SE387764B - Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet - Google Patents

Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet

Info

Publication number
SE387764B
SE387764B SE7510332A SE7510332A SE387764B SE 387764 B SE387764 B SE 387764B SE 7510332 A SE7510332 A SE 7510332A SE 7510332 A SE7510332 A SE 7510332A SE 387764 B SE387764 B SE 387764B
Authority
SE
Sweden
Prior art keywords
memory device
application logic
detecting errors
category application
category
Prior art date
Application number
SE7510332A
Other languages
English (en)
Swedish (sv)
Inventor
I U G Andersson
G R Bergman
B E R Jonsson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE7510332A priority Critical patent/SE387764B/xx
Priority to US05/718,839 priority patent/US4075466A/en
Priority to AU17512/76A priority patent/AU497351B2/en
Priority to NL7609919A priority patent/NL7609919A/xx
Priority to CA260,899A priority patent/CA1073104A/en
Priority to GB37919/76A priority patent/GB1554239A/en
Publication of SE387764B publication Critical patent/SE387764B/xx
Priority to JP10950676A priority patent/JPS52147930A/ja
Priority to ES451528A priority patent/ES451528A1/es
Priority to FR7627720A priority patent/FR2325154A1/fr
Priority to SU762396712A priority patent/SU673203A3/ru
Priority to IT27282/76A priority patent/IT1073307B/it
Priority to DE19762641727 priority patent/DE2641727A1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
SE7510332A 1975-09-16 1975-09-16 Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet SE387764B (sv)

Priority Applications (12)

Application Number Priority Date Filing Date Title
SE7510332A SE387764B (sv) 1975-09-16 1975-09-16 Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet
US05/718,839 US4075466A (en) 1975-09-16 1976-08-30 Method of and arrangement for detecting faults in a memory device
AU17512/76A AU497351B2 (en) 1975-09-16 1976-09-07 Detecting faults ina memory device
NL7609919A NL7609919A (nl) 1975-09-16 1976-09-07 Werkwijze voor het waarnemen van fouten in een geheugeninrichting, alsmede inrichting voor het toepassen van deze werkwijze.
CA260,899A CA1073104A (en) 1975-09-16 1976-09-10 Method and arrangement for detecting faults in a memory device
GB37919/76A GB1554239A (en) 1975-09-16 1976-09-13 Detecting a fault in a memory device
JP10950676A JPS52147930A (en) 1975-09-16 1976-09-14 Method and device for detecting memory disturbance
ES451528A ES451528A1 (es) 1975-09-16 1976-09-15 Una disposicion logica de aplicacion de categoria para de- tectar averias en un dispositivo de memoria.
FR7627720A FR2325154A1 (fr) 1975-09-16 1976-09-15 Circuit de detection des defauts des memoires
SU762396712A SU673203A3 (ru) 1975-09-16 1976-09-15 Устройство дл контрол пам ти
IT27282/76A IT1073307B (it) 1975-09-16 1976-09-16 Metodo e disposizione per il rilevamento di guasti in un dispositivo di memoria
DE19762641727 DE2641727A1 (de) 1975-09-16 1976-09-16 Verfahren und anordnung zur ermittlung von fehlern in einer speichervorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7510332A SE387764B (sv) 1975-09-16 1975-09-16 Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet

Publications (1)

Publication Number Publication Date
SE387764B true SE387764B (sv) 1976-09-13

Family

ID=20325559

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7510332A SE387764B (sv) 1975-09-16 1975-09-16 Sett att upptecka fel i en minnesanordning och kategoritillempningslogik for utforande av settet

Country Status (12)

Country Link
US (1) US4075466A (xx)
JP (1) JPS52147930A (xx)
AU (1) AU497351B2 (xx)
CA (1) CA1073104A (xx)
DE (1) DE2641727A1 (xx)
ES (1) ES451528A1 (xx)
FR (1) FR2325154A1 (xx)
GB (1) GB1554239A (xx)
IT (1) IT1073307B (xx)
NL (1) NL7609919A (xx)
SE (1) SE387764B (xx)
SU (1) SU673203A3 (xx)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4195770A (en) * 1978-10-24 1980-04-01 Burroughs Corporation Test generator for random access memories
GB2158622A (en) * 1983-12-21 1985-11-13 Goran Anders Henrik Hemdal Computer controlled systems
SE453228B (sv) * 1986-04-18 1988-01-18 Ericsson Telefon Ab L M Sett och anordning for att overvaka ett feltolerant datorminne
EP0253161B1 (en) * 1986-06-25 1991-10-16 Nec Corporation Testing circuit for random access memory device
US5471479A (en) * 1992-08-06 1995-11-28 Motorola, Inc. Arrangement for column sparing of memory
US7051264B2 (en) * 2001-11-14 2006-05-23 Monolithic System Technology, Inc. Error correcting memory and method of operating same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1051700A (xx) * 1962-12-08
GB1186416A (en) * 1967-08-24 1970-04-02 Standard Telephones Cables Ltd Improvements in or relating to Electrical Intelligence Storage Equipment
US3576982A (en) * 1968-12-16 1971-05-04 Ibm Error tolerant read-only storage system
US3727039A (en) * 1971-08-02 1973-04-10 Ibm Single select line storage system address check
US3768071A (en) * 1972-01-24 1973-10-23 Ibm Compensation for defective storage positions
US3898449A (en) * 1973-09-17 1975-08-05 Gte Automatic Electric Lab Inc Arrangement and method for using a magnetic tape to control hardware to load, check and routine a core memory
IT1002271B (it) * 1973-12-27 1976-05-20 Honeywell Inf Systems Perfezionamento ai dispositivi di controllo di parita nelle memorie a semiconduttori

Also Published As

Publication number Publication date
FR2325154A1 (fr) 1977-04-15
GB1554239A (en) 1979-10-17
NL7609919A (nl) 1977-03-18
AU497351B2 (en) 1978-12-07
CA1073104A (en) 1980-03-04
AU1751276A (en) 1978-03-16
SU673203A3 (ru) 1979-07-05
FR2325154B1 (xx) 1980-09-12
IT1073307B (it) 1985-04-17
DE2641727A1 (de) 1977-03-17
US4075466A (en) 1978-02-21
JPS52147930A (en) 1977-12-08
ES451528A1 (es) 1977-10-01

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