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Application filed by Institutul Politehnic "Traian Vuia"filedCriticalInstitutul Politehnic "Traian Vuia"
Priority to RO119655ApriorityCriticalpatent/RO93147B1/ro
Publication of RO93147A2publicationCriticalpatent/RO93147A2/fr
Publication of RO93147B1publicationCriticalpatent/RO93147B1/ro
A method for determining charged energy states of semiconductor or insulator materials by using deep level transient spectroscopy, and an apparatus for carrying out the method