SE8202391L - PCB TEST DEVICE - Google Patents

PCB TEST DEVICE

Info

Publication number
SE8202391L
SE8202391L SE8202391A SE8202391A SE8202391L SE 8202391 L SE8202391 L SE 8202391L SE 8202391 A SE8202391 A SE 8202391A SE 8202391 A SE8202391 A SE 8202391A SE 8202391 L SE8202391 L SE 8202391L
Authority
SE
Sweden
Prior art keywords
circuit board
test device
accessible
testing
opened
Prior art date
Application number
SE8202391A
Other languages
Swedish (sv)
Other versions
SE430278B (en
Inventor
Hans Dahl
Jan Nordstrom
Borje Palsson
Hans Kramer
Original Assignee
Hans Dahl
Nordstroem Jan
Borje Palsson
Hans Kramer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hans Dahl, Nordstroem Jan, Borje Palsson, Hans Kramer filed Critical Hans Dahl
Priority to SE8202391A priority Critical patent/SE430278B/en
Publication of SE8202391L publication Critical patent/SE8202391L/en
Publication of SE430278B publication Critical patent/SE430278B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G01R31/02—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

An arrangement is used to test circuit boards 11 that have printed conductive layout 11d and/or one or more components 11c, the function of which is to be tested in connection with the testing. An insertion part 10 for the circuit board 11 is arranged to receive and retain the circuit board in an inlaid or inserted position. A second part 5 comprises a panel to which equipment for testing the conductive layout and/or the components can be connected. The first part is mounted in such a way that it can be rotated between a folded down position and an opened up position, so that in the folded down position the upper side 11a of the circuit board is accessible and in the opened up position the underside 11b of the circuit board is accessible. <IMAGE>
SE8202391A 1982-04-16 1982-04-16 Arrangement for testing a circuit board SE430278B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SE8202391A SE430278B (en) 1982-04-16 1982-04-16 Arrangement for testing a circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8202391A SE430278B (en) 1982-04-16 1982-04-16 Arrangement for testing a circuit board

Publications (2)

Publication Number Publication Date
SE8202391L true SE8202391L (en) 1983-10-17
SE430278B SE430278B (en) 1983-10-31

Family

ID=20346543

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8202391A SE430278B (en) 1982-04-16 1982-04-16 Arrangement for testing a circuit board

Country Status (1)

Country Link
SE (1) SE430278B (en)

Also Published As

Publication number Publication date
SE430278B (en) 1983-10-31

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