SG10201603907WA - RF Oscillator Technique for Built-in Tune, Test, and Calibration of a Transceiver - Google Patents

RF Oscillator Technique for Built-in Tune, Test, and Calibration of a Transceiver

Info

Publication number
SG10201603907WA
SG10201603907WA SG10201603907WA SG10201603907WA SG10201603907WA SG 10201603907W A SG10201603907W A SG 10201603907WA SG 10201603907W A SG10201603907W A SG 10201603907WA SG 10201603907W A SG10201603907W A SG 10201603907WA SG 10201603907W A SG10201603907W A SG 10201603907WA
Authority
SG
Singapore
Prior art keywords
tune
transceiver
calibration
built
test
Prior art date
Application number
SG10201603907WA
Other languages
English (en)
Inventor
Kresimir Stampalia Anthony
Lafuente Mario
Original Assignee
Advanced Risc Mach Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Risc Mach Ltd filed Critical Advanced Risc Mach Ltd
Publication of SG10201603907WA publication Critical patent/SG10201603907WA/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/14—Monitoring; Testing of transmitters for calibration of the whole transmission and reception path, e.g. self-test loop-back
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/19—Self-testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/02—Transmitters
    • H04B1/04—Circuits
    • H04B2001/0408—Circuits with power amplifiers
    • H04B2001/0416—Circuits with power amplifiers having gain or transmission power control
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/02—Transmitters
    • H04B1/04—Circuits
    • H04B2001/0491—Circuits with frequency synthesizers, frequency converters or modulators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L49/00—Packet switching elements
    • H04L49/10—Packet switching elements characterised by the switching fabric construction
    • H04L49/109—Integrated on microchip, e.g. switch-on-chip

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Nonlinear Science (AREA)
  • Transceivers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Circuits Of Receivers In General (AREA)
  • Transmitters (AREA)
SG10201603907WA 2015-07-01 2016-05-16 RF Oscillator Technique for Built-in Tune, Test, and Calibration of a Transceiver SG10201603907WA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562187629P 2015-07-01 2015-07-01
US201562190168P 2015-07-08 2015-07-08
US15/007,915 US9794007B2 (en) 2015-07-01 2016-01-27 Single RF oscillator technique for built-in tune, test, and calibration of a transceiver

Publications (1)

Publication Number Publication Date
SG10201603907WA true SG10201603907WA (en) 2017-02-27

Family

ID=57684259

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201603907WA SG10201603907WA (en) 2015-07-01 2016-05-16 RF Oscillator Technique for Built-in Tune, Test, and Calibration of a Transceiver

Country Status (5)

Country Link
US (2) US9794007B2 (zh)
KR (1) KR102449329B1 (zh)
CN (1) CN106330351B (zh)
SG (1) SG10201603907WA (zh)
TW (1) TWI695593B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3045940A1 (en) * 2014-12-31 2016-07-20 Essilor International (Compagnie Generale D'optique) Ophthalmic lens comprising an anti-reflective coating designed for scotopic conditions
US11695439B2 (en) * 2020-10-30 2023-07-04 Mediatek Inc. Semiconductor chip with local oscillator buffer reused for signal transmission and associated transmission method
US11601147B2 (en) * 2020-10-30 2023-03-07 Mediatek Inc. Semiconductor chip with local oscillator buffer reused for loop-back test and associated loop-back test method
US20230188093A1 (en) * 2021-12-15 2023-06-15 Texas Instruments Incorporated Oscillator frequency accuracy and amplitude control

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7363563B1 (en) * 2003-12-05 2008-04-22 Pmc-Sierra, Inc. Systems and methods for a built in test circuit for asynchronous testing of high-speed transceivers
US20050148304A1 (en) * 2003-12-24 2005-07-07 Fodus Communications, Inc. Calibration method for the correction of in-phase quadrature signal mismatch in a radio frequency transceiver
US7778610B2 (en) * 2006-08-29 2010-08-17 Texas Instruments Incorporated Local oscillator with non-harmonic ratio between oscillator and RF frequencies using XOR operation with jitter estimation and correction
US8351874B2 (en) * 2008-04-08 2013-01-08 Telefonaktiebolaget Lm Ericsson (Publ) System and method for adaptive antenna impedance matching
US8135055B2 (en) * 2008-07-30 2012-03-13 Qualcomm Incorporated I/Q calibration of transmit and receive paths in OFDM FDD communication systems
US8130046B2 (en) * 2009-03-19 2012-03-06 Qualcomm Incorporated Frequency calibration of radio frequency oscillators
US20100279617A1 (en) * 2009-04-30 2010-11-04 Matsushita Electric Industrial Co., Ltd. Methods and Apparatus for Reducing Receive Band Noise in Communications Transceivers
US8699972B2 (en) * 2011-11-15 2014-04-15 Qualcomm Incorporated Transmit power calibration in a communication system
CN102594345B (zh) * 2012-02-21 2014-04-09 无锡泽太微电子有限公司 一种基于芯片的数据发送方法及系统
US9176188B2 (en) * 2013-12-20 2015-11-03 Texas Instruments Incorporated Waveform calibration using built in self test mechanism
US9628203B2 (en) * 2014-03-04 2017-04-18 Qualcomm Incorporated Analog built-in self test transceiver

Also Published As

Publication number Publication date
US20170005738A1 (en) 2017-01-05
CN106330351A (zh) 2017-01-11
TWI695593B (zh) 2020-06-01
KR102449329B1 (ko) 2022-09-30
KR20170004852A (ko) 2017-01-11
US9794007B2 (en) 2017-10-17
CN106330351B (zh) 2022-11-01
US20180006738A1 (en) 2018-01-04
US10056989B2 (en) 2018-08-21
TW201703447A (zh) 2017-01-16

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