RU94025312A - Charged particles spectrometer - Google Patents
Charged particles spectrometerInfo
- Publication number
- RU94025312A RU94025312A RU94025312/07A RU94025312A RU94025312A RU 94025312 A RU94025312 A RU 94025312A RU 94025312/07 A RU94025312/07 A RU 94025312/07A RU 94025312 A RU94025312 A RU 94025312A RU 94025312 A RU94025312 A RU 94025312A
- Authority
- RU
- Russia
- Prior art keywords
- axis
- plane
- diaphragms
- emission
- cones
- Prior art date
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
FIELD: electronic and ionic spectroscopy of surface of solids and gases. SUBSTANCE: spectrometer uses an axisymmetric energy analyzer of the "electrostatic mirror" type with Z-axis of symmetry, plane position-sensitive detector located perpendicularly to the Z-axis, and a specimen, whose center of emission region is on the Z-axis. The field-setting electrodes look like two electrically insulated from each other coaxial circular tapered surfaces with a common vertex. The inlet and outlet annular diaphragms are cut out in the inner electrode so that their boundaries are located in planes perpendicular to the Z-axis. The inlet diaphragm is narrower than the outlet one and positioned closer to the common vertex of the cones. The center of the emission source is positioned on the axis, in the middle plane of the inlet diaphragm. The sensing surface of the position- sensitive detector is located farther from the cones vertex than any of the diaphragms, on the same side of the Z-axis as these diaphragms. The device makes it possible to simultaneously indicate the spectra of emission of particles flying from the source in any direction near a definite plane perpendicular to the Z-axis. It will provide, for example, for examining of the relationship betweenenergy of electron and its wave vector near the selected crystallographic plane simultaneously in all directions lying in this plane, and energy δE. in the final range. At instrument dimensions of about 700 mm, emission source diameter of 0.35 mm, resolution 0,08%≲ΔE/E≲0,13% in range 2%≲δE/E≲3,5%.. EFFECT: enhanced accuracy.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU94025312A RU2076387C1 (en) | 1994-07-06 | 1994-07-06 | Charged-particle spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU94025312A RU2076387C1 (en) | 1994-07-06 | 1994-07-06 | Charged-particle spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
RU94025312A true RU94025312A (en) | 1996-05-27 |
RU2076387C1 RU2076387C1 (en) | 1997-03-27 |
Family
ID=20158133
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
RU94025312A RU2076387C1 (en) | 1994-07-06 | 1994-07-06 | Charged-particle spectrometer |
Country Status (1)
Country | Link |
---|---|
RU (1) | RU2076387C1 (en) |
-
1994
- 1994-07-06 RU RU94025312A patent/RU2076387C1/en active
Also Published As
Publication number | Publication date |
---|---|
RU2076387C1 (en) | 1997-03-27 |
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