RU1788476C - Electric signal spectrum analyzer - Google Patents

Abstract

The invention relates to techniques for analyzing electrical signals. The purpose of the invention is to increase the spectrum width of the analyzed frequencies. The analyzer contains a laser radiation source 1, a light beam former 2, a prism 3, a film of .2 ka 4 magneto-optical material is deposited on its reflecting face, an analyzer 5, a Fourier lens 6, a photorecorder 7, a magnetic tape 8 with recording and drawing blocks 9 and 10 . A broadening of the range of analyzed frequencies is achieved with the following relations between the angle of incidence /) of the light incidence, the film thickness t, the refractive index gm2, the period of the waveform and the coefficient of light absorption, .2ot h Ф exp (- -------) ----- i 1 - Ш2 - 1 - tg2 (and the minimum period d of the signalogram and the angle of incidence p of light are related by the relation m 2 Sin (f) m Jt f 2, 1 1 - GP2 (Sin (f) + - -t Siny5COS /) where m is an integer. 1 ill. m + 1 ate

Description

The invention relates to techniques for analyzing electrical signals.

The purpose of the invention is to increase the spectrum width of the analyzed frequencies.

The drawing shows a structural diagram of the device.

The device comprises a laser radiation source 1, a light beam former 2, a prism 3, on the reflective face of which a film 4 of magneto-optical material (MOM) is applied, an analyzer 5, a Fourier lens b, a photorecorder 7, a magnetic tape 8 with recording units 9 and 10 and prot LCDs.

The device operates as follows.

The test signal is recorded on the magnetic tape 8. The pull unit 10 draws a magnetic tape with a signalogram under the MOM film. The scattering field of the waveform induces in the MOM film a magnetization structure similar to the waveform. The light of the laser source 1 is expanded by the shaper 2 and passing through a prism 3 illuminates the MOM film 4, where it diffracts on the induced magnetization structure. The diffracted rays interfere in the MOM and the rays corresponding to the maximum frequency response are attenuated, and due to this, the frequency response of the device is aligned. Zero-order rays extend at angles corresponding to light bands of equal slope. The diffracted rays pass through the polarizer 5 and the Fourier lens and form the spectrum of the electric signal in the focal plane of the Fourier lens. The photorecorder 7 reads the electrical signal and transfers it to the electrical path.

The essence of the proposal is that the MOM film has a new property of pursuing relationships between the angle of incidence p of the light, the thickness t of the MOM, the refractive index ni2, the period of the waveform and the light absorption coefficient a:

exp (-.

2sh

Jl

1 - n22 ni2 - 1 -

1 - n22 sin2y

m

2a

- n22 (+ --- t

m + 1

Claims (1)

Such conditions make it possible to equalize the amplitude-frequency characteristic and expand the range of frequencies being analyzed. SUMMARY OF THE INVENTION An electric signal spectrum analyzer consisting of a laser radiation source, a radiation beam shaper, a total internal reflection prism, with a reflective face of which is a film of magneto-optical material, a polarizer, a Fourier lens and a photographic recorder located in series in the direction of the light beam a photorecorder in the focal plane of the Fourier lens, a magnetic tape with a pull unit and a recording unit in contact with a film of magneto-optical material and wherein. that, in order to expand the range of the analyzed frequencies, the spectrum analyzer is made with an angle of incidence p of light, a film thickness t, a relative refractive index Ш2 of the light during the substrate-film transition, a coefficient and light absorption associated with the ratio: exp (2 "t  - P22 P12 - 1 - tg / v nvj the minimum period d of the waveform and the angle p of incidence of light are related by the relation: 1 - n22 sin ties  9 7 2 1 - rife (sin p + --- t sltvpcosip - D yyy + T where m is an integer the polarization of light lies in the plane of incidence of light.