PT3156760T - Dispositivo sensor e método para a inspeção de superfície de um espaço oco cilíndrico - Google Patents

Dispositivo sensor e método para a inspeção de superfície de um espaço oco cilíndrico

Info

Publication number
PT3156760T
PT3156760T PT151898129T PT15189812T PT3156760T PT 3156760 T PT3156760 T PT 3156760T PT 151898129 T PT151898129 T PT 151898129T PT 15189812 T PT15189812 T PT 15189812T PT 3156760 T PT3156760 T PT 3156760T
Authority
PT
Portugal
Prior art keywords
sensor device
cylindrical cavity
surface inspection
inspection
cavity
Prior art date
Application number
PT151898129T
Other languages
English (en)
Inventor
Ullrich Wolfgang Dr
Janetzki Wolfgang
Klinger Philip
Bader Florian
Original Assignee
Sturm Maschinen & Anlagenbau Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sturm Maschinen & Anlagenbau Gmbh filed Critical Sturm Maschinen & Anlagenbau Gmbh
Publication of PT3156760T publication Critical patent/PT3156760T/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/08Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • G01N2021/9542Inspecting the inner surface of hollow bodies, e.g. bores using a probe
    • G01N2021/9544Inspecting the inner surface of hollow bodies, e.g. bores using a probe with emitter and receiver on the probe
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • G01N2021/9548Scanning the interior of a cylinder
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PT151898129T 2015-10-14 2015-10-14 Dispositivo sensor e método para a inspeção de superfície de um espaço oco cilíndrico PT3156760T (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP15189812.9A EP3156760B1 (de) 2015-10-14 2015-10-14 Sensorvorrichtung und verfahren zur oberflächenuntersuchung eines zylindrischen hohlraums

Publications (1)

Publication Number Publication Date
PT3156760T true PT3156760T (pt) 2019-10-11

Family

ID=54330626

Family Applications (1)

Application Number Title Priority Date Filing Date
PT151898129T PT3156760T (pt) 2015-10-14 2015-10-14 Dispositivo sensor e método para a inspeção de superfície de um espaço oco cilíndrico

Country Status (11)

Country Link
US (1) US10551176B2 (pt)
EP (1) EP3156760B1 (pt)
JP (1) JP6840747B2 (pt)
KR (1) KR102087758B1 (pt)
CN (1) CN108351198B (pt)
ES (1) ES2747305T3 (pt)
HU (1) HUE045623T2 (pt)
PL (1) PL3156760T3 (pt)
PT (1) PT3156760T (pt)
SI (1) SI3156760T1 (pt)
WO (1) WO2017063935A1 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HUE036369T2 (hu) * 2015-01-20 2018-07-30 Sturm Maschinen & Anlagenbau Gmbh Vizsgálóberendezés és eljárás egy üreges test vizsgálatára
EP3759428A4 (en) 2018-02-28 2022-04-20 DWFritz Automation, Inc. METROLOGY SYSTEM
CN109631710A (zh) * 2019-01-08 2019-04-16 京东方科技集团股份有限公司 游标卡尺、距离测量方法及存储介质
CN110779449B (zh) * 2019-11-04 2021-03-19 辽宁工程技术大学 一种圆柱体设备径向偏移监测报警装置
CN111366102B (zh) * 2020-04-22 2022-07-26 山东省科学院激光研究所 一种折射式彩色共焦测量内孔表面形貌的测头结构

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19714202A1 (de) * 1997-04-07 1998-10-15 Bosch Gmbh Robert Vorrichtung zum optischen Prüfen von Oberflächen
DE19930688A1 (de) * 1999-07-02 2001-01-04 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen
EP1754018B1 (de) * 2004-06-08 2018-07-11 Micro-Epsilon Messtechnik GmbH & Co. KG Vorrichtung und verfahren zum prüfen von oberflächen im inneren von löchern
DE102005059550A1 (de) * 2005-12-13 2007-06-14 Siemens Ag Optische Messvorrichtung zum Vermessen eines Hohlraums
DE102005062130A1 (de) * 2005-12-23 2007-06-28 Isis Sentronics Gmbh Abtastsystem zum Abtasten einer Objektoberfläche, insbesondere für eine Koordinaten-Meßmaschine
DE102008050259A1 (de) * 2008-10-07 2010-04-08 Fionec Gmbh Optische Sonde (II)
CN101382422A (zh) * 2008-10-16 2009-03-11 上海交通大学 管形零件内轮廓自动检测系统
DE102012204498A1 (de) * 2012-03-21 2013-09-26 Ibak Helmut Hunger Gmbh & Co. Kg Kanalrohrinspektionsvorrichtung und Verfahren zum Inspizieren von Kanalrohren
JP6274732B2 (ja) * 2013-02-12 2018-02-07 三菱電機株式会社 面形状測定装置及び面形状測定方法
DE102013003640B4 (de) * 2013-03-05 2016-08-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Berührungslose Erfassung zumindest der innenliegenden Geometrieen eines Objekts mittels elektromagnetischer Strahlung
DE102014201531A1 (de) * 2014-01-28 2015-07-30 Bayerische Motoren Werke Aktiengesellschaft Vorrichtung und Verfahren zum optischen Vermessen einer Zylinderlauffläche
US11493454B2 (en) * 2015-11-13 2022-11-08 Cognex Corporation System and method for detecting defects on a specular surface with a vision system

Also Published As

Publication number Publication date
CN108351198B (zh) 2020-04-14
PL3156760T3 (pl) 2020-03-31
CN108351198A (zh) 2018-07-31
EP3156760B1 (de) 2019-07-10
WO2017063935A1 (de) 2017-04-20
ES2747305T3 (es) 2020-03-10
JP2018535407A (ja) 2018-11-29
KR102087758B1 (ko) 2020-03-11
US20180299261A1 (en) 2018-10-18
SI3156760T1 (sl) 2019-10-30
US10551176B2 (en) 2020-02-04
KR20180093891A (ko) 2018-08-22
HUE045623T2 (hu) 2020-01-28
JP6840747B2 (ja) 2021-03-10
EP3156760A1 (de) 2017-04-19

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