SE546901C2 - Probe with multiple contact portions - Google Patents

Probe with multiple contact portions

Info

Publication number
SE546901C2
SE546901C2 SE2230445A SE2230445A SE546901C2 SE 546901 C2 SE546901 C2 SE 546901C2 SE 2230445 A SE2230445 A SE 2230445A SE 2230445 A SE2230445 A SE 2230445A SE 546901 C2 SE546901 C2 SE 546901C2
Authority
SE
Sweden
Prior art keywords
stylus
probe
radial distance
contact point
contact portions
Prior art date
Application number
SE2230445A
Other versions
SE2230445A1 (en
Inventor
Per-Anders Stjernstedt
Original Assignee
Sandvik Machining Solutions Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandvik Machining Solutions Ab filed Critical Sandvik Machining Solutions Ab
Priority to SE2230445A priority Critical patent/SE546901C2/en
Priority to PCT/EP2023/087430 priority patent/WO2024141421A1/en
Publication of SE2230445A1 publication Critical patent/SE2230445A1/en
Publication of SE546901C2 publication Critical patent/SE546901C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G01B5/016—Constructional details of contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor
    • G01B7/016—Constructional details of contacts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

Disclosed is a probe (100) comprising a stylus (120) extending along a longitudinal main axis (125). The stylus (120) comprises a first end (115) and a second end, wherein the first end comprises a connecting portion (110) connectable to a machining or measuring device. The stylus further comprises a first contact portion (130, 230) comprising a first contact point (135, 235), the first contact point (135, 235) having a first radial distance (R1) to the main axis (125). The stylus further comprises a second contact portion (140, 240) comprising a second contact point (145, 245) disposed on the stylus, the second contact point (145, 245) having a second radial distance (R2) to the main axis (125), wherein the second radial distance (R2) is greater than the first radial distance (R1).
SE2230445A 2022-12-29 2022-12-29 Probe with multiple contact portions SE546901C2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SE2230445A SE546901C2 (en) 2022-12-29 2022-12-29 Probe with multiple contact portions
PCT/EP2023/087430 WO2024141421A1 (en) 2022-12-29 2023-12-21 Probe with multiple contact portions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE2230445A SE546901C2 (en) 2022-12-29 2022-12-29 Probe with multiple contact portions

Publications (2)

Publication Number Publication Date
SE2230445A1 SE2230445A1 (en) 2024-06-30
SE546901C2 true SE546901C2 (en) 2025-03-04

Family

ID=89541918

Family Applications (1)

Application Number Title Priority Date Filing Date
SE2230445A SE546901C2 (en) 2022-12-29 2022-12-29 Probe with multiple contact portions

Country Status (2)

Country Link
SE (1) SE546901C2 (en)
WO (1) WO2024141421A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1393011A2 (en) * 2001-05-08 2004-03-03 Carl Zeiss Probe for a coordinate measuring device, coordinate measuring device, calibrating body for a coordinate measuring device and method for calibrating a coordinate measuring device
US20140109420A1 (en) * 2012-10-19 2014-04-24 Mitutoyo Corporation Double cone stylus, touch probe, and method of calibrating double cone stylus
CN110291360A (en) * 2017-02-14 2019-09-27 瑞尼斯豪公司 Method of calibrating a surface sensing device, corresponding calibration program for controlling a computer and corresponding calibration kit
JP2021001865A (en) * 2019-06-18 2021-01-07 日本精工株式会社 Contact type probe and coordinate measurement device
US20210033379A1 (en) * 2018-04-26 2021-02-04 Renishaw Plc Surface finish stylus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19960191B4 (en) * 1999-12-14 2010-05-20 Carl Zeiss Industrielle Messtechnik Gmbh Method for securing a coordinate measuring machine against operating errors
DE102015205569B4 (en) * 2015-03-26 2022-12-08 Carl Zeiss Industrielle Messtechnik Gmbh Calibration of a moving part of a coordinate measuring machine or a tactile probe attached to it

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1393011A2 (en) * 2001-05-08 2004-03-03 Carl Zeiss Probe for a coordinate measuring device, coordinate measuring device, calibrating body for a coordinate measuring device and method for calibrating a coordinate measuring device
US20140109420A1 (en) * 2012-10-19 2014-04-24 Mitutoyo Corporation Double cone stylus, touch probe, and method of calibrating double cone stylus
CN110291360A (en) * 2017-02-14 2019-09-27 瑞尼斯豪公司 Method of calibrating a surface sensing device, corresponding calibration program for controlling a computer and corresponding calibration kit
US20210033379A1 (en) * 2018-04-26 2021-02-04 Renishaw Plc Surface finish stylus
JP2021001865A (en) * 2019-06-18 2021-01-07 日本精工株式会社 Contact type probe and coordinate measurement device

Also Published As

Publication number Publication date
SE2230445A1 (en) 2024-06-30
WO2024141421A1 (en) 2024-07-04

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