SE433779B - Sokaranordning for hal i banor - Google Patents

Sokaranordning for hal i banor

Info

Publication number
SE433779B
SE433779B SE7901691A SE7901691A SE433779B SE 433779 B SE433779 B SE 433779B SE 7901691 A SE7901691 A SE 7901691A SE 7901691 A SE7901691 A SE 7901691A SE 433779 B SE433779 B SE 433779B
Authority
SE
Sweden
Prior art keywords
mirror
transmitter
row
light
lens
Prior art date
Application number
SE7901691A
Other languages
English (en)
Swedish (sv)
Other versions
SE7901691L (sv
Inventor
E Sick
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Publication of SE7901691L publication Critical patent/SE7901691L/
Publication of SE433779B publication Critical patent/SE433779B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
SE7901691A 1978-02-27 1979-02-26 Sokaranordning for hal i banor SE433779B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2808359A DE2808359C3 (de) 1978-02-27 1978-02-27 Suchgerät für Löcher in Bahnen

Publications (2)

Publication Number Publication Date
SE7901691L SE7901691L (sv) 1979-08-28
SE433779B true SE433779B (sv) 1984-06-12

Family

ID=6033041

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7901691A SE433779B (sv) 1978-02-27 1979-02-26 Sokaranordning for hal i banor

Country Status (5)

Country Link
US (1) US4302105A (ja)
JP (1) JPS54133188A (ja)
DE (1) DE2808359C3 (ja)
GB (1) GB2015724B (ja)
SE (1) SE433779B (ja)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
AT368734B (de) * 1981-01-09 1982-11-10 Tann Papier Verfahren und vorrichtung zum regeln von perforiereinrichtungen mittels elektrischem funkendurchschlag fuer streifen aus papier od.dgl.
DE3125189C2 (de) * 1981-06-26 1984-06-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlersuchgerät für breite Bahnen
US4560273A (en) * 1982-11-30 1985-12-24 Fujitsu Limited Method and apparatus for inspecting plated through holes in printed circuit boards
DE3325136C1 (de) * 1983-07-12 1984-11-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlersuchgerät für Bahnen
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
JPS60209150A (ja) * 1984-04-02 1985-10-21 Fuji Photo Film Co Ltd 表面検査装置
GB8432099D0 (en) * 1984-12-19 1985-01-30 Fenner Co Ltd J H Conveyor belt monitoring system
US4786817A (en) * 1986-08-29 1988-11-22 Measurex Corporation System and method for measurement of traveling webs
DE3635271C1 (de) * 1986-10-16 1987-10-29 Sick Optik Elektronik Erwin Lichtvorhangsvorrichtung
DE3739436C1 (de) * 1987-11-20 1989-03-30 Sick Optik Elektronik Erwin Optisches Lochsuchgeraet
DE3800543A1 (de) * 1988-01-12 1989-07-20 Feldmuehle Ag Vorrichtung zum pruefen von sich mit hoher geschwindigkeit bewegenden bahnfoermigen flaechengebilden
US4874958A (en) * 1988-10-04 1989-10-17 Xerox Corporation Sheet edge detector
US5138490A (en) * 1989-04-29 1992-08-11 Carl-Zeiss-Stiftung Arrangement for changing the geometrical form of a light beam
DE4023904A1 (de) * 1990-07-27 1992-01-30 Zeiss Carl Fa Spiegel zur veraenderung der geometrischen gestalt eines lichtbuendels
US5389789A (en) * 1992-05-20 1995-02-14 Union Camp Corporation Portable edge crack detector for detecting size and shape of a crack and a portable edge detector
US6104032A (en) * 1992-10-13 2000-08-15 Means; Orville D. Filter inspection system
US5753904A (en) * 1995-12-29 1998-05-19 Motorola, Inc. Tool for detecting missing balls using a photodetector
DE19712828A1 (de) * 1997-03-26 1998-10-15 Sick Ag Lichtgitter und Verfahren zu seiner Herstellung
US6354716B1 (en) 2000-08-04 2002-03-12 Honeywell International Inc Light curtain device
DE10308285A1 (de) * 2003-02-26 2004-09-09 Sick Ag Optische Sende- und Empfangsanordnung
FR2852533B1 (fr) * 2003-03-20 2006-10-06 Arck Electronique Dispositif de detection de trous dans des materiaux defilant en bandes continues
US7599050B2 (en) * 2003-10-21 2009-10-06 Daihatsu Motor Co., Ltd. Surface defect inspecting method and device
WO2008094159A1 (en) * 2007-02-01 2008-08-07 Donald Joseph Wagner Refractive spectrum splitting concentrator system
KR101249168B1 (ko) 2009-12-18 2013-03-29 주식회사 포스코 냉간압연에서의 품질이상 예지 시스템과 그 방법
CN104797906A (zh) * 2011-12-20 2015-07-22 3M创新有限公司 用于测量表面不均匀度的传感器
US9201228B1 (en) * 2013-02-27 2015-12-01 Focal Technologies, Inc. Light processing system
JP6513980B2 (ja) * 2015-03-16 2019-05-15 株式会社東芝 撮像装置及び撮像方法
DE102016121913A1 (de) * 2016-11-15 2018-05-17 Sick Ag Mehrstrahllichtschranke

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5757653B2 (ja) * 1974-02-09 1982-12-06 Toppan Printing Co Ltd
DE2532602C3 (de) * 1975-07-21 1979-07-05 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung mit einem Lichtvorhang
JPS5248031A (en) * 1975-10-14 1977-04-16 Mitsubishi Electric Corp Control device for in-door wiring connected apparatus
US4011857A (en) * 1975-11-24 1977-03-15 Rice Harold D Solar energy converter and elongated Fresnel lens element

Also Published As

Publication number Publication date
DE2808359C3 (de) 1980-09-04
DE2808359A1 (de) 1979-08-30
DE2808359B2 (de) 1979-12-20
GB2015724B (en) 1982-09-15
JPS54133188A (en) 1979-10-16
US4302105A (en) 1981-11-24
GB2015724A (en) 1979-09-12
SE7901691L (sv) 1979-08-28
JPS6234096B2 (ja) 1987-07-24

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