RU1775682C - Analyzer of electric signal spectrum - Google Patents

Abstract

The invention relates to techniques for analyzing electrical signals. The purpose of the invention is to expand the range of the analyzed frequencies and increase the accuracy of measurement. The analyzer contains a laser light source (1), a shaper 2 of the light beam, a prism 3 of total internal reflection, on the reflective face of which a film 4 of magneto-optical material (MOM) is located, a polarizer 5, a Fourier lens 6 and a photorecorder 7 located in series along the beam Sveta. A wear-resistant coating 11 is applied to the MOM, the thickness of which satisfies the condition d (pb) - 6 (p - c} 2U2Urnert Acos (J + 0) Acos (-0) Ae is the light propagation angle in the coating, 0 is the diffraction angle, L is the thickness coating, d - phase shift at full internal reflection. 1 ill. E VJ VI (L WITH СО N3

Description

The invention relates to techniques for analyzing the spectrum of electrical signals.

The purpose of the invention is to expand the range of frequencies being analyzed and to increase the measurement accuracy.

The drawing shows a structural diagram of the device.

The analyzer contains a laser light source 1, a shaper 2 of the light beam, a prism 3, on the reflective side of which a film 4 of magneto-optical material (MOM) is applied, an analyzer 5, a Fourier lens 6, a photorecorder 7, a magnetic tape 8 with recording blocks 9 and 10 and prot LCDs and wear-resistant dielectric coating 11.

The device operates as follows.

The test signal is recorded on the magnetic tape. The pull unit 10 draws a magnetic tape with a signalogram under the MOM film. The scattering field of the waveforms induces a magnetization structure in the MOM film similar to that of (p + c) -d ((p-0)

2U2Ln

Acos (fp + 0) I cos (rv)

ABOUT

where p is the angle of propagation of light,

b - phase jump at full internal reflection,

b is the diffraction angle, 10 L is the coating thickness, A is the wavelength of light, and l is the refractive index. In this case, due to the phase shift in the wear-resistant layer, the change in the 15 frequency response due to this shift is compensated, and due to this, the range of the analyzed frequencies is expanded and the measurement accuracy is increased.

Claims (1)

20 Claims The spectrum analyzer of electrical signals, consisting of a laser source, a beam shaper, a prism of total internal reflection, on ramme. ) There is a laser source of 1 wide- 25 reflecting face which is located It shifts through former 2 and passes through prism 3 and illuminates the 4 MOM film, where it diffracts on the induced magnetization structure. The diffracted rays fall into the wear-resistant coating 11. Due to the fact that the rays propagate at different angles, a phase difference arises between them. After complete internal reflection and passage of coating 11 to a film of magneto-optical material, a polarizer, a Fourier lens and a photographic recorder arranged in series in the direction of the light beam, a photographic recorder in the objective plane of the lens, a magnetic tape with a pulling and recording unit in contact with the film, characterized in that In order to expand the range of analyzed frequencies and increase the sharpened film of magneto-optical material, a polarizer, a Fourier lens and a photographic recorder located in series along the light beam, the photographic recorder is in a 30 a beam, a magnetic tape with a pulling and recording unit in contact with the film, characterized in that, in order to expand the range of the analyzed frequencies and increase the exact opposite direction, the light rays are again in the measurement direction, the prism contains additional elements in the MOM and diffracts . The rays diffracted after the first and second pass of the MOM interfere. Since the phase difference arising from total internal reflection is compensated by the dielectric, the beam amplitudes add up and energy transfer between the diffraction orders ceases, as a result of which the frequency response is equalized. After this, the diffracted rays exit 45 from the prism 3, the analyzer 5 passes through the Fourier lens 6, and an electric signal spectrum is formed in its focal plane. Photoregulator 7 reads the spectrum. fifty The thickness of the dielectric coating must satisfy the condition Compiled by A. Orlov Editor Tehred M. Morgenthal a clearly transparent wear-resistant coating deposited on a film of a magneto-optical material, the thickness of which satisfies the condition a (p + 0) -d (p-c) 2 U2 U A cos ((p + c) A cos (p- c) where is the angle of light propagation; b - phase jump at full internal reflection; in - diffraction angle; L is the thickness of the coating; A is the wavelength of light; n is the refractive index. Proofreader N. Tupytsa d (p + c) -d ((p-0) 2U2Ln Acos (fp + 0) I cos (rv) where p is the angle of propagation of light, b - phase jump at full internal reflection, b is the diffraction angle, L is the coating thickness, A is the wavelength of light, and l is the refractive index. In this case, due to the phase shift in the wear-resistant layer, the change in frequency response due to this shift is compensated, and due to this, the range of analyzed frequencies is expanded and the measurement accuracy is increased. The claims The spectrum analyzer of electrical signals, consisting of a laser source, a beam shaper, a prism of total internal reflection, on the reflecting face of which is located a film of a magneto-optical material, a polarizer, a Fourier lens and a photographic recorder arranged sequentially in the direction of the light beam, a photographic recorder in the focal plane of the lens, a magnetic tape with a pulling and recording unit in contact with the film, characterized in that, for the purpose of expanding the range of analyzed frequencies and increasing the accuracy of measurement, the prism contains additional measurement, the prism contains additional at a clearly transparent wear-resistant coating deposited on a film of a magneto-optical material, the thickness of which satisfies the condition a (p + 0) -d (p-c) 2 U2 U A cos ((p + c) A cos (p- c) where is the angle of light propagation; b - phase jump at full internal reflection; in - diffraction angle; L is the thickness of the coating; A is the wavelength of light; n is the refractive index. Proofreader N. Tupytsa