SE9404083L - Förfarande, anordning och kretskort för test av elektroniska komponenter - Google Patents
Förfarande, anordning och kretskort för test av elektroniska komponenterInfo
- Publication number
- SE9404083L SE9404083L SE9404083A SE9404083A SE9404083L SE 9404083 L SE9404083 L SE 9404083L SE 9404083 A SE9404083 A SE 9404083A SE 9404083 A SE9404083 A SE 9404083A SE 9404083 L SE9404083 L SE 9404083L
- Authority
- SE
- Sweden
- Prior art keywords
- circuit board
- conductors
- electronic components
- testing electronic
- procedure
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9404083A SE505869C2 (sv) | 1994-11-24 | 1994-11-24 | Förfarande och anordning för test av elektroniska komponenter |
CN 95196412 CN1079536C (zh) | 1994-11-24 | 1995-11-24 | 测量电子元件的方法和装置 |
KR1019970703483A KR100368898B1 (ko) | 1994-11-24 | 1995-11-24 | 전자소자를테스트하는방법및장치 |
EP95938697A EP0793807A1 (en) | 1994-11-24 | 1995-11-24 | Method and device for testing of electronic components |
AU39977/95A AU3997795A (en) | 1994-11-24 | 1995-11-24 | Method and device for testing of electronic components |
JP8516786A JPH10509518A (ja) | 1994-11-24 | 1995-11-24 | 電子部品の試験方法と装置 |
PCT/SE1995/001407 WO1996016338A1 (en) | 1994-11-24 | 1995-11-24 | Method and device for testing of electronic components |
CA 2205391 CA2205391A1 (en) | 1994-11-24 | 1995-11-24 | Method and device for testing of electronic components |
FI972083A FI972083A (sv) | 1994-11-24 | 1997-05-15 | Förfarande och anordning för testning av elektroniska komponenter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9404083A SE505869C2 (sv) | 1994-11-24 | 1994-11-24 | Förfarande och anordning för test av elektroniska komponenter |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9404083D0 SE9404083D0 (sv) | 1994-11-24 |
SE9404083L true SE9404083L (sv) | 1996-05-25 |
SE505869C2 SE505869C2 (sv) | 1997-10-20 |
Family
ID=20396108
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9404083A SE505869C2 (sv) | 1994-11-24 | 1994-11-24 | Förfarande och anordning för test av elektroniska komponenter |
Country Status (8)
Country | Link |
---|---|
EP (1) | EP0793807A1 (sv) |
JP (1) | JPH10509518A (sv) |
KR (1) | KR100368898B1 (sv) |
CN (1) | CN1079536C (sv) |
AU (1) | AU3997795A (sv) |
FI (1) | FI972083A (sv) |
SE (1) | SE505869C2 (sv) |
WO (1) | WO1996016338A1 (sv) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5609489A (en) * | 1994-12-21 | 1997-03-11 | Hewlett-Packard Company | Socket for contacting an electronic circuit during testing |
EP0833164B1 (de) * | 1996-09-27 | 2004-12-22 | Siemens Aktiengesellschaft | Kontakteinrichtung zum Testen von elektrischen Bauelementen in Bestückautomaten |
CN101153888B (zh) * | 2006-09-29 | 2011-07-27 | 比亚迪股份有限公司 | 一种柔性印刷线路板发光并联支路测试方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4866374A (en) * | 1984-10-12 | 1989-09-12 | Daymarc Corporation | Contactor assembly for testing integrated circuits |
DE3636361C1 (en) * | 1986-10-25 | 1988-04-14 | Heraeus Gmbh W C | Adapter for testing the performance of electrical components intended for surface mounting |
US4754555A (en) * | 1987-05-18 | 1988-07-05 | Adcotech Corporation | Apparatus for inspecting the coplanarity of leaded surface mounted electronic components |
-
1994
- 1994-11-24 SE SE9404083A patent/SE505869C2/sv not_active IP Right Cessation
-
1995
- 1995-11-24 WO PCT/SE1995/001407 patent/WO1996016338A1/en not_active Application Discontinuation
- 1995-11-24 JP JP8516786A patent/JPH10509518A/ja active Pending
- 1995-11-24 EP EP95938697A patent/EP0793807A1/en not_active Withdrawn
- 1995-11-24 CN CN 95196412 patent/CN1079536C/zh not_active Expired - Fee Related
- 1995-11-24 AU AU39977/95A patent/AU3997795A/en not_active Abandoned
- 1995-11-24 KR KR1019970703483A patent/KR100368898B1/ko not_active IP Right Cessation
-
1997
- 1997-05-15 FI FI972083A patent/FI972083A/sv unknown
Also Published As
Publication number | Publication date |
---|---|
FI972083A0 (sv) | 1997-05-15 |
FI972083A (sv) | 1997-05-15 |
SE505869C2 (sv) | 1997-10-20 |
SE9404083D0 (sv) | 1994-11-24 |
CN1166876A (zh) | 1997-12-03 |
WO1996016338A1 (en) | 1996-05-30 |
KR100368898B1 (ko) | 2003-04-21 |
CN1079536C (zh) | 2002-02-20 |
EP0793807A1 (en) | 1997-09-10 |
JPH10509518A (ja) | 1998-09-14 |
AU3997795A (en) | 1996-06-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |