SA519410245B1 - تحليل عينة صخرية - Google Patents

تحليل عينة صخرية

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Publication number
SA519410245B1
SA519410245B1 SA519410245A SA519410245A SA519410245B1 SA 519410245 B1 SA519410245 B1 SA 519410245B1 SA 519410245 A SA519410245 A SA 519410245A SA 519410245 A SA519410245 A SA 519410245A SA 519410245 B1 SA519410245 B1 SA 519410245B1
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SA
Saudi Arabia
Prior art keywords
pixel
substance
sample region
value
chemical
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SA519410245A
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English (en)
Inventor
ديفيد جاكوبى
كوشى سون
جوردان كون
جون لونجو
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شركة الزيت العربية السعودية
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Application filed by شركة الزيت العربية السعودية filed Critical شركة الزيت العربية السعودية
Publication of SA519410245B1 publication Critical patent/SA519410245B1/ar

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G01N33/241—Earth materials for hydrocarbon content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G06T2207/10061—Microscopic image from scanning electron microscope

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  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Remote Sensing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Processing Or Creating Images (AREA)

Abstract

يتعلّق الاختراع الحالي بطريقة مثال (100) تشتمل على تحليل الصخور من صورة منطقة عينة للصخور. يشتمل مثال الطريقة على الوصول إلى خرائط العنصر element maps (101) لمنطقة العينة في قاعدة البيانات، مع كل خريطة عنصر element maps تشتمل على مصفوفة من البكسلات array of pixels ومع كل بكسل يتضمن قيمة تمثل المدى الذي يرتبط به بكسل بشكل وثيق بالعنصر الكيميائي chemical element، الوصول إلى قاعدة البيانات التي تخزن القيم الحدية لعناصر كيميائية chemical elements متعددة تشتمل على العنصر الكيميائي (102)، تحديد وجود مادة (103) في جزء من منطقة العينة المطابق للبكسل بواسطة تحديد ما إذا كانت قيمة البكسل في كل من خرائط العنصر أكبر من، أو أقل من، القيمة الحدية للعنصر الكيميائي المطابق (103)، ترقيم البكسل على أساس وجود المادة في البكسل (104)، وإنتاج البيانات التي تمثل خريطة المادة substance map للتقديم على واجهة رسومية graphical interface (105). شكل1
SA519410245A 2017-05-15 2019-10-03 تحليل عينة صخرية SA519410245B1 (ar)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762506263P 2017-05-15 2017-05-15
PCT/US2018/032188 WO2018213104A1 (en) 2017-05-15 2018-05-11 Analyzing a rock sample

Publications (1)

Publication Number Publication Date
SA519410245B1 true SA519410245B1 (ar) 2022-07-24

Family

ID=62713066

Family Applications (1)

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SA519410245A SA519410245B1 (ar) 2017-05-15 2019-10-03 تحليل عينة صخرية

Country Status (8)

Country Link
US (1) US10739326B2 (ar)
EP (1) EP3635392B1 (ar)
JP (1) JP2020519901A (ar)
CN (1) CN110662961B (ar)
CA (1) CA3058914A1 (ar)
MA (1) MA50347A (ar)
SA (1) SA519410245B1 (ar)
WO (1) WO2018213104A1 (ar)

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KR102178444B1 (ko) * 2018-12-19 2020-11-13 주식회사 포스코 미세 조직 분석 장치
US11371827B2 (en) * 2019-06-11 2022-06-28 Halliburton Energy Services, Inc. Multiple scale analysis of core sample to estimate surface roughness
CN111751394B (zh) * 2020-04-17 2021-08-27 山东大学 基于图像与xrf矿物反演的岩性识别方法及系统
CN111751512A (zh) * 2020-05-27 2020-10-09 中国石油天然气股份有限公司 一种白云岩或松散沉积物微生物成因确定方法
JP7500065B2 (ja) 2020-08-20 2024-06-17 国立研究開発法人産業技術総合研究所 鉱石分析のための情報処理方法及びシステム
CN111999325B (zh) * 2020-08-20 2023-07-25 合肥工业大学 一种基性岩中原位锆石的寻找方法
EP4024039B1 (en) * 2020-12-30 2023-10-25 FEI Company Data acquisition and processing techniques for three-dimensional reconstruction
US11584889B2 (en) * 2021-01-04 2023-02-21 Saudi Arabian Oil Company Synthetic source rock with tea
CN113049521B (zh) * 2021-03-29 2023-09-26 自然资源实物地质资料中心 识别碳酸盐岩的方法、装置及设备、存储介质
US11851610B2 (en) * 2021-12-14 2023-12-26 Saudi Arabian Oil Company Sequestration of carbon dioxide in organic-rich geological formations
CN115064011B (zh) * 2022-03-02 2024-08-09 上海广为电器工具有限公司 元素周期展示系统以及展示方法
CN114486962B (zh) * 2022-04-01 2022-06-14 中国科学院地质与地球物理研究所 复杂成分样品含轻元素矿物的定量识别方法、系统和设备
CN116087249B (zh) * 2023-04-10 2023-06-30 中国科学院地质与地球物理研究所 一种用于识别矿物分布和含量的方法、系统和电子设备

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JP3697549B2 (ja) * 1999-02-15 2005-09-21 日本電子株式会社 粒子線装置における試料物質同定装置
US6140643A (en) 1999-03-09 2000-10-31 Exxonmobil Upstream Research Company Method for identification of unknown substances
US8101907B2 (en) 2006-04-19 2012-01-24 Baker Hughes Incorporated Methods for quantitative lithological and mineralogical evaluation of subsurface formations
US8676556B2 (en) * 2007-11-27 2014-03-18 Exxonmobil Upstream Research Company Method for determining the properties of hydrocarbon reservoirs from geophysical data
US8170799B2 (en) * 2008-11-24 2012-05-01 Ingrain, Inc. Method for determining in-situ relationships between physical properties of a porous medium from a sample thereof
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WO2013169973A1 (en) * 2012-05-11 2013-11-14 Ingrain, Inc. A method and system for multi-energy computer tomographic cuttings analysis
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Also Published As

Publication number Publication date
EP3635392B1 (en) 2022-07-06
CA3058914A1 (en) 2018-11-22
JP2020519901A (ja) 2020-07-02
EP3635392A1 (en) 2020-04-15
CN110662961A (zh) 2020-01-07
CN110662961B (zh) 2022-06-03
MA50347A (fr) 2020-08-19
WO2018213104A1 (en) 2018-11-22
US10739326B2 (en) 2020-08-11
US20180328905A1 (en) 2018-11-15

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