SE8800097L - Foerfarande foer att faststaella en upptraedande diskrepans mellan tvaa optiska vaegstraeckor samt anordning anpassad foer utfoerande av foerfarandet - Google Patents
Foerfarande foer att faststaella en upptraedande diskrepans mellan tvaa optiska vaegstraeckor samt anordning anpassad foer utfoerande av foerfarandetInfo
- Publication number
- SE8800097L SE8800097L SE8800097A SE8800097A SE8800097L SE 8800097 L SE8800097 L SE 8800097L SE 8800097 A SE8800097 A SE 8800097A SE 8800097 A SE8800097 A SE 8800097A SE 8800097 L SE8800097 L SE 8800097L
- Authority
- SE
- Sweden
- Prior art keywords
- wave number
- measuring
- change
- discrepancy
- transmitter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8800097A SE460382B (sv) | 1988-01-14 | 1988-01-14 | Foerfarande foer att faststaella en upptraedande diskrepans mellan tvaa optiska vaegstraeckor samt anordning anpassad foer utfoerande av foerfarandet |
PCT/SE1989/000009 WO1989006781A1 (en) | 1988-01-14 | 1989-01-13 | A method and apparatus for measuring optical distances |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8800097A SE460382B (sv) | 1988-01-14 | 1988-01-14 | Foerfarande foer att faststaella en upptraedande diskrepans mellan tvaa optiska vaegstraeckor samt anordning anpassad foer utfoerande av foerfarandet |
Publications (3)
Publication Number | Publication Date |
---|---|
SE8800097D0 SE8800097D0 (sv) | 1988-01-14 |
SE8800097L true SE8800097L (sv) | 1989-07-15 |
SE460382B SE460382B (sv) | 1989-10-02 |
Family
ID=20371062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE8800097A SE460382B (sv) | 1988-01-14 | 1988-01-14 | Foerfarande foer att faststaella en upptraedande diskrepans mellan tvaa optiska vaegstraeckor samt anordning anpassad foer utfoerande av foerfarandet |
Country Status (2)
Country | Link |
---|---|
SE (1) | SE460382B (sv) |
WO (1) | WO1989006781A1 (sv) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7365858B2 (en) | 2001-12-18 | 2008-04-29 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US6934035B2 (en) | 2001-12-18 | 2005-08-23 | Massachusetts Institute Of Technology | System and method for measuring optical distance |
EP2171396B1 (en) * | 2007-07-12 | 2020-05-13 | Volcano Corporation | Apparatus and methods for uniform frequency sample clocking |
US9596993B2 (en) | 2007-07-12 | 2017-03-21 | Volcano Corporation | Automatic calibration systems and methods of use |
EP2634594A1 (de) * | 2012-03-01 | 2013-09-04 | Leica Geosystems AG | Verfahren zum Bestimmen einer Entfernungsänderung mittels Interferometrie |
DE102014105456B4 (de) * | 2014-04-16 | 2020-01-30 | Minikomp Bogner GmbH | Verfahren zur Vermessung der Außenkontur von dreidimensionalen Messobjekten und zugehöriges Messsystem |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4594003A (en) * | 1983-07-20 | 1986-06-10 | Zygo Corporation | Interferometric wavefront measurement |
-
1988
- 1988-01-14 SE SE8800097A patent/SE460382B/sv not_active IP Right Cessation
-
1989
- 1989-01-13 WO PCT/SE1989/000009 patent/WO1989006781A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
SE8800097D0 (sv) | 1988-01-14 |
WO1989006781A1 (en) | 1989-07-27 |
SE460382B (sv) | 1989-10-02 |
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