RU2005108112A - METHOD OF TESTING FOR LAYER-BASED CHIPPING - Google Patents

METHOD OF TESTING FOR LAYER-BASED CHIPPING Download PDF

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Publication number
RU2005108112A
RU2005108112A RU2005108112/28A RU2005108112A RU2005108112A RU 2005108112 A RU2005108112 A RU 2005108112A RU 2005108112/28 A RU2005108112/28 A RU 2005108112/28A RU 2005108112 A RU2005108112 A RU 2005108112A RU 2005108112 A RU2005108112 A RU 2005108112A
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RU
Russia
Prior art keywords
supports
sample
load
chipped
testing
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RU2005108112/28A
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Russian (ru)
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RU2287147C1 (en
Inventor
Владимир Викторович Бредихин (RU)
Владимир Викторович Бредихин
Александр Леонидович Токмаков (RU)
Александр Леонидович Токмаков
Юли Николаевна Токмакова (RU)
Юлия Николаевна Токмакова
Original Assignee
Государственное образовательное учреждение высшего профессионального образовани "Курский государственный технический университет" (RU)
Государственное образовательное учреждение высшего профессионального образования "Курский государственный технический университет"
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Priority to RU2005108112/28A priority Critical patent/RU2287147C1/en
Publication of RU2005108112A publication Critical patent/RU2005108112A/en
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Claims (1)

Способ испытаний на послойное скалывание, включающий закрепление образца, приложение нагрузки и определение предела прочности по математической формуле, отличающийся тем, что закрепление образца осуществляют на двух опорах, нагрузку прикладывают в середине пролета между опорами соосно со скалываемой частью контрольного образца, причем расстояние между опорами соотносится с размером скалываемой частиA layered shear test method, including fixing the sample, applying a load and determining the tensile strength using a mathematical formula, characterized in that the fixing of the sample is carried out on two supports, the load is applied in the middle of the span between the supports coaxially with the part of the control specimen being chipped, and the distance between the supports is related with the size of the chipped part L1=1,1·L2,L 1 = 1.1 · L 2 , где L1 - расстояние между опорами;where L 1 is the distance between the supports; L2 - размер скалываемой части контрольного образца,L 2 - the size of the chipped part of the control sample, а предел прочности на послойное скалывание определяют по математической формулеand the tensile shear strength is determined by the mathematical formula
Figure 00000001
,
Figure 00000001
, где τ - предел прочности на послойное скалывание;where τ is the ultimate tensile strength; Р - разрушающая нагрузка;P is the breaking load; F - площадь поперечного сечения контрольного образца.F is the cross-sectional area of the control sample.
RU2005108112/28A 2005-03-22 2005-03-22 Method for testing layer-wise chipping RU2287147C1 (en)

Priority Applications (1)

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RU2005108112/28A RU2287147C1 (en) 2005-03-22 2005-03-22 Method for testing layer-wise chipping

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RU2005108112/28A RU2287147C1 (en) 2005-03-22 2005-03-22 Method for testing layer-wise chipping

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RU2005108112A true RU2005108112A (en) 2006-09-10
RU2287147C1 RU2287147C1 (en) 2006-11-10

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Publication number Priority date Publication date Assignee Title
RU2721831C1 (en) * 2019-11-13 2020-05-22 Федеральное государственное бюджетное образовательное учреждение высшего образования "Юго-Западный государственный университет" (ЮЗГУ) Device for testing for layer-by-layer chipping

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