PT2889574T - Dispositivo de inspecção de espessura - Google Patents

Dispositivo de inspecção de espessura

Info

Publication number
PT2889574T
PT2889574T PT138419429T PT13841942T PT2889574T PT 2889574 T PT2889574 T PT 2889574T PT 138419429 T PT138419429 T PT 138419429T PT 13841942 T PT13841942 T PT 13841942T PT 2889574 T PT2889574 T PT 2889574T
Authority
PT
Portugal
Prior art keywords
inspection device
thickness inspection
thickness
inspection
Prior art date
Application number
PT138419429T
Other languages
English (en)
Inventor
tanaka Naohiro
Tambo Goro
Original Assignee
Nihon Yamamura Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Yamamura Glass Co Ltd filed Critical Nihon Yamamura Glass Co Ltd
Publication of PT2889574T publication Critical patent/PT2889574T/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/08Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
    • G01B7/087Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring of objects while moving
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/221Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
PT138419429T 2012-09-28 2013-09-24 Dispositivo de inspecção de espessura PT2889574T (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012217308 2012-09-28

Publications (1)

Publication Number Publication Date
PT2889574T true PT2889574T (pt) 2017-05-25

Family

ID=50388183

Family Applications (1)

Application Number Title Priority Date Filing Date
PT138419429T PT2889574T (pt) 2012-09-28 2013-09-24 Dispositivo de inspecção de espessura

Country Status (8)

Country Link
US (1) US9341461B2 (pt)
EP (1) EP2889574B1 (pt)
JP (1) JP5718485B2 (pt)
CN (1) CN104685315B (pt)
ES (1) ES2626454T3 (pt)
PL (1) PL2889574T3 (pt)
PT (1) PT2889574T (pt)
WO (1) WO2014050782A1 (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3249345A4 (en) * 2015-01-21 2018-07-18 Nihon Yamamura Glass Co., Ltd. Container wall thickness inspection device
DE102015118232B4 (de) * 2015-10-26 2023-09-14 Truedyne Sensors AG System und Verfahren zum Überwachen eines Kanals, insbesondere eines MEMS-Kanals
CN107677199A (zh) * 2017-08-10 2018-02-09 江苏潮华玻璃制品有限公司 一种瓶体长度电子自动测量装置
US10466576B2 (en) * 2017-10-20 2019-11-05 Himax Technologies Limited Method for controlling projector and associated electronic device

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4820972A (en) * 1987-07-02 1989-04-11 Emhart Industries, Inc. Wall thickness detector
US5139406A (en) * 1987-12-16 1992-08-18 Dai Nippon Insatsu Kabushiki Kaisha Apparatus and system for inspecting wall thickness of synthetic resin containers
US4870342A (en) * 1988-10-05 1989-09-26 Emhart Industries, Inc. Glass container wall thickness inspecting machine
US5097216A (en) * 1990-10-09 1992-03-17 Agr International, Inc. Apparatus for inspecting the wall thickness of a container and corresponding method
US5558233A (en) 1994-10-27 1996-09-24 Agr International, Inc. Container inspection apparatus for determining the wall thickness of non-round containers and associated method
JPH11108608A (ja) * 1997-10-03 1999-04-23 Toppan Printing Co Ltd 誘電体の膜厚測定方法及びその装置
JP3416084B2 (ja) * 1999-09-13 2003-06-16 日本山村硝子株式会社 瓶の肉厚検査装置
EP1720135A1 (de) * 2005-05-06 2006-11-08 BEB Industrie-Elektronik AG Einrichtung zum Feststellen von Dicken und Dickenvariationen
US7877888B2 (en) * 2007-10-25 2011-02-01 General Electric Company System and method for measuring installation dimensions for flow measurement system

Also Published As

Publication number Publication date
JPWO2014050782A1 (ja) 2016-08-22
EP2889574A4 (en) 2016-06-01
CN104685315A (zh) 2015-06-03
WO2014050782A1 (ja) 2014-04-03
ES2626454T3 (es) 2017-07-25
US20150276370A1 (en) 2015-10-01
CN104685315B (zh) 2017-05-03
US9341461B2 (en) 2016-05-17
EP2889574B1 (en) 2017-04-05
JP5718485B2 (ja) 2015-05-13
EP2889574A1 (en) 2015-07-01
PL2889574T3 (pl) 2017-09-29

Similar Documents

Publication Publication Date Title
IL236385A0 (en) Device context setting
EP2824465A4 (en) DEFECT DETECTION DEVICE
PL2930491T3 (pl) Urządzenie testowe
EP2803981A4 (en) X-RAY INSPECTION DEVICE
EP2642394A4 (en) TEST DEVICE
PL2930707T3 (pl) Urządzenie testowe
EP2873933A4 (en) HEAT / HEAT EXCHANGE / HEAT STORAGE DEVICE
EP2865610A4 (en) DOUBLE AEROSOL DEVICE
EP2940325A4 (en) MOVEMENT MANAGEMENT DEVICE
EP2850385A4 (en) Substrate REVIEW
GB2505776B (en) Visual inspection device
EP2859868A4 (en) FIBER STACKING DEVICE
EP2853378A4 (en) PLASTIC FILM THERMOSCELLING DEVICE
GB2507980B (en) Inspection arrangement
EP2835084A4 (en) WINDOW WIPER DEVICE
EP2857816A4 (en) DEVICE FOR MEASURING MECHANICAL QUANTITY
EP2881286A4 (en) DIRECTION INDICATION DEVICE
EP2924647A4 (en) drug inspection
EP2912430A4 (en) DEVICE
EP2886282A4 (en) REIFENVULKANISIERUNGSVORRICHTUNG
EP2866023A4 (en) INSPECTION DEVICE FOR DETECTING PIN HOLE IN METAL BOXES
EP2713144A4 (en) MEASURING DEVICE
EP2881284A4 (en) DIRECTION DEVICE
EP2889574A4 (en) DICK TEST DEVICE
EP2857865A4 (en) AKTINOGRAFIEVORRICHTUNG