SE7603315L - METHOD OF DESIGNING DIELECTRICALLY ISOLATED REGIONS IN A SILICONE SUBSTRATE - Google Patents

METHOD OF DESIGNING DIELECTRICALLY ISOLATED REGIONS IN A SILICONE SUBSTRATE

Info

Publication number
SE7603315L
SE7603315L SE7603315A SE7603315A SE7603315L SE 7603315 L SE7603315 L SE 7603315L SE 7603315 A SE7603315 A SE 7603315A SE 7603315 A SE7603315 A SE 7603315A SE 7603315 L SE7603315 L SE 7603315L
Authority
SE
Sweden
Prior art keywords
designing
isolated regions
silicone substrate
dielectrically isolated
dielectrically
Prior art date
Application number
SE7603315A
Other languages
Swedish (sv)
Other versions
SE411814B (en
Inventor
I E Magdo
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE7603315L publication Critical patent/SE7603315L/en
Publication of SE411814B publication Critical patent/SE411814B/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/32—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers using masks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76205—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO in a region being recessed from the surface, e.g. in a recess, groove, tub or trench region
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/036—Diffusion, nonselective
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/049—Equivalence and options
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/051—Etching
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/082—Ion implantation FETs/COMs
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/085—Isolated-integrated
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/117—Oxidation, selective
SE7603315A 1975-04-16 1976-03-16 METHOD FOR MANUFACTURING INTEGRATED CIRCUITS WITH DIELECTRICALLY ISOLATED AREAS DESIGNED IN A SILICONE SUBSTRATE SE411814B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/568,636 US4044454A (en) 1975-04-16 1975-04-16 Method for forming integrated circuit regions defined by recessed dielectric isolation

Publications (2)

Publication Number Publication Date
SE7603315L true SE7603315L (en) 1976-10-17
SE411814B SE411814B (en) 1980-02-04

Family

ID=24272102

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7603315A SE411814B (en) 1975-04-16 1976-03-16 METHOD FOR MANUFACTURING INTEGRATED CIRCUITS WITH DIELECTRICALLY ISOLATED AREAS DESIGNED IN A SILICONE SUBSTRATE

Country Status (13)

Country Link
US (1) US4044454A (en)
JP (1) JPS51124386A (en)
AU (1) AU497861B2 (en)
BE (1) BE839579A (en)
BR (1) BR7602384A (en)
CA (1) CA1045724A (en)
CH (1) CH592959A5 (en)
DE (1) DE2615438A1 (en)
FR (1) FR2308204A1 (en)
GB (1) GB1515639A (en)
IT (1) IT1064171B (en)
NL (1) NL7603747A (en)
SE (1) SE411814B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5275989A (en) * 1975-12-22 1977-06-25 Hitachi Ltd Production of semiconductor device
JPS6035818B2 (en) * 1976-09-22 1985-08-16 日本電気株式会社 Manufacturing method of semiconductor device
FR2422257A1 (en) * 1977-11-28 1979-11-02 Silicium Semiconducteur Ssc FILLING AND GLASSIVIATION PROCESS AND NEW FILLING STRUCTURE
US4261761A (en) * 1979-09-04 1981-04-14 Tektronix, Inc. Method of manufacturing sub-micron channel width MOS transistor
FR2476912A1 (en) * 1980-02-22 1981-08-28 Thomson Csf METHOD FOR ISOLATING INTERCONNECTIONS IN INTEGRATED CIRCUITS, AND INTEGRATED CIRCUIT USING THE SAME
US4505026A (en) * 1983-07-14 1985-03-19 Intel Corporation CMOS Process for fabricating integrated circuits, particularly dynamic memory cells
US4536947A (en) * 1983-07-14 1985-08-27 Intel Corporation CMOS process for fabricating integrated circuits, particularly dynamic memory cells with storage capacitors
US4519128A (en) * 1983-10-05 1985-05-28 International Business Machines Corporation Method of making a trench isolated device
US4594769A (en) * 1984-06-15 1986-06-17 Signetics Corporation Method of forming insulator of selectively varying thickness on patterned conductive layer
US4983537A (en) * 1986-12-29 1991-01-08 General Electric Company Method of making a buried oxide field isolation structure
US5061654A (en) * 1987-07-01 1991-10-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit having oxide regions with different thickness
EP0309788A1 (en) * 1987-09-30 1989-04-05 Siemens Aktiengesellschaft Process for producing an embedded oxide
JP2886183B2 (en) * 1988-06-28 1999-04-26 三菱電機株式会社 Method of manufacturing field isolation insulating film
US5049520A (en) * 1990-06-06 1991-09-17 Micron Technology, Inc. Method of partially eliminating the bird's beak effect without adding any process steps
JPH06349820A (en) * 1993-06-11 1994-12-22 Rohm Co Ltd Manufacture of semiconductor device
JP2911394B2 (en) * 1995-08-22 1999-06-23 株式会社アルテクス Ultrasonic bonding equipment and resonator
US5882982A (en) * 1997-01-16 1999-03-16 Vlsi Technology, Inc. Trench isolation method
EP0856886B1 (en) * 1997-01-31 2003-06-25 STMicroelectronics S.r.l. Process for forming an edge structure to seal integrated electronic devices, and corresponding device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL159817B (en) * 1966-10-05 1979-03-15 Philips Nv PROCESS FOR THE MANUFACTURE OF A SEMI-CONDUCTOR DEVICE.
NL170348C (en) * 1970-07-10 1982-10-18 Philips Nv METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE APPLYING TO A SURFACE OF A SEMICONDUCTOR BODY AGAINST DOTTING AND AGAINST THERMAL OXIDICATION MASK MATERIAL, PRE-FRIENDLY COVERING THE WINDOWS OF THE WINDOWS IN THE MATERIALS The semiconductor body with the mask is subjected to a thermal oxidation treatment to form an oxide pattern that at least partially fills in the recesses.
NL173110C (en) * 1971-03-17 1983-12-01 Philips Nv METHOD FOR MANUFACTURING A SEMI-CONDUCTOR DEVICE APPLICATING ON A SURFACE OF A SEMI-CONDUCTOR BODY AT LEAST TWO PART-LAYERS OF DIFFERENT MATERIAL COATING.
JPS5710569B2 (en) * 1972-03-31 1982-02-26
NL7204741A (en) * 1972-04-08 1973-10-10
US3808058A (en) * 1972-08-17 1974-04-30 Bell Telephone Labor Inc Fabrication of mesa diode with channel guard
US3853633A (en) * 1972-12-04 1974-12-10 Motorola Inc Method of making a semi planar insulated gate field-effect transistor device with implanted field
JPS5214594B2 (en) * 1973-10-17 1977-04-22
US3962779A (en) * 1974-01-14 1976-06-15 Bell Telephone Laboratories, Incorporated Method for fabricating oxide isolated integrated circuits
US3904450A (en) * 1974-04-26 1975-09-09 Bell Telephone Labor Inc Method of fabricating injection logic integrated circuits using oxide isolation
US3899363A (en) * 1974-06-28 1975-08-12 Ibm Method and device for reducing sidewall conduction in recessed oxide pet arrays
US3961999A (en) * 1975-06-30 1976-06-08 Ibm Corporation Method for forming recessed dielectric isolation with a minimized "bird's beak" problem

Also Published As

Publication number Publication date
AU1295776A (en) 1977-10-20
CH592959A5 (en) 1977-11-15
AU497861B2 (en) 1979-01-25
BR7602384A (en) 1976-10-12
NL7603747A (en) 1976-10-19
FR2308204A1 (en) 1976-11-12
SE411814B (en) 1980-02-04
GB1515639A (en) 1978-06-28
BE839579A (en) 1976-07-01
FR2308204B1 (en) 1978-09-01
JPS5413349B2 (en) 1979-05-30
JPS51124386A (en) 1976-10-29
DE2615438A1 (en) 1976-10-28
US4044454A (en) 1977-08-30
IT1064171B (en) 1985-02-18
CA1045724A (en) 1979-01-02

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