RU94025312A - Charged particles spectrometer - Google Patents

Charged particles spectrometer

Info

Publication number
RU94025312A
RU94025312A RU94025312/07A RU94025312A RU94025312A RU 94025312 A RU94025312 A RU 94025312A RU 94025312/07 A RU94025312/07 A RU 94025312/07A RU 94025312 A RU94025312 A RU 94025312A RU 94025312 A RU94025312 A RU 94025312A
Authority
RU
Russia
Prior art keywords
axis
plane
diaphragms
emission
cones
Prior art date
Application number
RU94025312/07A
Other languages
Russian (ru)
Other versions
RU2076387C1 (en
Inventor
Ю.К. Голиков
С.Н. Давыдов
В.В. Кораблев
Н.К. Краснова
Ю.А. Кудинов
Original Assignee
Санкт-Петербургский государственный технический университет
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Санкт-Петербургский государственный технический университет filed Critical Санкт-Петербургский государственный технический университет
Priority to RU94025312A priority Critical patent/RU2076387C1/en
Publication of RU94025312A publication Critical patent/RU94025312A/en
Application granted granted Critical
Publication of RU2076387C1 publication Critical patent/RU2076387C1/en

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

FIELD: electronic and ionic spectroscopy of surface of solids and gases. SUBSTANCE: spectrometer uses an axisymmetric energy analyzer of the "electrostatic mirror" type with Z-axis of symmetry, plane position-sensitive detector located perpendicularly to the Z-axis, and a specimen, whose center of emission region is on the Z-axis. The field-setting electrodes look like two electrically insulated from each other coaxial circular tapered surfaces with a common vertex. The inlet and outlet annular diaphragms are cut out in the inner electrode so that their boundaries are located in planes perpendicular to the Z-axis. The inlet diaphragm is narrower than the outlet one and positioned closer to the common vertex of the cones. The center of the emission source is positioned on the axis, in the middle plane of the inlet diaphragm. The sensing surface of the position- sensitive detector is located farther from the cones vertex than any of the diaphragms, on the same side of the Z-axis as these diaphragms. The device makes it possible to simultaneously indicate the spectra of emission of particles flying from the source in any direction near a definite plane perpendicular to the Z-axis. It will provide, for example, for examining of the relationship betweenenergy of electron and its wave vector near the selected crystallographic plane simultaneously in all directions lying in this plane, and energy δE. in the final range. At instrument dimensions of about 700 mm, emission source diameter of 0.35 mm, resolution 0,08%≲ΔE/E≲0,13% in range 2%≲δE/E≲3,5%.. EFFECT: enhanced accuracy.

Claims (1)

Изобретение относится к области электронной и ионной спектроскопии поверхности твердых тел, а также газов. Спектрометр состоит из осесимметричного энергоанализатора типа "электростатического зеркала" с осью симметрии Z, плоского позиционно-чувствительного детектора (ПЧД), расположенного перпендикулярно оси Z, и образца, центр области эмиссии которого находится на оси Z. Полезадающие электроды имеют вид двух электрически изолированных друг от друга соосных круговых конических поверхностей с общей вершиной. Входная и выходная кольцевая диафрагмы вырезаны во внутреннем электроде так, что границы их располагаются в плоскостях, перпендикулярных оси Z. Входная диафрагма уже, чем выходная и расположена ближе к общей вершине конусов. Центр источника эмиссии находится на оси, в средней плоскости входной диафрагмы. Воспринимающая поверхность ПЧД находится дальше от вершины конусов, чем любая из диафрагм, с той же стороны оси Z , что и эти диафрагмы. Устройство позволяет одновременно регистрировать спектры эмиссии частиц, летящих из источника в любом направлении вблизи определенной плоскости, перпендикулярной оси Z. Это позволит, например, исследовать зависимость Е(
Figure 00000001
) энергии электрона от его волнового вектора вблизи выбранной кристаллографической плоскости одновременно по всем направлениям, лежащим в этой плоскости, и в конечном диапазоне энергий δE.. При размерах прибора около 700 мм, диаметре источника эмиссии 0,35 мм разрешение 0,08%< 0,08%≲ΔE/E≲0,13% < 0,13% в диапазоне 2%< 2%≲δE/E≲3,5%. <3,5%.
The invention relates to the field of electronic and ion spectroscopy of the surface of solids, as well as gases. The spectrometer consists of an axisymmetric energy analyzer of the "electrostatic mirror" type with an axis of symmetry Z, a flat position-sensitive detector (PSD) located perpendicular to the Z axis, and a sample whose center of the emission region is on the Z axis. The dropping electrodes are two electrically isolated from each other friend coaxial circular conical surfaces with a common vertex. The input and output annular diaphragms are cut in the inner electrode so that their boundaries are located in planes perpendicular to the Z axis. The input diaphragm is narrower than the output diaphragm and is closer to the common top of the cones. The center of the emission source is on the axis, in the middle plane of the input diaphragm. The sensing surface of the PCB is located farther from the top of the cones than either of the diaphragms, on the same side of the Z axis as these diaphragms. The device allows you to simultaneously record the emission spectra of particles flying from the source in any direction near a certain plane perpendicular to the Z axis. This will allow, for example, to study the dependence E (
Figure 00000001
) the electron energy from its wave vector near the selected crystallographic plane simultaneously in all directions lying in this plane and in the final energy range δE .. With the dimensions of the device about 700 mm, the diameter of the emission source 0.35 mm, the resolution is 0.08% <0 , 08% ≲ΔE / E≲0.13% <0.13% in the range of 2% <2% ≲δE / E≲3.5%. <3.5%.
RU94025312A 1994-07-06 1994-07-06 Charged-particle spectrometer RU2076387C1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
RU94025312A RU2076387C1 (en) 1994-07-06 1994-07-06 Charged-particle spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
RU94025312A RU2076387C1 (en) 1994-07-06 1994-07-06 Charged-particle spectrometer

Publications (2)

Publication Number Publication Date
RU94025312A true RU94025312A (en) 1996-05-27
RU2076387C1 RU2076387C1 (en) 1997-03-27

Family

ID=20158133

Family Applications (1)

Application Number Title Priority Date Filing Date
RU94025312A RU2076387C1 (en) 1994-07-06 1994-07-06 Charged-particle spectrometer

Country Status (1)

Country Link
RU (1) RU2076387C1 (en)

Also Published As

Publication number Publication date
RU2076387C1 (en) 1997-03-27

Similar Documents

Publication Publication Date Title
US5596136A (en) Radial differential mobility analyzer
US5420424A (en) Ion mobility spectrometer
US8278622B2 (en) Method and apparatus to accurately discriminate gas phase ions with several filtering devices in tandem
US20050045832A1 (en) Non-dispersive charged particle energy analyzer
WO2014202632A1 (en) A method for obtaining aerosol particle size distributions
JP2002506201A (en) Atmospheric particle analyzer
US3280326A (en) Mass filter with sheet electrodes on each side of the analyzer rod that intersect on the ion beam axis
RU94025312A (en) Charged particles spectrometer
DE59409371D1 (en) Time-of-flight mass spectrometer with gas phase ion source, with high sensitivity and large dynamic range
JPS60135846A (en) Secondary ion mass spectrometer
JPH07325020A (en) Sample introducing apparatus for ion analytical instrument
SU1755333A1 (en) Simultaneous analysis negative and positive ions mass- spectrometer
EP0372750A1 (en) Gas separator
SU683516A1 (en) Electrostatic charged particle analyzer
JPS6240150A (en) Flight-time-type mas spectrometer
RU1800319C (en) Method of disperse analyzing particles of suspension and device for realization
SU591107A1 (en) Energy analyzer with electrostatic mirror
RU2235386C2 (en) Dust-impact mass-spectrometer
JPH0210646A (en) Charged particle energy analyzer
SU175584A1 (en) ANALYZER OF CHARGED PARTICLES BY KINETIC ENERGY
RU2448389C2 (en) Electrostatic energy analyser with angular resolution
SU1191981A1 (en) Ion microanalyzer
JPH02145947A (en) Ion scattering spectroscope
SU1714720A1 (en) Method for adjustment of electrostatic sector power analyzer
SU1265890A2 (en) Energy mass analyzer