PL445397A1 - Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer - Google Patents

Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer

Info

Publication number
PL445397A1
PL445397A1 PL445397A PL44539723A PL445397A1 PL 445397 A1 PL445397 A1 PL 445397A1 PL 445397 A PL445397 A PL 445397A PL 44539723 A PL44539723 A PL 44539723A PL 445397 A1 PL445397 A1 PL 445397A1
Authority
PL
Poland
Prior art keywords
perpendicularity
linearity
sensors
standard
determining
Prior art date
Application number
PL445397A
Other languages
Polish (pl)
Inventor
Tomasz DOBROWOLSKI
Jacek Świderski
Krzysztof STĘPIEŃ
Original Assignee
Politechnika Świętokrzyska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Świętokrzyska filed Critical Politechnika Świętokrzyska
Priority to PL445397A priority Critical patent/PL445397A1/en
Publication of PL445397A1 publication Critical patent/PL445397A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

Wzorzec do wyznaczania prostopadłości osi i liniowości czujników głowicy pomiarowej profilometru stykowego składa się z dolnej części w postaci prostopadłościennej podstawy (1) i prostopadłej górnej części (2) wyposażonej w trzy punkty podparcia w postaci wałeczków podporowych (10), zamocowanych od spodu dolnej części (1) oraz mechanizmu umożliwiającego obrót górnej części (2) wobec części dolnej (1), opartego na wałeczku (5) i śrubie mikrometrycznej (3) zamontowanej za pomocą elementu mocującego (6) w dolnej części (1), współpracującej z kołkiem oporowym (8) i sprężyną (9), przy czym w górnej części (2) znajdują się otwory na kule ceramiczne (4) o zróżnicowanej głębokości osadzenia, osadzone w trzech kolumnach po trzy kule, korzystnie zakończone powierzchnią stożkową o kącie 142°. Korzystnie, odległości między środkami kul (4) w osiach X - Y są jednakowe i wynoszą 15 mm.The standard for determining the perpendicularity of the axis and linearity of the sensors of the measuring head of the contact profilometer consists of a lower part in the form of a rectangular base (1) and a perpendicular upper part (2) equipped with three support points in the form of support rollers (10), attached to the bottom of the lower part ( 1) and a mechanism enabling rotation of the upper part (2) towards the lower part (1), based on a roller (5) and a micrometer screw (3) mounted with a fastening element (6) in the lower part (1), cooperating with a stop pin ( 8) and a spring (9), where in the upper part (2) there are holes for ceramic balls (4) with different seating depths, mounted in three columns of three balls each, preferably ending with a conical surface with an angle of 142°. Preferably, the distances between the centers of the balls (4) in the X - Y axes are the same and amount to 15 mm.

PL445397A 2023-06-29 2023-06-29 Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer PL445397A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL445397A PL445397A1 (en) 2023-06-29 2023-06-29 Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL445397A PL445397A1 (en) 2023-06-29 2023-06-29 Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer

Publications (1)

Publication Number Publication Date
PL445397A1 true PL445397A1 (en) 2024-02-12

Family

ID=89855741

Family Applications (1)

Application Number Title Priority Date Filing Date
PL445397A PL445397A1 (en) 2023-06-29 2023-06-29 Standard for determining the perpendicularity of the axis and the linearity of the sensors of the measuring head of a contact profilometer

Country Status (1)

Country Link
PL (1) PL445397A1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0676614A1 (en) * 1994-04-11 1995-10-11 International Business Machines Corporation Calibration standards for profilometers and methods of producing them
CN217032434U (en) * 2022-04-20 2022-07-22 重庆市计量质量检测研究院 A stylus profiler calibration device with adjustment mechanism

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0676614A1 (en) * 1994-04-11 1995-10-11 International Business Machines Corporation Calibration standards for profilometers and methods of producing them
CN217032434U (en) * 2022-04-20 2022-07-22 重庆市计量质量检测研究院 A stylus profiler calibration device with adjustment mechanism

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
MARTA WIŚNIEWSKA, SABINA ŻEBROWSKA-ŁUCYK: "Zeszyty Naukowe Wydziału Elektrotechniki i Automatyki Politechniki Gdańskiej Nr 38, 2014, str. 85-88", COMPARISON OF CALIBRATION STANDARDS FOR STYLUS PROFILOMETERS *

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