SE340316B - - Google Patents
Info
- Publication number
- SE340316B SE340316B SE11497/66A SE1149766A SE340316B SE 340316 B SE340316 B SE 340316B SE 11497/66 A SE11497/66 A SE 11497/66A SE 1149766 A SE1149766 A SE 1149766A SE 340316 B SE340316 B SE 340316B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US51214265A | 1965-12-07 | 1965-12-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE340316B true SE340316B (en:Method) | 1971-11-15 |
Family
ID=24037846
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE11497/66A SE340316B (en:Method) | 1965-12-07 | 1966-08-25 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3538439A (en:Method) |
| DE (1) | DE1541870A1 (en:Method) |
| FR (1) | FR1500211A (en:Method) |
| GB (1) | GB1160969A (en:Method) |
| SE (1) | SE340316B (en:Method) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4891017A (en) * | 1988-04-26 | 1990-01-02 | Amp Incorporated | Socket connector with pin aligning housing |
| CN106443280B (zh) * | 2016-11-21 | 2023-08-08 | 中车兰州机车有限公司 | 牵引变频器测试装置 |
| CN109460012B (zh) * | 2018-12-31 | 2024-03-22 | 河南思维自动化设备股份有限公司 | Lkj附属设备检测装置 |
| CN110223576B (zh) * | 2019-05-23 | 2021-07-06 | 电子科技大学 | 一种基于复平面的信号采样教学演示仪 |
| CN111190092B (zh) * | 2019-12-27 | 2022-03-22 | 上海华岭集成电路技术股份有限公司 | 一种fpga测试质量控制优化系统 |
| US11073570B1 (en) * | 2020-05-28 | 2021-07-27 | Western Digital Technologies, Inc. | Detecting problematic voltage signals from charge pumps |
| CN111756376B (zh) * | 2020-06-24 | 2023-08-15 | 苏州瑞迈斯科技有限公司 | 信号采样装置、系统及方法 |
| CN113064067B (zh) * | 2021-02-23 | 2022-07-01 | 浙江大学台州研究院 | 一种快速计算电机电参数的频率检测电路及其方法 |
| CN115083636B (zh) * | 2022-06-22 | 2023-11-03 | 华能核能技术研究院有限公司 | 高温气冷堆过球计数器测量方法和装置 |
| CN115236392B (zh) * | 2022-07-13 | 2025-08-19 | 国网河北省电力有限公司营销服务中心 | 多特征量的电能计量方法、装置、终端及存储介质 |
| CN118151714B (zh) * | 2024-02-26 | 2024-09-10 | 北京炎黄国芯科技有限公司 | 一种充放电数模混合电压补偿方法 |
| CN120121964B (zh) * | 2025-05-08 | 2025-07-15 | 山东莱恩光电科技股份有限公司 | 一种安全模块电路板老化检测方法及系统 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2836356A (en) * | 1952-02-21 | 1958-05-27 | Hughes Aircraft Co | Analog-to-digital converter |
| US2791746A (en) * | 1952-10-24 | 1957-05-07 | California Inst Res Found | High speed recorder |
| US3122732A (en) * | 1958-10-01 | 1964-02-25 | Electro Mechanical Res Inc | Amplitude distribution telemetering |
| US2951181A (en) * | 1958-11-25 | 1960-08-30 | Robert M Sugarman | Sampling oscilloscope |
| GB989740A (en) * | 1961-12-18 | 1965-04-22 | Gen Electric Co Ltd | Improvements in or relating to digital voltmeters |
| FR1359701A (fr) * | 1963-01-28 | 1964-04-30 | Rochar Electronique | Dispositif comparateur de niveaux à sortie logique |
| US3312894A (en) * | 1964-01-23 | 1967-04-04 | Ibm | System for measuring a characteristic of an electrical pulse |
| US3317832A (en) * | 1964-05-21 | 1967-05-02 | James E Webb | Single or joint amplitude distribution analyzer |
-
1965
- 1965-12-07 US US512142A patent/US3538439A/en not_active Expired - Lifetime
-
1966
- 1966-08-24 GB GB37970/66A patent/GB1160969A/en not_active Expired
- 1966-08-24 DE DE19661541870 patent/DE1541870A1/de active Pending
- 1966-08-25 FR FR74088A patent/FR1500211A/fr not_active Expired
- 1966-08-25 SE SE11497/66A patent/SE340316B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| FR1500211A (fr) | 1967-11-03 |
| GB1160969A (en) | 1969-08-13 |
| US3538439A (en) | 1970-11-03 |
| DE1541870A1 (de) | 1970-05-21 |