SG10201802786SA - Substrate cleaning apparatus and substrate processing apparatus - Google Patents
Substrate cleaning apparatus and substrate processing apparatusInfo
- Publication number
- SG10201802786SA SG10201802786SA SG10201802786SA SG10201802786SA SG10201802786SA SG 10201802786S A SG10201802786S A SG 10201802786SA SG 10201802786S A SG10201802786S A SG 10201802786SA SG 10201802786S A SG10201802786S A SG 10201802786SA SG 10201802786S A SG10201802786S A SG 10201802786SA
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- processing apparatus
- substrate processing
- cleaning apparatus
- cleaning
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47L—DOMESTIC WASHING OR CLEANING; SUCTION CLEANERS IN GENERAL
- A47L11/00—Machines for cleaning floors, carpets, furniture, walls, or wall coverings
- A47L11/02—Floor surfacing or polishing machines
- A47L11/10—Floor surfacing or polishing machines motor-driven
- A47L11/14—Floor surfacing or polishing machines motor-driven with rotating tools
- A47L11/18—Floor surfacing or polishing machines motor-driven with rotating tools the tools being roll brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B11/00—Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B11/00—Cleaning flexible or delicate articles by methods or apparatus specially adapted thereto
- B08B11/02—Devices for holding articles during cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0023—Other grinding machines or devices grinding machines with a plurality of working posts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
- B24B37/345—Feeding, loading or unloading work specially adapted to lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C1/00—Measuring angles
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D3/00—Control of position or direction
- G05D3/12—Control of position or direction using feedback
- G05D3/20—Control of position or direction using feedback using a digital comparing device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Automation & Control Theory (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
OF THE DISCLOSURE SUBSTRATE CLEANING APPARATUS AND SUBSTRATE PROCESSING APPARATUS Various examples of a substrate cleaning apparatus and a substrate processing apparatus are described in the present disclosure. One example of the present invention 5 is a substrate cleaning apparatus including a roll cleaning member cleaning a substrate, an inclination sensor detecting an inclination of the roll cleaning member, and an output device outputting a detection result of the inclination sensor. Fig. 3
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017076894A JP6941464B2 (en) | 2017-04-07 | 2017-04-07 | Substrate cleaning equipment and substrate processing equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201802786SA true SG10201802786SA (en) | 2018-11-29 |
Family
ID=63710523
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201802786SA SG10201802786SA (en) | 2017-04-07 | 2018-04-03 | Substrate cleaning apparatus and substrate processing apparatus |
Country Status (5)
Country | Link |
---|---|
US (1) | US10575697B2 (en) |
JP (1) | JP6941464B2 (en) |
KR (1) | KR102478483B1 (en) |
SG (1) | SG10201802786SA (en) |
TW (1) | TWI749207B (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7153616B2 (en) * | 2019-07-22 | 2022-10-14 | 株式会社荏原製作所 | SUBSTRATE CLEANING APPARATUS AND SUBSTRATE CLEANING METHOD |
KR102267452B1 (en) * | 2019-11-27 | 2021-06-23 | 한국생산기술연구원 | Horizontal correction device for wafer cleaning brush |
KR102267453B1 (en) * | 2019-11-27 | 2021-06-23 | 한국생산기술연구원 | Horizontal correction method for wafer cleaning brush |
KR20210144071A (en) | 2020-05-21 | 2021-11-30 | 삼성전자주식회사 | Substrate cleaning apparatus with tiltable roll brush |
CN112137507B (en) * | 2020-09-11 | 2021-10-22 | 苏州裕谦信息科技有限公司 | Seam beautifying strip maintenance and floor sweeping robot |
KR102584513B1 (en) | 2020-12-31 | 2023-10-06 | 세메스 주식회사 | Substrate type senseor for measuring of horizontal of a substrate support member provided on the atmosphere in which temperature changes are accompanied by and method for measuring horizontal of substrate support member using thereof |
CN113327878B (en) * | 2021-08-03 | 2021-10-08 | 四川明泰微电子有限公司 | Wafer loading device and wafer film pasting device |
CN113658886B (en) * | 2021-08-13 | 2023-09-26 | 长鑫存储技术有限公司 | Substrate cleaning device and substrate cleaning method thereof |
CN113911793B (en) * | 2021-11-23 | 2024-06-07 | 江苏沃源包装制品有限公司 | Carrier roller adjusting device for plastic film processing |
CN115256199A (en) * | 2022-09-29 | 2022-11-01 | 苏州米洛微纳电子科技有限公司 | Wafer surface polishing equipment for producing automobile sensing chip |
CN116765966B (en) * | 2023-08-18 | 2023-12-19 | 浙江求是半导体设备有限公司 | Wafer surface treatment apparatus |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3540524B2 (en) * | 1996-10-28 | 2004-07-07 | 大日本スクリーン製造株式会社 | Substrate processing apparatus and substrate processing method |
JP2000228382A (en) * | 1999-02-05 | 2000-08-15 | Sony Corp | Wafer cleaner |
US20050172430A1 (en) * | 2003-10-28 | 2005-08-11 | Joseph Yudovsky | Wafer edge cleaning |
TWI548483B (en) * | 2011-07-19 | 2016-09-11 | 荏原製作所股份有限公司 | Polishing device and method |
US9254510B2 (en) * | 2012-02-03 | 2016-02-09 | Stmicroelectronics, Inc. | Drying apparatus with exhaust control cap for semiconductor wafers and associated methods |
JP5937456B2 (en) * | 2012-08-07 | 2016-06-22 | 東京エレクトロン株式会社 | Substrate cleaning device and substrate cleaning unit |
JP5878441B2 (en) | 2012-08-20 | 2016-03-08 | 株式会社荏原製作所 | Substrate cleaning apparatus and substrate processing apparatus |
JP6125884B2 (en) * | 2013-04-23 | 2017-05-10 | 株式会社荏原製作所 | Substrate processing apparatus and manufacturing method of processing substrate |
JP6279276B2 (en) * | 2013-10-03 | 2018-02-14 | 株式会社荏原製作所 | Substrate cleaning apparatus and substrate processing apparatus |
-
2017
- 2017-04-07 JP JP2017076894A patent/JP6941464B2/en active Active
-
2018
- 2018-04-03 SG SG10201802786SA patent/SG10201802786SA/en unknown
- 2018-04-03 TW TW107111882A patent/TWI749207B/en active
- 2018-04-05 US US15/946,607 patent/US10575697B2/en active Active
- 2018-04-05 KR KR1020180039900A patent/KR102478483B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US20180289230A1 (en) | 2018-10-11 |
JP6941464B2 (en) | 2021-09-29 |
TW201839840A (en) | 2018-11-01 |
JP2018181978A (en) | 2018-11-15 |
KR20180113932A (en) | 2018-10-17 |
KR102478483B1 (en) | 2022-12-19 |
TWI749207B (en) | 2021-12-11 |
US10575697B2 (en) | 2020-03-03 |
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