SE9803178L - Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent - Google Patents

Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent

Info

Publication number
SE9803178L
SE9803178L SE9803178A SE9803178A SE9803178L SE 9803178 L SE9803178 L SE 9803178L SE 9803178 A SE9803178 A SE 9803178A SE 9803178 A SE9803178 A SE 9803178A SE 9803178 L SE9803178 L SE 9803178L
Authority
SE
Sweden
Prior art keywords
semiconductor
semiconductor component
temperature
measuring temperature
measuring
Prior art date
Application number
SE9803178A
Other languages
English (en)
Other versions
SE9803178D0 (sv
SE512796C2 (sv
Inventor
Mats Erik Molander
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9803178A priority Critical patent/SE512796C2/sv
Publication of SE9803178D0 publication Critical patent/SE9803178D0/sv
Priority to EP99951315A priority patent/EP1114510A1/en
Priority to AU63777/99A priority patent/AU6377799A/en
Priority to PCT/SE1999/001587 priority patent/WO2000018003A1/en
Priority to US09/397,506 priority patent/US6286996B1/en
Publication of SE9803178L publication Critical patent/SE9803178L/sv
Publication of SE512796C2 publication Critical patent/SE512796C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H03F1/301—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in MOSFET amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H03F1/302—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in bipolar transistor amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
    • H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Amplifiers (AREA)
  • Transmitters (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SE9803178A 1998-09-18 1998-09-18 Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent SE512796C2 (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE9803178A SE512796C2 (sv) 1998-09-18 1998-09-18 Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent
EP99951315A EP1114510A1 (en) 1998-09-18 1999-09-10 A method and arrangement for measuring temperature in an intermittently operating semiconductor
AU63777/99A AU6377799A (en) 1998-09-18 1999-09-10 A method and arrangement for measuring temperature in an intermittently operating semiconductor
PCT/SE1999/001587 WO2000018003A1 (en) 1998-09-18 1999-09-10 A method and arrangement for measuring temperature in an intermittently operating semiconductor
US09/397,506 US6286996B1 (en) 1998-09-18 1999-09-17 Method and arrangement for measuring temperature of a semiconductor component in an inactive state

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9803178A SE512796C2 (sv) 1998-09-18 1998-09-18 Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent

Publications (3)

Publication Number Publication Date
SE9803178D0 SE9803178D0 (sv) 1998-09-18
SE9803178L true SE9803178L (sv) 2000-03-19
SE512796C2 SE512796C2 (sv) 2000-05-15

Family

ID=20412643

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9803178A SE512796C2 (sv) 1998-09-18 1998-09-18 Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent

Country Status (5)

Country Link
US (1) US6286996B1 (sv)
EP (1) EP1114510A1 (sv)
AU (1) AU6377799A (sv)
SE (1) SE512796C2 (sv)
WO (1) WO2000018003A1 (sv)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3644354B2 (ja) * 2000-05-09 2005-04-27 トヨタ自動車株式会社 温度推定方法および装置
DE10351843B4 (de) * 2003-11-06 2013-11-21 Converteam Gmbh Verfahren und elektrische Schaltungen zur Ermittlung einer Temperatur eines Leistungshalbleiters
US7255476B2 (en) * 2004-04-14 2007-08-14 International Business Machines Corporation On chip temperature measuring and monitoring circuit and method
US20070237207A1 (en) 2004-06-09 2007-10-11 National Semiconductor Corporation Beta variation cancellation in temperature sensors
MXPA05007947A (es) 2005-07-27 2005-12-12 L I P N Ct De Investigacion Y Metodo para utilizar un transistor bipolar como sensor de temperatura y/o termometro autocalibrado.
DE102011083679B3 (de) * 2011-09-29 2012-09-27 Semikron Elektronik Gmbh & Co. Kg Ip-Department Verfahren und Einrichtung zur Ermittlung der Temperatur eines Halbleiterschalters

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU922542A1 (ru) * 1980-05-16 1982-04-23 Всесоюзный Научно-Исследовательский Проектно-Конструкторский Институт Технологии Электрических Машин Малой Мощности Устройство дл измерени температуры обмоток электрических машин
US4669025A (en) * 1986-04-21 1987-05-26 Digital Equipment Corporation Semiconductor junction temperature emulator
US4896196A (en) * 1986-11-12 1990-01-23 Siliconix Incorporated Vertical DMOS power transistor with an integral operating condition sensor
US4972136A (en) * 1989-11-07 1990-11-20 The United States Of America As Represented By The Secretary Of The Navy Linear power regulator with current limiting and thermal shutdown and recycle
US5063307A (en) * 1990-09-20 1991-11-05 Ixys Corporation Insulated gate transistor devices with temperature and current sensor
KR960000775B1 (ko) * 1990-10-19 1996-01-12 닛본덴기 가부시끼가이샤 고주파 전력 증폭기의 출력레벨 제어회로
TW225619B (sv) * 1991-07-19 1994-06-21 Nippon Electric Co
US5383083A (en) * 1992-05-19 1995-01-17 Pioneer Electronic Corporation Protective apparatus for power transistor
DE4324982A1 (de) * 1993-07-26 1995-02-02 Abb Management Ag Verfahren und Schaltungsanordnung zur Messung der Sperrschichttemperatur eines GTO-Thyristors
DE19522517C1 (de) * 1995-06-21 1996-11-28 Siemens Ag Schaltungsanordnung zum Abschalten eines Leistungs-MOSFET bei Übertemperatur
JPH09119870A (ja) * 1995-10-26 1997-05-06 Nec Corp 温度検出方法、半導体装置及び温度検出回路
SE511337C2 (sv) * 1996-11-08 1999-09-13 Ericsson Telefon Ab L M Anordning för att skydda sluttransistorerna i en effektförstärkare
JP2000505998A (ja) * 1996-12-09 2000-05-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 熱保護されたスイッチングトランジスタを有する装置
US6008685A (en) * 1998-03-25 1999-12-28 Mosaic Design Labs, Inc. Solid state temperature measurement

Also Published As

Publication number Publication date
SE9803178D0 (sv) 1998-09-18
WO2000018003A1 (en) 2000-03-30
US6286996B1 (en) 2001-09-11
EP1114510A1 (en) 2001-07-11
SE512796C2 (sv) 2000-05-15
AU6377799A (en) 2000-04-10

Similar Documents

Publication Publication Date Title
HK1043471A1 (zh) 基層材料的相對水合度測量儀
MY116043A (en) Thermal monitoring system for semiconductor devices
ATE225036T1 (de) Beurteilung der flüssigkeitszusammensetzung
ATE337543T1 (de) Vorrichtungen und verfahren zur wärmeverlustdruckmessung
IL159009A0 (en) Methods and apparatus for semiconductor testing
EE200100107A (et) Meetod ja seade elektrilise skeemi temperatuuri kindlakstegemiseks
SE9803178L (sv) Förfarande jämte anordning för att mäta temperatur i en halvledarkomponent
DE50001807D1 (de) Vorrichtung zur hochtemperaturerfassung und verfahren zur herstellung derselben
MD2248B1 (en) Device for impedance components measurement
JPS56161649A (en) Measuring method of thermal resistance of semiconductor package
ATE320012T1 (de) System und verfahren zur messung des leistungsverbrauchs einer auf einer gedruckten leiterplatte angeordneten schaltung
JPS5221870A (en) Circuit for detecting battery voltage
DK1014098T3 (da) Jævnstrømsmåler med passiv indgang og galvanisk isolering, især til stærkstrøm
JPS57201885A (en) Electronic circuit
DE60141144D1 (de) Methode und vorrichtung zum messen von parametern eines elektronischen bauelementes
CA2245884A1 (en) Method for high resolution measurement of a position
FR2812223B1 (fr) Procede de collage de substrats de circuit electronique sur une semelle et dispositif de mise en oeuvre du procede
SU711553A1 (ru) Устройство дл тепловых испытаний микросхем
DE60105764D1 (de) Elektronischer chip für einen tragbaren gegenstand
ES2143411A1 (es) Metodo de medida y circuito electronico para ser utilizado en analizadores de impedancia comerciales para la medida de impedancia electrica de materiales.
SE9601336L (sv) Anordning för mätning av tryck
JPS62297749A (ja) ガラス転移温度測定法
JPS57161561A (en) Testing method for semiconductor device
SE416161B (sv) Anordning for elektronisk bestemning av overforbrukning hos en elektricitetsmetare
JPS53119682A (en) Measuring method of semiconductor integrated circuit

Legal Events

Date Code Title Description
NUG Patent has lapsed