RU1455909C - Device for parameter testing - Google Patents
Device for parameter testingInfo
- Publication number
- RU1455909C RU1455909C SU4258969A RU1455909C RU 1455909 C RU1455909 C RU 1455909C SU 4258969 A SU4258969 A SU 4258969A RU 1455909 C RU1455909 C RU 1455909C
- Authority
- RU
- Russia
- Prior art keywords
- monitoring
- self
- voltage
- increased
- elements
- Prior art date
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Изобретение относитс к автоматике и может быть использовано при допусковом и параметрическом контроле аналоговых сигналов. Цель изобретени - повышение достоверности контрол . Устройство содержит коммутаторы 2 и 11, преобразователь напр жени 3, блок сравнени 4, элемент запрета 5, задатчик 8 времени самоконтрол , элементы И 9, 21, 23, элемент задержки 10, источники рабочего 12 и контрольного 13 опорных напр жений, индикаторы 14 предельного отклонени и самоконтрол 15, источник 16 эталонного напр жени , делитель 17 напр жени , ключ 18, формирователи 19 и 28 импульсов, триггеры 20 и 25, элемент НЕ 22, элементы ИЛИ 24 и 27, сигнализатор неисправности 26, регистратор 29, задатчик 36 опорного напр жени . Повышена помехозащищенность устройства при контроле и увеличена точность измерени . 1 з.п. ф-лы, 3 ил.The invention relates to automation and can be used for tolerance and parametric control of analog signals. The purpose of the invention is to increase the reliability of control. The device comprises switches 2 and 11, a voltage converter 3, a comparison unit 4, a prohibition element 5, a self-monitoring time setter 8, elements 9, 21, 23, a delay element 10, operating sources 12 and a reference 13 of the reference voltage, limit indicators 14 deviations and self-monitoring 15, a source of reference voltage 16, a voltage divider 17, a key 18, pulse shapers 19 and 28, triggers 20 and 25, an element NOT 22, elements OR 24 and 27, a fault indicator 26, a recorder 29, a reference switch 36 for example The noise immunity of the device during monitoring is increased and the measurement accuracy is increased. 1 s.p. f-ly, 3 ill.
Description
tfttft
f f
J J
CtiSHOfi HO f-ff Sxiids CtiSHOfi HO f-ff Sxiids
Фуе.гFue.g
сравнени comparison
Сиг нал т /-// Сходе блока сравнени Signal t / - // Compare block
3 « isfff tj3 "isfff tj
СигноА но f-ff входе блока iSignal but f-ff input block i
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU4258969 RU1455909C (en) | 1987-04-13 | 1987-04-13 | Device for parameter testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU4258969 RU1455909C (en) | 1987-04-13 | 1987-04-13 | Device for parameter testing |
Publications (1)
Publication Number | Publication Date |
---|---|
RU1455909C true RU1455909C (en) | 1993-11-15 |
Family
ID=21309676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU4258969 RU1455909C (en) | 1987-04-13 | 1987-04-13 | Device for parameter testing |
Country Status (1)
Country | Link |
---|---|
RU (1) | RU1455909C (en) |
-
1987
- 1987-04-13 RU SU4258969 patent/RU1455909C/en active
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