SE7601741L - For infrarod stralning kenslig detektoranordning - Google Patents

For infrarod stralning kenslig detektoranordning

Info

Publication number
SE7601741L
SE7601741L SE7601741A SE7601741A SE7601741L SE 7601741 L SE7601741 L SE 7601741L SE 7601741 A SE7601741 A SE 7601741A SE 7601741 A SE7601741 A SE 7601741A SE 7601741 L SE7601741 L SE 7601741L
Authority
SE
Sweden
Prior art keywords
infrared radiation
radiation sensitive
detector device
sensitive detector
infrared
Prior art date
Application number
SE7601741A
Other languages
English (en)
Inventor
H Oppelt
Original Assignee
Bodenseewerk Geraetetech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bodenseewerk Geraetetech filed Critical Bodenseewerk Geraetetech
Publication of SE7601741L publication Critical patent/SE7601741L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0422—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using light concentrators, collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0808—Convex mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0815—Light concentrators, collectors or condensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/084—Adjustable or slidable
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02327—Optical elements or arrangements associated with the device the optical elements being integrated or being directly associated to the device, e.g. back reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
SE7601741A 1975-09-19 1976-02-17 For infrarod stralning kenslig detektoranordning SE7601741L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2541818A DE2541818C3 (de) 1975-09-19 1975-09-19 Infrarot-Strahlungsdetektor für Zielsuchköpfe

Publications (1)

Publication Number Publication Date
SE7601741L true SE7601741L (sv) 1977-04-20

Family

ID=5956905

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7601741A SE7601741L (sv) 1975-09-19 1976-02-17 For infrarod stralning kenslig detektoranordning

Country Status (3)

Country Link
US (1) US4041314A (sv)
DE (1) DE2541818C3 (sv)
SE (1) SE7601741L (sv)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1553182A (en) * 1977-03-30 1979-09-19 Yokogawa Electric Works Ltd Detector fur use in infrared gas analyzer
US4221966A (en) * 1979-03-05 1980-09-09 Spar Aerospace Limited Infrared surveillance system
US4383173A (en) * 1980-04-26 1983-05-10 Barr & Stroud Limited Infrared radiation detecting systems
FR2487512A1 (fr) * 1980-07-22 1982-01-29 Thomson Csf Dispositif detecteur de rayonnement infrarouge
DE3214269A1 (de) * 1982-04-17 1983-10-20 Zeiss Carl Fa Gekuehlte feldoptik fuer infrarotteleskope
US4661707A (en) * 1985-08-07 1987-04-28 Honeywell Inc. Disc detector assembly having prefabricated vacuum chambers
US4766316A (en) * 1985-08-07 1988-08-23 Honeywell Inc. Disc detector assembly having vacuum chamber
US4783593A (en) * 1985-12-26 1988-11-08 General Electric Company Optical system for wide angle IR imager
GB2186740B (en) * 1986-02-14 1989-11-08 Philips Electronic Associated Infrared detectors
DE3723982A1 (de) * 1987-07-20 1989-02-02 Steinheil Optronik Gmbh Infrarot-strahlungsdetektoreinrichtung
US4827130A (en) * 1987-10-22 1989-05-02 General Electric Company Selectable field infrared imager and lens set
DE3908627A1 (de) * 1989-03-16 1990-09-20 Bodenseewerk Geraetetech Infrarotdetektor
US5371369A (en) * 1993-10-13 1994-12-06 Litton Systems, Inc. Conformal cold baffle for optical imaging systems
FR2834127B1 (fr) * 2001-12-26 2005-01-14 Sagem Photodetecteur refroidi
FR2936878B1 (fr) * 2008-10-07 2010-12-17 Onera (Off Nat Aerospatiale) Systeme d'imagerie grand infrarouge a chambre obscure integrant une lentille
FR2938704B1 (fr) * 2008-11-19 2011-03-04 Commissariat Energie Atomique Systeme et procede de positionnement et d'alignement passif d'un element optique au plus pres d'un detecteur de rayonnement electromagnetique

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3082325A (en) * 1960-12-16 1963-03-19 American Machine & Fondry Comp Radiation measuring apparatus
US3173019A (en) * 1960-12-27 1965-03-09 Eric M Wormser Radiant target locator
US3323757A (en) * 1961-07-06 1967-06-06 Gen Dynamics Corp Missile autopilot
US3950645A (en) * 1964-09-21 1976-04-13 Massachusetts Institute Of Technology Infrared detection tube
DE2109561C3 (de) * 1971-03-01 1981-02-12 Bodenseewerk Geraetetechnik Gmbh, 7770 Ueberlingen Infrarot-Strahlungsdetektor für Zielsuchköpfe

Also Published As

Publication number Publication date
US4041314A (en) 1977-08-09
DE2541818C3 (de) 1981-09-10
DE2541818B2 (de) 1980-10-09
DE2541818A1 (de) 1977-03-24

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