SE326060B - - Google Patents

Info

Publication number
SE326060B
SE326060B SE00367/66A SE36766A SE326060B SE 326060 B SE326060 B SE 326060B SE 00367/66 A SE00367/66 A SE 00367/66A SE 36766 A SE36766 A SE 36766A SE 326060 B SE326060 B SE 326060B
Authority
SE
Sweden
Application number
SE00367/66A
Inventor
H Ottafay
K Tertel
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SE326060B publication Critical patent/SE326060B/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0763—Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Detection And Correction Of Errors (AREA)
  • Control Of Position Or Direction (AREA)
SE00367/66A 1965-01-12 1966-01-12 SE326060B (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US425008A US3387262A (en) 1965-01-12 1965-01-12 Diagnostic system

Publications (1)

Publication Number Publication Date
SE326060B true SE326060B (ja) 1970-07-13

Family

ID=23684758

Family Applications (1)

Application Number Title Priority Date Filing Date
SE00367/66A SE326060B (ja) 1965-01-12 1966-01-12

Country Status (9)

Country Link
US (1) US3387262A (ja)
BE (1) BE674335A (ja)
CH (1) CH433826A (ja)
DE (1) DE1524135C3 (ja)
ES (1) ES321587A1 (ja)
FR (1) FR1462706A (ja)
GB (1) GB1072618A (ja)
NL (1) NL152381B (ja)
SE (1) SE326060B (ja)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1131085A (en) * 1966-03-25 1968-10-23 Secr Defence Improvements in or relating to the testing and repair of electronic digital computers
US3510845A (en) * 1966-09-06 1970-05-05 Gen Electric Data processing system including program transfer means
DE1927549A1 (de) * 1969-05-30 1970-12-03 Ibm Deutschland Fehlerpruefeinrichtung in elektronischen Datenverarbeitungsanlagen
US3593297A (en) * 1970-02-12 1971-07-13 Ibm Diagnostic system for trapping circuitry
JPS5040745B1 (ja) * 1970-06-22 1975-12-26
USRE28421E (en) * 1971-07-26 1975-05-20 Encoding network
FR2161742B1 (ja) * 1971-10-01 1976-03-26 Honeywell Bull
US3751646A (en) * 1971-12-22 1973-08-07 Ibm Error detection and correction for data processing systems
US3814922A (en) * 1972-12-01 1974-06-04 Honeywell Inf Systems Availability and diagnostic apparatus for memory modules
FR2250450A5 (ja) * 1973-09-10 1975-05-30 Honeywell Bull Soc Ind
US3909802A (en) * 1974-04-08 1975-09-30 Honeywell Inf Systems Diagnostic maintenance and test apparatus
US3963908A (en) * 1975-02-24 1976-06-15 North Electric Company Encoding scheme for failure detection in random access memories
US3988603A (en) * 1975-08-15 1976-10-26 The Bendix Corporation Micro-programming fault analyzer
US5241547A (en) * 1987-08-31 1993-08-31 Unisys Corporation Enhanced error detection scheme for instruction address sequencing of control store structure
US6134682A (en) * 1998-08-31 2000-10-17 International Business Machines Corporation Testable bus control logic circuitry and method for using same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3047843A (en) * 1957-02-15 1962-07-31 Rca Corp Monitoring circuits
US3311890A (en) * 1963-08-20 1967-03-28 Bell Telephone Labor Inc Apparatus for testing a storage system

Also Published As

Publication number Publication date
ES321587A1 (es) 1966-10-01
FR1462706A (fr) 1966-12-16
DE1524135C3 (de) 1974-03-28
CH433826A (de) 1967-04-15
NL152381B (nl) 1977-02-15
NL6600354A (ja) 1966-07-13
DE1524135A1 (de) 1970-07-09
DE1524135B2 (de) 1973-08-16
US3387262A (en) 1968-06-04
BE674335A (ja) 1966-04-15
GB1072618A (en) 1967-06-21

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