SG10201505439TA - A configurable electronic device tester system - Google Patents

A configurable electronic device tester system

Info

Publication number
SG10201505439TA
SG10201505439TA SG10201505439TA SG10201505439TA SG10201505439TA SG 10201505439T A SG10201505439T A SG 10201505439TA SG 10201505439T A SG10201505439T A SG 10201505439TA SG 10201505439T A SG10201505439T A SG 10201505439TA SG 10201505439T A SG10201505439T A SG 10201505439TA
Authority
SG
Singapore
Prior art keywords
electronic device
device tester
tester system
configurable electronic
configurable
Prior art date
Application number
SG10201505439TA
Inventor
Boon Hua How
Kok Keong Ong
Chiang Huan SAW
See Jean Chan
Wee Tick Lo
Original Assignee
Aem Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aem Singapore Pte Ltd filed Critical Aem Singapore Pte Ltd
Priority to SG10201505439TA priority Critical patent/SG10201505439TA/en
Priority to US14/923,724 priority patent/US9927478B2/en
Priority to PCT/SG2016/050313 priority patent/WO2017010937A1/en
Publication of SG10201505439TA publication Critical patent/SG10201505439TA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/003—Environmental or reliability tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG10201505439TA 2015-07-10 2015-07-10 A configurable electronic device tester system SG10201505439TA (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SG10201505439TA SG10201505439TA (en) 2015-07-10 2015-07-10 A configurable electronic device tester system
US14/923,724 US9927478B2 (en) 2015-07-10 2015-10-27 Configurable electronic device tester system
PCT/SG2016/050313 WO2017010937A1 (en) 2015-07-10 2016-07-07 A configurable electronic device tester system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG10201505439TA SG10201505439TA (en) 2015-07-10 2015-07-10 A configurable electronic device tester system

Publications (1)

Publication Number Publication Date
SG10201505439TA true SG10201505439TA (en) 2017-02-27

Family

ID=57730979

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201505439TA SG10201505439TA (en) 2015-07-10 2015-07-10 A configurable electronic device tester system

Country Status (3)

Country Link
US (1) US9927478B2 (en)
SG (1) SG10201505439TA (en)
WO (1) WO2017010937A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3417271A4 (en) * 2016-02-16 2019-11-13 Weiss Technik North America, Inc. Environmental test chamber
JP6923767B1 (en) * 2018-06-29 2021-08-25 北京華峰測控技術股▲ふん▼有限公司 Multi-station parallel test method, control station and multi-station parallel test device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6128759A (en) * 1998-03-20 2000-10-03 Teradyne, Inc. Flexible test environment for automatic test equipment
KR100496861B1 (en) * 2002-09-26 2005-06-22 삼성전자주식회사 Test apparatus having two test boards to one handler and the test method
US7919974B2 (en) * 2004-07-23 2011-04-05 Advantest Corporation Electronic device test apparatus and method of configuring electronic device test apparatus
US7762822B2 (en) * 2005-04-27 2010-07-27 Aehr Test Systems Apparatus for testing electronic devices
TWM364268U (en) * 2008-12-01 2009-09-01 Jtron Technology Corp Adhesive cleaning device of test chip base
US9285416B2 (en) * 2012-04-02 2016-03-15 Samsung Electronics Co., Ltd. Apparatus and method for manufacturing substrates
KR101212253B1 (en) * 2012-08-16 2012-12-13 주식회사 유니테스트 A dut(device under test) tester using redriver
US9310427B2 (en) * 2013-07-24 2016-04-12 Advantest Corporation High speed tester communication interface between test slice and trays

Also Published As

Publication number Publication date
US9927478B2 (en) 2018-03-27
WO2017010937A1 (en) 2017-01-19
US20170010313A1 (en) 2017-01-12

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