2013-02-28 2015-03-17 Hand Held Products, Inc. Indicia reading terminals and methods for decoding decodable indicia employing light field imaging
US9116039B2 (en) * 2013-03-15 2015-08-25 Raytheon Company Sensor including dielectric metamaterial microarray
US9672398B2 (en) * 2013-08-26 2017-06-06 Intermec Ip Corporation Aiming imagers
DE102013016752A1 (en) * 2013-09-03 2015-03-05 Universität Stuttgart Method and arrangement for robust one-shot interferometry, in particular also for optical coherence tomography according to the Spatial Domain Approach (SD-OCT)
US20160290784A1 (en) * 2013-11-13 2016-10-06 Am2M Sp Z O.O. Sp Kom Interferometric method and apparatus for spatio-temporal optical coherence modulation
JP6124385B2 (en) * 2014-09-05 2017-05-10 インテル・コーポレーション Image projector and light assembly
US10775165B2 (en) * 2014-10-10 2020-09-15 Hand Held Products, Inc. Methods for improving the accuracy of dimensioning-system measurements
WO2016072518A1 (en) * 2014-11-07 2016-05-12 ソニー株式会社 Display device and display control method
US9273846B1 (en) * 2015-01-29 2016-03-01 Heptagon Micro Optics Pte. Ltd. Apparatus for producing patterned illumination including at least one array of light sources and at least one array of microlenses
EP3304014B1 (en) * 2015-05-29 2024-04-03 Rebellion Photonics, Inc. Hydrogen sulfide imaging system

Also Published As

Publication number Publication date
US10760971B2 (en) 2020-09-01
WO2015137880A1 (en) 2015-09-17
JP6513697B2 (en) 2019-05-15
KR102381930B1 (en) 2022-04-04
KR20160132936A (en) 2016-11-21
TW201538958A (en) 2015-10-16
JP2017508160A (en) 2017-03-23
TWI670483B (en) 2019-09-01
EP3117191A4 (en) 2018-03-28
US20210123809A1 (en) 2021-04-29
EP3117191A1 (en) 2017-01-18
US20170016770A1 (en) 2017-01-19
SG11201607441TA (en) 2016-10-28

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